• 제목/요약/키워드: tester device

검색결과 98건 처리시간 0.025초

비젼 피드백 제어를 이용한 광통신 Laser Diode Test Device 개발 (Development of Laser Diode Test Device using Feedback Control with Machine Vision)

  • 유철우;송문상;김재희;박상민;유범상
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2003년도 춘계학술대회 논문집
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    • pp.1663-1667
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    • 2003
  • This thesis is on tile development of LD(Laser Diode) chip tester and the control system based on graphical programming language(LabVIEW) to control the equipment. The LD chip tester is used to test the optic power and the optic spectrum of the LD Chip. The emitter size of LD chip and the diameter of the receiver(optic fiber) are very small. Therefore, in order to test each chip precisely, this tester needs high accuracy. However each motion part of the tester could not accomplish hish accuracy due to the limit of the mechanical performance. Hence. an image processing with machine vision was carried out in order to compensate for the error. and also a load test was carried out so as to reduce tile impact of load on chip while the probing motion device is working. The obtained results were within ${\pm}$5$\mu\textrm{m}$ error.

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Laser Diode Tester 개발과 비젼 피드백을 이용한 위치 보정 (Development of Laser Diode Tester and Position Compensation using Feedback with Machine Vision)

  • 김재희;유철우;박상민;유범상
    • 한국공작기계학회논문집
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    • 제13권4호
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    • pp.30-36
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    • 2004
  • The development of LD(Laser Diode) tester and its control system based on the graphical programming language(LabVIEW) is addressed. The ill tester is used to check the optic power and the optic spectrum of the LD Chip. The emitter size of LD chip and the diameter of the Detector(optic fiber and photo diode) are very small, therefore the test device needs high accuracy. But each motion part of the test device could not accomplish high accuracy due to the limit of the mechanical performance. So, an image processing with machine vision is proposed to compensate for the error. By adopting our method we can reduce the error of position within $\pm$5$\mu\textrm{m}$.

메모리 반도체 검사 장비 인터페이스를 위한 크로스플랫폼 소프트웨어 기술 (CTIS: Cross-platform Tester Interface Software for Memory Semiconductor)

  • 김동수;강동현;이은석;이규성;엄영익
    • 정보과학회 컴퓨팅의 실제 논문지
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    • 제21권10호
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    • pp.645-650
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    • 2015
  • 메모리 반도체 패키지 검사 공정에서 TIS(Tester Interface Software)는 디바이스가 검사 장비에 투입 될 때부터 배출될 때까지 검사 장비가 디바이스 검사를 진행하는데 필요한 모든 소프트웨어 기능을 제공한다. 하지만, 공정에서 사용되는 장비와 장비를 제어하기 위한 컴퓨터 및 운영체제의 종류가 다양하여 동일한 기능을 수행해야 하는 TIS가 테스터 장비마다 독립적으로 개발 및 운영되고 있다. 이는 많은 시간과 비용을 요구할 뿐만 아니라 소프트웨어의 품질에도 많은 영향을 미치고 있으며, 이러한 문제는 추가되는 장비의 종류가 증가할수록 심화될 것이다. 본 논문에서는 이러한 문제를 해결하기 위해 이종 장비와 운영체제에 적용 가능한 CTIS(Cross-platform Tester Interface Software)을 제안한다.

열전소자 원리를 이용한 부품 Tester용 온도공급 장치 연구 (메모리 Device Tester용 온도제어장치 도입을 위한 연구) (A Study for Adopting the Temperature Control Unit on Memory Device Tester Based on Principle of Thermoelectric Semiconductor)

  • 김선주;홍철호;신동욱;서승범;이무재
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2003년도 학술회의 논문집 정보 및 제어부문 B
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    • pp.414-416
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    • 2003
  • 메모리 제품의 사용 환경은 점차적으로 High Speed/High Density화됨에 따라 현 Comp. Test 환경으로 Field 환경을 모두 수용하기가 어려워지고 있다. 따라서, Component Level에서 다양한 실장 System을 이용한 Screen 방법이 요구 되고 있다. 다양한 환경에서 Test를 실시하기 위해서 필수 불가결한 조건은 온도(Temperature)를 자동으로 제어(Control)할 수 있는 기능이 필요하게 되었다. 이에, 현재 사용하고 있는 방법은 Chamber나 히터를 이용하고 있으나 온도 제어가 보다 용이하고 정밀한 기능이 요구됨에 따라 열전반도체(Thermoelectric semiconductor)원리를 이용한 온도 제어 장치 도입을 위한 연구가 진행되었다. 본 논문에서는 그 개발 현황 및 평가 결과를 근거로 신규 Component실장 Tester에 효율적으로 도입 적용 가능함을 제시 하고자 한다. 또한, 향후 기타 Tester 및 산업용 설비 등에 까지 확대적용 가능함으로써 전자부품(메모리)의 품질 향상 및 설비투자 Cost절감 효과가 기대 된다.

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발전소 고온부의 수명 평가를 위한 소형 시편용 크리프 시험기의 개발 (Development of Small-Specimen Creep Tester for Life Assessment of High Temperature Components of Power Plant)

  • 김효진;정용근;박종진
    • 대한기계학회논문집A
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    • 제24권10호
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    • pp.2597-2602
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    • 2000
  • The most effective means of evaluating remaining life is through the creep testing of samples removed from the component. But sampling of large specimen from in-service component is actually impossible. So, sampling device and small-specimen creep tester have been applied. Sampling device has been devised to extract mechanically small samples by hemispherical, diamond -coated cutter from the surface of turbine rotor bores and thick-walled pipes without subsequent weld repairs requiring post weld heat treatment. A method of manufacturing small creep specimen, 2min gage diameter and 10min gage length, using electron beam welding to attach grip section, has been proven. Small-specimen creep tester has been designed to control atmosphere to prevent stress increment by oxidation during experiment. To determine whether the small specimens successfully reproduce the behavior of large specimens, creep rupture tests for small and large specimens have been performed at identical conditions. Creep rupture times based on small specimens have closely agreed within 5% error compared with that of large specimen. The errors in rupture time have decreased at longer test period. This comparison validates the procedure for fabricating and testing on small specimen. This technique offers potential as an efficient method for remaining life assessment by direct sampling from in -service high temperature components.

