• Journal of KIISE
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• v.41 no.11
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• pp.921-926
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• 2014

Face detection refers to the process extracting facial regions in an input image, which can improve speed and accuracy of recognition or authorization system, and has diverse applicability. Since conventional works have tried to detect faces based on the whole shape of faces, its detection performance can be degraded by occlusion made with accessories or parts of body. In this paper we propose a method combining local feature descriptors and probability modeling in order to detect partially occluded face effectively. In training stage, we represent an image as a set of local feature descriptors and estimate a statistical model for normal faces. When the test image is given, we find a region that is most similar to face using our face model constructed in training stage. According to experimental results with benchmark data set, we confirmed the effect of proposed method on detecting partially occluded face.

• Journal of the Semiconductor & Display Technology
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• v.12 no.1
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• pp.1-7
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• 2013

Grey-level statistical models have been widely used in many applications for object location and identification. However, conventional models yield some problems in model refinement when training images are not properly aligned, and have difficulties for real-time recognition of arbitrarily rotated models. This paper presents improved grey-level statistical models that align training images using image or feature matching to overcome problems in model refinement of conventional models, and that enable real-time recognition of arbitrarily rotated objects using efficient hierarchical search methods. Edges or features extracted from a mean training image are used for accurate alignment of models in the search image. On the aligned position and orientation, fitness measure based on grey-level statistical models is computed for object recognition. It is demonstrated in various experiments in PCB inspection that proposed methods are superior to conventional methods in recognition accuracy and speed.

• Industrial Engineering and Management Systems
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• v.14 no.4
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• pp.392-400
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• 2015

Monitoring of plasma etch processes for fault detection is one of the hallmark procedures in semiconductor manufacturing. Optical emission spectroscopy (OES) has been considered as a gold standard for modeling plasma etching processes for on-line diagnosis and monitoring. However, statistical quantitative methods for processing the OES data are still lacking. There is an urgent need for a statistical quantitative method to deal with high-dimensional OES data for improving the quality of etched wafers. Therefore, we propose a robust relevance vector machine (RRVM) for regression with statistical quantitative features for modeling etch rate and uniformity in plasma etch processes by using OES data. For effectively dealing with the OES data complexity, we identify seven statistical features for extraction from raw OES data by reducing the data dimensionality. The experimental results demonstrate that the proposed approach is more suitable for high-accuracy monitoring of plasma etch responses obtained from OES.

• Journal of the Korean Statistical Society
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• v.22 no.2
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• pp.159-169
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• 1993

In this article, we consider two sample problem with randomly right censored data. We propse two-sample confidence intervals for the difference in medians or any quantiles, based on bootstrap. The bootstrap version of two-sample confidence intervals proposed in this article is simple to apply and do not need the assumption of the shift model, so that for the non-shift model, the density estimation is not necessary, which is an attractive feature in small to moderate sized sample case.

• Journal of the Korean Data and Information Science Society
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• v.14 no.2
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• pp.337-343
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• 2003

In this paper we present the prediction interval estimation method using bootstrap method for least squares support vector machine(LS-SVM) regression, which allows us to perform even nonlinear regression by constructing a linear regression function in a high dimensional feature space. The bootstrap method is applied to generate the bootstrap sample for estimation of the covariance of the regression parameters consisting of the optimal bias and Lagrange multipliers. Experimental results are then presented which indicate the performance of this algorithm.

• Proceedings of the Korean Statistical Society Conference
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• 2003.05a
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• pp.103-108
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• 2003

데이터마이닝을 위한 대용량 데이터베이스를 축소시키는 방법 중에 속성선택 방법이 많이 사용되고 있다. 본 논문에서는 세 가지 속성선택 방법을 사용하여 조건속성 수를 60%이상 축소시켜 결정나무와 로지스틱 회귀모형에 적용시켜보고 이들의 효율을 비교해 본다. 세 가지 속성선택 방법은 MDI, 정보획득, ReliefF 방법이다. 결정나무 방법은 QUEST, CART, C4.5를 사용하였다. 속성선택 방법들의 분류 정확성은 UCI 데이터베이스에 주어진 Credit 승인 데이터베이스와 German Credit 데이터베이스를 사용하여 10층-교차확인 방법으로 평가하였다.

• Communications for Statistical Applications and Methods
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• v.19 no.5
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• pp.655-662
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• 2012

Classification is an important research field in pattern recognition with high-dimensional predictors. The support vector machine(SVM) is a penalized feature selector and classifier. It is based on the hinge loss function, the non-convex penalty function, and the smoothly clipped absolute deviation(SCAD) suggested by Fan and Li (2001). We developed the algorithm for the multiclass SVM with the SCAD penalty function using the local quadratic approximation. For multiclass problems we compared the performance of the SVM with the $L_1$, $L_2$ penalty functions and the developed method.

• Communications for Statistical Applications and Methods
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• v.16 no.5
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• pp.881-889
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• 2009

Support vector machines(SVMs) are known as flexible and efficient classifier of multivariate observations, producing a hyperplane or hyperdimensional curved surface in multidimensional feature space that best separates training samples by known groups. As various methodological extensions are made for SVM classifiers in recent years, it becomes more difficult to understand the constructed model intuitively. The aim of this paper is to visualize various SVM classifications tuned by several parameters in reduced dimensions, so that data analysts secure the tangible image of the products that the machine made.

• Communications for Statistical Applications and Methods
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• v.14 no.3
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• pp.551-560
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• 2007

Kruskal and Wallis (1952) proposed typical nonparametric method in one-way layout problem. A special feature of this procedure is use of rank in mixed samples. In this paper, the new procedure based on placement as extension of the two sample placement tests described in Orban and Wolfe (1982) was proposed. Some critical values in small sample cases and comparative results of a Monte Carlo power study are presented.

• Communications for Statistical Applications and Methods
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• v.16 no.1
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• pp.143-155
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• 2009

Best subset selection procedure based on mutual information (MI) between a set of explanatory variables and a dependent class variable is suggested. Derivation of multivariate MI is based on normal mixtures. Several types of normal mixtures are proposed. Also a best subset selection algorithm is proposed. Four real data sets are employed to demonstrate the efficiency of the proposals.