• Proceedings of the Korean Society of Precision Engineering Conference
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• 2003.06a
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• pp.1663-1667
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• 2003

This thesis is on tile development of LD(Laser Diode) chip tester and the control system based on graphical programming language(LabVIEW) to control the equipment. The LD chip tester is used to test the optic power and the optic spectrum of the LD Chip. The emitter size of LD chip and the diameter of the receiver(optic fiber) are very small. Therefore, in order to test each chip precisely, this tester needs high accuracy. However each motion part of the tester could not accomplish hish accuracy due to the limit of the mechanical performance. Hence. an image processing with machine vision was carried out in order to compensate for the error. and also a load test was carried out so as to reduce tile impact of load on chip while the probing motion device is working. The obtained results were within ${\pm}$5$\mu\textrm{m}$ error.

• Transactions of the Korean Society of Machine Tool Engineers
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• v.13 no.4
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• pp.30-36
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• 2004

The development of LD(Laser Diode) tester and its control system based on the graphical programming language(LabVIEW) is addressed. The ill tester is used to check the optic power and the optic spectrum of the LD Chip. The emitter size of LD chip and the diameter of the Detector(optic fiber and photo diode) are very small, therefore the test device needs high accuracy. But each motion part of the test device could not accomplish high accuracy due to the limit of the mechanical performance. So, an image processing with machine vision is proposed to compensate for the error. By adopting our method we can reduce the error of position within $\pm$5$\mu\textrm{m}$.

• KIISE Transactions on Computing Practices
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• v.21 no.10
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• pp.645-650
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• 2015

Tester Interface Software (TIS) provides all software functions that are necessary for a testing device to perform the test process on a memory semiconductor package from the time the device is put into the test equipment until the device is discharged from the equipment. TIS should perform the same work over all types of equipment regardless of their tester models. However, TIS has been developed and managed independently of the tester models because there are various equipment and computer models that are used in the test process. Therefore, more maintenance, time and cost are required for development, which adversely affects the quality of the software, and the problem becomes more serious when the new tester model is introduced. In this paper, we propose the Cross-platform Tester Interface Software (CTIS) framework, which can be integrated and operated on heterogeneous equipment and OSs.

• Proceedings of the KIEE Conference
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• 2003.11c
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• pp.414-416
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• 2003

As environmental conditions for memory products are increasingly high speed/high density, adopting diverse system configuration, it's more and more difficult for current component tester to adopt the actual condition of field application. If system test screening is realized in component level, test coverage failure can be made more secured in the initial stage, evaluation cost can be reduced and the effectiveness of investment for the facility can be maximized. Based on the above background, component automatic system tester was developed and showed off satisfactory results per each memory device family. In this paper, component quality stabilization strategy and cost saving for tester investment through future Quality monitoring and application to mass production will be presented.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.24 no.10 s.181
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• pp.2597-2602
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• 2000

The most effective means of evaluating remaining life is through the creep testing of samples removed from the component. But sampling of large specimen from in-service component is actually impossible. So, sampling device and small-specimen creep tester have been applied. Sampling device has been devised to extract mechanically small samples by hemispherical, diamond -coated cutter from the surface of turbine rotor bores and thick-walled pipes without subsequent weld repairs requiring post weld heat treatment. A method of manufacturing small creep specimen, 2min gage diameter and 10min gage length, using electron beam welding to attach grip section, has been proven. Small-specimen creep tester has been designed to control atmosphere to prevent stress increment by oxidation during experiment. To determine whether the small specimens successfully reproduce the behavior of large specimens, creep rupture tests for small and large specimens have been performed at identical conditions. Creep rupture times based on small specimens have closely agreed within 5% error compared with that of large specimen. The errors in rupture time have decreased at longer test period. This comparison validates the procedure for fabricating and testing on small specimen. This technique offers potential as an efficient method for remaining life assessment by direct sampling from in -service high temperature components.

