• Bulletin of the Korean Chemical Society
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• 제31권2호
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• pp.397-400
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• 2010

Zirconium oxide thin films deposited on the p-type Si(100) substrates by radio-frequency (RF) reactive magnetron sputtering with different plasma gas ratios have been studied by using spectroscopic ellipsometry (SE), atomic force microscopy (AFM), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS). The deposition of the films was monitored by the oxygen gas ratio which has been increased from 0 to 80%. We found that the thickness and roughness of the zirconium oxide thin films are relatively constant. The XRD revealed that the deposited thin films have polycrystalline phases, Zr(101) and monoclinic $ZrO_2$ ($\bar{1}31$). The XPS result showed that the oxidation states of zirconium suboxides were changed to zirconia form with increasing $O_2$ gas ratio.

• Bulletin of the Korean Chemical Society
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• 제32권4호
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• pp.1331-1335
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• 2011

We report the results of the characterization of Cu oxide thin films deposited by radio frequency (r.f.) magnetron sputtering at different annealing temperatures. The deposited Cu oxide thin films were investigated by scanning electron microscopy, spectroscopic ellipsometry, X-ray diffraction, atomic force microscopy, Xray photoelectron spectroscopy, and contact angle measurements. The thickness of the films was about 180 nm and the monoclinic CuO phase was detected. The $CuO_2$ and $Cu(OH)_2$ phases were grown as amorphous phase and the ratio of the three phases were independent on the annealing temperature. The surface of Cu oxide films changed from hydrophilic to hydrophobic as the annealing temperature increased. This phenomenon is due to the increase of the surface roughness. The direct optical band gap was also obtained and laid in the range between 2.36 and 3.06 eV.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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• pp.56-60
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• 2006

We review our studies on the growth of microcrystalline silicon films by the standard PECVD technique. In situ spectroscopic ellipsometry studies allow the optimization of the complex film structure with respect to competing aspects of the growth process. Fine tuning the hydrogen flux, the ion energy, and the nature of the species contributing to deposition produces unique films with a fully crystallized interface with silicon nitride. These materials have been successfully incorporated in bottom gate TFTs which present mobility values in the range of 1 to 3 $cm^2/V.s$, and stable characteristics when submitted to a bias stress. The stability of these TFTs makes them suitable for driver applications in AMLCDs as well as pixel elements in OLED displays.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2010년도 제39회 하계학술대회 초록집
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• pp.71-71
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• 2010

Copper oxide thin films were deposited on the p-type Si(100) by r.f. magnetron sputtering as a function of different substrate temperature. The deposited copper oxide thin films were investigated by atomic force microscopy (AFM), scanning electron microscopy (SEM), spectroscopic ellipsometry (SE), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS). The SEM and SE data show that the thickness of the copper oxide films was about 170 nm. AFM images show that the surface roughness of copper oxide films was increased with increasing substrate temperature. As the substrate temperature increased, monoclinic CuO (111) peak appeared and the crystal size decreased while the monoclinic CuO (-111) peak was independent on the substrate temperature. The oxidation states of Cu 2p and O 1s resulted from XPS were not affected on the substrate temperature. The contact angle measurement was also studied and indicated that the surface of copper oxide thin films deposited high temperature has more hydrophobic surface than that of deposited at low temperature.

• 한국표면공학회지
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• 제29권6호
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• pp.654-659
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• 1996

Amorphous $TiO_2$ thin films were deposited on silicon substrates by the RF magnetron sputtering under various conditions, and studied by the spectroscopic ellipsometry (SE). To determine the optical constants as a function of photon energy and also to depth-profile the as-deposited $TiO_2$ thin films, we analyzed the ellipsometric spectra using the effective medium approximation and the dispersion equations. Especially, we improved the modeling accuracy by selectively using either the Sellmeier or the Forouhi and Bloomer dispersion equation in different energy regions.

