• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.23 no.7
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• pp.550-553
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• 2010

The enhancement of quantum efficiency using a surface modified Ag anode in top-emitting organic light emitting diodes (TEOLEDs) is reported. The operation voltage at the current density of $1\;mA/cm^2$ of TEOLEDs decreased from 9.3 V to 4.3 V as the surface of anode coated with $CuO_x$ layer. The work function of these structures were quantitatively determined using synchrotron radiation photoemission spectroscopy. Secondary electron emission spectra revealed that the work function of the Ag/$CuO_x$ structure is higher by 0.6 eV than that of Ag. Thus, the $CuO_x$ structure acts as a role in reducing the hole injection barrier by about 0.6 eV, resulting in a decrease of the turn-on voltage of top-emitting light emitting diodes.

• Journal of the Korean Vacuum Society
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• v.15 no.6
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• pp.547-555
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• 2006

The Pohang Light Source (PLS) of Pohang Accelerator Laboratory (PAL), which was constructed in 1994, is a 3rd generation synchrotron light source user facility. It consists of 2.5 GeV linear accelerator and a storage ring with circumference of 280 m. Presently, 27 beamlines around the storage ring are in operation providing synchrotron radiations to users. In addition, PAL has a construction project of the 4th generation light source. In this paper, the operation status of the PLS is described and the prospect of the 4th generation light source is reviewed.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.144.1-144.1
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• 2013

Recently, we have developed the local oxidization and hydrogenization method for graphene layer using atomic force microscope(AFM) tip at room temperature and ambient pressure. With this method we could create locally oxidized or hydrogenized area on the graphene layer with various size from nanometer to micrometer scale, by controlling the amplitude and polarity of the voltage supplied between conducting AFM tip and the graphene layer. We investigated the chemical states of functionalized C atoms in the graphene layer using scanning photoelectron microscopy. By measuring C 1s core level X-ray Photoemission Spectra of the C atoms and suitable fitting process carried on the measured spectra, we could obtain the fraction of oxidization and hydrogenization under various condition, and the evolution of each chemical state during thermal annealing process.

• Journal of the Mineralogical Society of Korea
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• v.20 no.4
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• pp.261-266
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• 2007

A natural FeOOH-goethite was compressed up to 9.5 GPa at room temperature using a DIA-type large volume apparatus with synchrotron radiation. Energy dispersive x-ray diffraction method was employed to measure its compressibility and NaCl was used for high pressure determinations. Bulk modulus was determined to be 131.1 (${\pm}5.8$) GPa by the Birch-Murnaghan equation of state with $K_0'$ fixed to 4. The present result is not in accord with the previous measurements, which vary from 111 to 147.9 GPa.

• Bulletin of the Korean Chemical Society
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• v.19 no.5
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• pp.549-553
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• 1998

The structure and layer distribution of cadmium arachidate Langmuir-Blodgett film were analyzed by the small angle X-ray reflectivity measurements using synchrotron radiation. Y-to X type transition was ocurred during the 39th passage of deposition of cadmium arachidate. Based on the measurement of the consumed area of the monolayer, it was determined that about 27.5 layer was deposited. Using the synchrotron X-ray, the reflectivity profile of cadmium arachidate LB film over the wide range of grazing angle was obtained. The X-ray reflectivity profile was analyzed using the recursion formula. By fitting the location and dispersion of the subsidiary maxima between the Bragg peaks of the measured reflectivity profile with that of the calculated reflectivity profile, the average thickness and the distribution of layer thickness were evaluated. The genetic algorithm was adopted to the fitting of reflectivity profile to evaluate the optimum value of the number distribution of layer. Based on the morphology measurement with an atomic force microscopy (AFM), the domain structure and mean roughness of LB films were obtained. The mean roughness value calculated based on the number of layer distribution obtained from the measurement by AFM is consistent with that obtained from X-ray reflectivity analysis.

• Journal of the Korean Physical Society
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• v.73 no.12
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• pp.1834-1839
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• 2018

A tabletop ultrafast soft x-ray has been generated from the laser-produce plasma with a femtosecond pulsed Ti:Sapphire laser. The estimated total flux of Al $K{\alpha}$ is of $2.2{\times}10^9photons/sec$ in $4{\pi}$ radian and the parameters related to the optical performance were obtained. The tungsten/silicon multilayer, flat quartz and bent thallium acid phthalate (TLAP) crystal were used for monochromatization of soft x-ray to refine the aluminum $K{\alpha}$ radiation and compared the respective value of $E/{\Delta}E$. To estimate the size of the x-ray source beam generated by a fs laser, the approximation using the FWHM obtained from the x-ray beam scan near the focal point was discussed, and the size of the diameter was about $9.76{\mu}m$.

