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Development of Laser Diode Tester and Position Compensation using Feedback with Machine Vision  

김재희 (전북대학교 정밀기계 대학원)
유철우 (전북대학교 정밀기계 대학)
박상민 (전주공업대 자동차)
유범상 (전북대학교 기계항공시스템공학부)
Publication Information
Transactions of the Korean Society of Machine Tool Engineers / v.13, no.4, 2004 , pp. 30-36 More about this Journal
Abstract
The development of LD(Laser Diode) tester and its control system based on the graphical programming language(LabVIEW) is addressed. The ill tester is used to check the optic power and the optic spectrum of the LD Chip. The emitter size of LD chip and the diameter of the Detector(optic fiber and photo diode) are very small, therefore the test device needs high accuracy. But each motion part of the test device could not accomplish high accuracy due to the limit of the mechanical performance. So, an image processing with machine vision is proposed to compensate for the error. By adopting our method we can reduce the error of position within $\pm$5$\mu\textrm{m}$.
Keywords
Laser Diode; Laser Diode Tester; Machine Vision; Feedback Control; Image Processing;
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