• 한국진공학회지
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• 제2권1호
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• pp.92-98
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• 1993

Si 기판 위에 증착된 Al 박막을 질소 ECR 플라즈마에 노출시켜 시료를 제작하고 분광타원해석법으로 분석한 결과 Al박막에 질화층이 형성되었음을 확인하였다. 사용한 질소 ECR 플라즈마의 전자온도와 전자밀도는 챔버내의 위치에 따라 각각 10~20eV, 0.9~1.2$\times$1011/㎤의 값을 보였다. 질소 ECR 플라즈마에 노출된 기판은 급격한 온도상승을 보였으며 노출시킨 뒤 5~6분이 지나면 $500^{\circ}C$ 근처에서 포화상태를 이루었다. 분광타원해석상수인 $\Delta$와 Ψ를 분석한 결과 증착된 Al의 두께는 시료에 따라 $140~160AA$이었고 표면에 형성된 AIN 층의 두께는 질소 ECR 플라즈마에 노출된 시간이 길수록 그리고 시료의 위치가 공명지점에 가까울수록 증가하였다. AlN층의 두께가 노출시간의 제곱근에 비례하는 것으로부터 AlN층은 Al의 표면에 흡착된 질소가 Al속으로 확산하여 이루어진 것으로 설명하였다.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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• pp.333-333
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• 2012

$Co_3O_4$ 계열 스피넬(spinel) 전이금속 산화물 $TCo_2O_4$ (T = 3d 전이금속)는 화학적 촉매, 센서, 이차전지, 연료전지 등으로의 응용성에 기인하여 최근 주목을 받고 있으며, 특정 응용분야와 관련하여 그 박막 시료 제작 및 물리적, 화학적 성질들에 대한 세밀한 연구의 필요성이 제기되고 있다. 본 연구에서는 졸-겔 방법을 이용하여 $TCo_2O_4$ 박막이 $Al_2O_3$ (0001) 기판 위에 균일한 두께로 제작될 수 있는 최적 조건을 찾고자 하였으며, 후열처리 조건 변화에 따르는 박막의 구조적 성질 변화를 조사하였다. 후열처리는 공기 중에서 이루어졌으며 온도 ${\sim}800^{\circ}C$에서 최적 결정성을 갖는 다결정 박막이 얻어졌다. 또한, 박막에 작은 시간(~10 min) 동안의 전자선(electron beam) 조사를 통한 다결정 박막의 형성도 관측되었다. $TCo_2O_4$ 박막들에 대한 X-ray diffraction, X-ray photoelectron spectroscopy, spectroscopic ellipsometry 측정들을 수행하여 그 구조적, 광학적 성질을 조사 하였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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• pp.267-270
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• 1999

We measured the dielectr~c constant of undoped GaN thin films grown on (0001) sapphire substrates In 0.8 - 4.5 eV energy (276 - 1550 nm wavelength) range by spectroscopic ellipsometry. For more accurate data analysis we also performed X-ray diffraction, photolurninescence and Rutherford backscattering spectroscopy on samples. Data were analyzed with a four-phase model. The dielectric constant of GaN thin films was obtained not only in the transparent region but also around the absorption edge. Absorption edge energy, $3.3992{\pm}0.002$eV was determined from the obtained dielectric function.

• Journal of the Optical Society of Korea
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• 제11권3호
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• pp.108-112
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• 2007

Spectroscopic ellipsometry (SE) has become an important tool in scatterometry based nano-structure 3D profiling. In this paper, we propose a novel 3D nano object recognition method by use of phase sensitive scatterometry. We claims that only phase sensitive scatterometry can provide a reasonable 3D nano-object recognition capability since phase data gives much higher sensitive 3D information than amplitude data. To show the validity of this approach, first we generate various $0^{th}$ order SE spectrum data ($\psi$ and ${\Delta}$) which can be calculated through rigorous coupled-wave analysis (RCWA) algorithm and then we calculate correlation values between a reference spectrum and an object spectrum which is varied for several different object 3D shape.

• Bulletin of the Korean Chemical Society
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• 제30권11호
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• pp.2729-2734
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• 2009

We report here the surface behavior of zirconium oxide deposited on Si(100) substrate depending on the different substrate temperatures. The zirconium oxide thin films were successfully deposited on the Si(100) surfaces applying radio-frequency (RF) magnetron sputtering process. The obtained zirconium oxide films were characterized by X-ray photoelectron spectroscopy (XPS) for study about the chemical environment of the elements, X-ray diffraction (XRD) for check the crystallinity of the films, spectroscopic ellipsometry (SE) technique for measuring the thickness of the films, and the morphology of the films were investigated by atomic force microscope (AFM). We found that the oxidation states of zirconium were changed from zirconium suboxides ($ZrO_{x,y}$, x,y < 2) (x; higher and y; lower oxidation state of zirconium) to zirconia ($ZrO_2$), and the surface was smoothed as the substrate temperature increased.