• Journal of the Korean Society of Visualization
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• v.22 no.2
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• pp.20-26
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• 2024

Water management is crucial for the performance, durability, and stability of Polymer Electrolyte Membrane Fuel Cells (PEMFCs). Due to its importance, various methods for visualizing PEMFC's internal water distribution have been adapted to study and manage water within the cells. However, these methods often require large facilities, leading to high costs and significant barriers to entry. This study addresses these challenges by using a commercial Radiation (X-ray) Generator (RG) for internal water distribution visualization and comparing the results with synchrotron X-ray data from the Pohang Accelerator Laboratory (PAL) 9D beamline. Despite the lower resolution and potential beam distortion challenges, the RG shows promise for PEMFC water distribution visualization, suggesting the need for further research to refine water attenuation coefficients and build-up factors for improved measurement accuracy.

• Anatomy & Biological Anthropology
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• v.31 no.4
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• pp.133-142
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• 2018

3D histology is a imaging system for the 3D structural information of cells or tissues. The synchrotron radiation propagation phase contrast micro-CT has been used in 3D imaging methods. However, the simple phase contrast micro-CT did not give sufficient micro-structural information when the specimen contains soft elements, as is the case with many biomedical tissue samples. The purpose of this study is to develop a new technique to enhance the phase contrast effect for soft tissue imaging. Experiments were performed at the imaging beam lines of Pohang Accelerator Laboratory (PAL). The biomedical tissue samples under frozen state was mounted on a computer-controlled precision stage and rotated in $0.18^{\circ}$ increments through $180^{\circ}$. An X-ray shadow of a specimen was converted into a visual image on the surface of a CdWO4 scintillator that was magnified using a microscopic objective lens(X5 or X20) before being captured with a digital CCD camera. 3-dimensional volume images of the specimen were obtained by applying a filtered back-projection algorithm to the projection images using a software package OCTOPUS. Surface reconstruction and volume segmentation and rendering were performed were performed using Amira software. In this study, We found that synchrotron phase contrast imaging of frozen tissue samples has higher contrast power for soft tissue than that of non-frozen samples. In conclusion, synchrotron radiation propagation phase contrast cryo-microCT imaging offers a promising tool for non-destructive high resolution 3D histology.

• Journal of the Mineralogical Society of Korea
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• v.18 no.4 s.46
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• pp.249-257
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• 2005

Garnet is one of the major minerals down to the top of lower mantle approximately 660 km with spinel and pyroxenes. Garnet transforms into perovskite and corundum in the lower mantle, however its sequence is still in controversy. We measured the compressibility of a natural almandine at high-pressure up to 62 CPa using Mao-Bell type diamond anvil cell (DAC) at room temperature. Chemical formula of the specimen is ($Fe_{2.52}Ca_{0.21}Mg_{0.18}Mn_{0.12})Al_{2.23}Si_{2.97}O_{12}$. Results of this compression study are as follows: a : $10.175\;{\AA}$, V : $1251.16\;{\AA}^{3}$, $D_{x}$ : $5.265\;g/cm^{3}$ at 62 GPa; bulk modulus is 156 GPa using Birch-Murnaghan equation of state (EoS) with a fixed $K_{0}\;'$ of 4. This study would be the first time attempt accomplished with the high pressure DAC using synchrotron radiation at the Pohang Light Source (PLS) in Korea.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.362-362
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• 2014

Atomic layer deposition (ALD) can be regarded as a special variation of the chemical vapor deposition method for reducing film thickness. ALD is based on sequential self-limiting reactions from the gas phase to produce thin films and over-layers in the nanometer scale with perfect conformality and process controllability. These characteristics make ALD an important film deposition technique for nanoelectronics. Tantalum pentoxide ($Ta_2O_5$) has a number of applications in optics and electronics due to its superior properties, such as thermal and chemical stability, high refractive index (>2.0), low absorption in near-UV to IR regions, and high-k. In particular, the dielectric constant of amorphous $Ta_2O_5$ is typically close to 25. Accordingly, $Ta_2O_5$ has been extensively studied in various electronics such as metal oxide semiconductor field-effect transistors (FET), organic FET, dynamic random access memories (RAM), resistance RAM, etc. In this experiment, the variations of chemical and interfacial state during the growth of $Ta_2O_5$ films on the Si substrate by ALD was investigated using in-situ synchrotron radiation photoemission spectroscopy. A newly synthesized liquid precursor $Ta(N^tBu)(dmamp)_2$ Me was used as the metal precursor, with Ar as a purging gas and $H_2O$ as the oxidant source. The core-level spectra of Si 2p, Ta 4f, and O 1s revealed that Ta suboxide and Si dioxide were formed at the initial stages of $Ta_2O_5$ growth. However, the Ta suboxide states almost disappeared as the ALD cycles progressed. Consequently, the $Ta^{5+}$ state, which corresponds with the stoichiometric $Ta_2O_5$, only appeared after 4.0 cycles. Additionally, tantalum silicide was not detected at the interfacial states between $Ta_2O_5$ and Si. The measured valence band offset value between $Ta_2O_5$ and the Si substrate was 3.08 eV after 2.5 cycles.