• Journal of Institute of Control, Robotics and Systems
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• v.14 no.6
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• pp.523-529
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• 2008

In this paper, we proposed mobile LCD module test device on embedded based, when operating the existing LCD, divide flicker clearly in full frame, and configuration so as to support between other CPU interface, MDDI, SPI, 24Bit RGB interface, etc. that is based on a high-speed CPU. In addition, when demand to test about each pixel of LCD, it is possible to change IP design of H/W, FPGA, but proposed system is application possible without other design changing. Proposed system is made smaller and equipped with battery, so secure with mobility for effective test the LCD/OLED module and it is able to test the pattern by the client program, for example exiting picture, mpeg, simple pattern test and test per pixel, scale, rotation, Odd/Even pixel per video, etc. From now on, if integrating with independent test system and it is configured that is able to mutual communication and test, it is expected to reduce consumption of human resources and improve productivity for LCD module test.

• Proceedings of the KSME Conference
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• 2003.11a
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• pp.1448-1452
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• 2003

A scratch tester was developed to evaluate the adhesive strength at interface between thin-film and substrate(silicon wafer). Under force control, the scratch tester can measure the normal and the tangential forces simultaneously as the probe tip of the equipment approaches to the interface between thin-film and substrate of wafer. The capacity of each component of force sensor is 0.1 N ${\sim}$ 100 N. In addition, the tester can detect the signal of elastic wave from AE sensor(frequency range of 900 kHz) attached to the probe tip and evaluate the bonding strength of interface. Using the developed scratch tester, the feasibility test was performed to evaluate the adhesive strength of thin-film.

• Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
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• 2001.11a
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• pp.245-251
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• 2001

A fretting wear tester is developed for experimental study on the fuel fretting problem of light water reactor. The feature of the developed tester is it can simulate the existence of gap between spring and fuel rod as well as different contacting force including the just-contact condition (0 N on the contact). Used are a servo-motor, an eccentric cylinder and lever mechanism for driving system. A spacer grid cell is constituted with four strap segments (each segment has a spring). This fretting wear tester can also be used as a fatigue tester of a spacer grid spring with the frequency of more than 10 Hz. It is required to simulate the frequency of the vibrating fuel rod due to flow-induced vibration in a reactor. In fretting wear test, up to two span-length of a fuel cladding tube can be accommodated. A specimen of cladding tube of one span-length is specially designed, which can be extended for two-span test. For .fatigue test, a device for clamping the spring fixture is installed additionally, Presently, the tester is designed for the condition of air environment and room temperature. The variation of the reciprocal distance is measured to check the stability of input force, which will be exerted to the cladding (for fretting wear. test) and the spring (for fatigue test) specimen.

• Journal of Fashion Business
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• v.19 no.6
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• pp.28-41
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• 2015

Properties of textile fabrics influence the appearance, aesthetics, and performance of garment. Drape and related properties of fabrics affect profoundly the static and dynamic appearance during wearer's movement. The three dimensional shape of the folded structure often deforms with time or with subtle vibration around the fabric specimen during the drape measurement. Due to the uneven and complex nature of fabrics, the overall shape of the fabric specimen on the drape tester often becomes unstable. There is a need to understand the fundamental mechanisms of how draping may generate pleasing forms. Two drape test methods, conventional Cusick drape test, and in-built drape tester, based on a depth camera, are compared. Fabric specimens including cotton, linen, silk, wool, polyester, and rayon are investigated for the fabric drape and other physical/mechanical parameters. Drape coefficient values of fabric specimens are compared based on the final drape images, together with the intermediate 3D drape images of the specimens during elevation process of the drape tester equipped with a stepper motor system. The correlation coefficient between the data based on the two methods is reasonably high. Another advantage from the depth camera system is that it allows further analysis of three-dimensional information regarding the fabric drape shape, including the shape of nodes or crest and trough.

• Proceedings of the KIEE Conference
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• 2003.11c
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• pp.962-964
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• 2003

In this paper, development of portable power interrupt tester to evaluate microprocessor based control circuits for an endurance under abnormal power source. 89C2051 micro-controller is performed to make power interrupt signal, and software controls peripheral hardwares and built-in functions. Experimental results of this study will offer a good application to electronic appliance maker as a test device of hardware and software debugging use.