임베디드 기반의 모바일 LCD 모듈 검사장비 설계 및 구현 (A Design and Implementation of a Mobile Test Device Based-on Embedded System)

  • 김홍규;이기화;문승진
    • 제어로봇시스템학회논문지
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    • 제14권6호
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    • pp.523-529
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    • 2008
  • In this paper, we proposed mobile LCD module test device on embedded based, when operating the existing LCD, divide flicker clearly in full frame, and configuration so as to support between other CPU interface, MDDI, SPI, 24Bit RGB interface, etc. that is based on a high-speed CPU. In addition, when demand to test about each pixel of LCD, it is possible to change IP design of H/W, FPGA, but proposed system is application possible without other design changing. Proposed system is made smaller and equipped with battery, so secure with mobility for effective test the LCD/OLED module and it is able to test the pattern by the client program, for example exiting picture, mpeg, simple pattern test and test per pixel, scale, rotation, Odd/Even pixel per video, etc. From now on, if integrating with independent test system and it is configured that is able to mutual communication and test, it is expected to reduce consumption of human resources and improve productivity for LCD module test.

2축 로드셀을 이용한 박막평가장치의 설계 및 개발 (Design & development of a device for thin-film evaluation using a two-component loadcell)

  • 이정일;김종호;박연규;오희근
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2003년도 추계학술대회
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    • pp.1448-1452
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    • 2003
  • A scratch tester was developed to evaluate the adhesive strength at interface between thin-film and substrate(silicon wafer). Under force control, the scratch tester can measure the normal and the tangential forces simultaneously as the probe tip of the equipment approaches to the interface between thin-film and substrate of wafer. The capacity of each component of force sensor is 0.1 N ${\sim}$ 100 N. In addition, the tester can detect the signal of elastic wave from AE sensor(frequency range of 900 kHz) attached to the probe tip and evaluate the bonding strength of interface. Using the developed scratch tester, the feasibility test was performed to evaluate the adhesive strength of thin-film.

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핵연료봉 프레팅마멸 시험기 개발 (Development of Fuel Rod Fretting Wear Tester)

  • 김형규;하재욱;윤경호;강흥석;송기남
    • 한국윤활학회:학술대회논문집
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    • 한국윤활학회 2001년도 제34회 추계학술대회 개최
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    • pp.245-251
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    • 2001
  • A fretting wear tester is developed for experimental study on the fuel fretting problem of light water reactor. The feature of the developed tester is it can simulate the existence of gap between spring and fuel rod as well as different contacting force including the just-contact condition (0 N on the contact). Used are a servo-motor, an eccentric cylinder and lever mechanism for driving system. A spacer grid cell is constituted with four strap segments (each segment has a spring). This fretting wear tester can also be used as a fatigue tester of a spacer grid spring with the frequency of more than 10 Hz. It is required to simulate the frequency of the vibrating fuel rod due to flow-induced vibration in a reactor. In fretting wear test, up to two span-length of a fuel cladding tube can be accommodated. A specimen of cladding tube of one span-length is specially designed, which can be extended for two-span test. For .fatigue test, a device for clamping the spring fixture is installed additionally, Presently, the tester is designed for the condition of air environment and room temperature. The variation of the reciprocal distance is measured to check the stability of input force, which will be exerted to the cladding (for fretting wear. test) and the spring (for fatigue test) specimen.

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A Study on the Fabric Drape Evaluation Using a 3D Scanning System Based on Depth Camera with Elevating Device

  • Kim, Jongjun
    • 패션비즈니스
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    • 제19권6호
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    • pp.28-41
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    • 2015
  • Properties of textile fabrics influence the appearance, aesthetics, and performance of garment. Drape and related properties of fabrics affect profoundly the static and dynamic appearance during wearer's movement. The three dimensional shape of the folded structure often deforms with time or with subtle vibration around the fabric specimen during the drape measurement. Due to the uneven and complex nature of fabrics, the overall shape of the fabric specimen on the drape tester often becomes unstable. There is a need to understand the fundamental mechanisms of how draping may generate pleasing forms. Two drape test methods, conventional Cusick drape test, and in-built drape tester, based on a depth camera, are compared. Fabric specimens including cotton, linen, silk, wool, polyester, and rayon are investigated for the fabric drape and other physical/mechanical parameters. Drape coefficient values of fabric specimens are compared based on the final drape images, together with the intermediate 3D drape images of the specimens during elevation process of the drape tester equipped with a stepper motor system. The correlation coefficient between the data based on the two methods is reasonably high. Another advantage from the depth camera system is that it allows further analysis of three-dimensional information regarding the fabric drape shape, including the shape of nodes or crest and trough.

휴대형 전원 순단 시험 장치의 개발 (Development of Portable Power Interrupt Tester using Microcontroller)

  • 박찬원;노재관
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2003년도 학술회의 논문집 정보 및 제어부문 B
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    • pp.962-964
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    • 2003
  • In this paper, development of portable power interrupt tester to evaluate microprocessor based control circuits for an endurance under abnormal power source. 89C2051 micro-controller is performed to make power interrupt signal, and software controls peripheral hardwares and built-in functions. Experimental results of this study will offer a good application to electronic appliance maker as a test device of hardware and software debugging use.

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