• Title/Summary/Keyword: selective etching

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A study on the high selective oxide etching using magnetized helical resonator plasma source (자화된 헬리칼 공진기 플라즈마 소스를 이용한 고선택비 산화막 식각에 관한 연구)

  • Lee, Su-Bu;Im, Seung-Wan;Lee, Seok-Hyeon
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.48 no.5
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    • pp.309-314
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    • 1999
  • The magnetized helical resonator plasma etcher has been built. Electron density and temperature were measured as functions of rf source power, axial magnetic field, and pressure. The results show electron density increases as the magnetic field increases and reached $2\times1012cm^{-3}$,/TEX>. The oxide etch rate and selectivity to polysilicon were investigated as the above mentioned conditions and self-bias voltage. We can obtain the much improved oxide etch selectivity to polysilicon (60 : 1) by applying the external axial weak magnetic field in magnetized helical resonator plasma etcher.

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SCANNING PROBE NANOPROCESSING

  • Sugimura, Hiroyuki;Nakagiri, Nobuyuki
    • Journal of Surface Science and Engineering
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    • v.29 no.5
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    • pp.314-324
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    • 1996
  • Scanning probe microscopes (SPMs) such as the scanning tunneling microscope (STM) and the atomic force microscope (AFM) were used for surface modification tools at the nanometer scale. Material surfaces, i. e., titanium, hydrogen-terminated silicon and trimethylsilyl organosilane monolayer on silicon, were locally oxidized with the best lateral spatial resolution of 20nm. The principle behind this proximal probe oxidation method is scanning probe anodization, that is, the SPM tip-sample junction connected through a water column acting as a minute electrochemical cell. An SPM-nanolithogrphy process was demonstrated using the organosilane monolayer as a resist. Area-selective chemical modifications, i. e., etching, electroless plating with gold, monolayer deposition and immobilization of latex nanoparticles; were achieved in nano-scale resolution. The area-selectivity was based on the differences in chemical properties between the SPM-modified and unmodified regions.

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Atomic layer deposited $Al_2O_3$ for the surface passivation of crystalline silicon solar cells ($Al_2O_3$ 부동화 막의 태양전지 응용)

  • Kim, Sun Hee;Shin, Jeong Hyun;Lee, Jun Hyeok;Lee, Hong Jae;Kim, Bum Sung;Lee, Don Hee
    • 한국신재생에너지학회:학술대회논문집
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    • 2010.06a
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    • pp.73.1-73.1
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    • 2010
  • 태양광 시장은 세계적인 금융 위기 속에서도 점점 그 규모가 확대되고 있다. 시장의 규모가 확대되고 있음에도 불구하고 금융 위기를 겪으면서 생산자 중심의 시장에서 수요자 중심의 시장으로 바뀌게 되었다. 이에 따라 더 적은 비용으로 높은 출력의 제품만이 경쟁력을 가지게 됨으로써 효율이 더욱 이슈화되었다. 여러 태양전지 중 가장 점유율이 높은 결정질 태양전지는 일반적인 양산 공정만으로 효율을 높이는데 한계가 있으므로 selective emitter, back contact, light induced plating 등의 새로운 공정을 도입하여 효율을 높이려는 경향이 나타나고 있다. 본 연구에서는, ALD 장치를 사용하여 결정질 태양전지의 후면을 passivation 함으로써 효율을 높이는 방법을 모색하였다. 부동화 층으로는 $Al_2O_3$를 사용하였으며 셀을 제조하여 평가하였다. 실험방법은 p-type의 웨이퍼를 이용하여 습식으로 texturing 후 $POCl_3$ 용액으로 p-n junction을 형성하였고 anti-reflection 막인 SiNx는 PECVD를 사용하여 R.I 2.05, 80nm 두께로 증착하였다. 그런 다음 후면의 n+ layer를 제거하기 위하여 SiNx에 영향을 미치지 않는 용액을 사용하여 후면을 식각하였다. BSF 층은 screen printer로 Al paste를 printing하여 형성하였고 Al etching용액으로 여분의 Al제거한 후 ALD 장치를 이용하여 $Al_2O_3$를 증착하였다. 마지막으로 전극을 형성한 후 laser로 isolation하여 효율을 평가하였다.

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Effects of $CH_{2}F_{2}$ and $H_2$ flow rates on process window for infinite etch selectivity of silicon nitride to PVD a-C in dual-frequency capacitively coupled plasmas

  • Kim, Jin-Seong;Gwon, Bong-Su;Park, Yeong-Rok;An, Jeong-Ho;Mun, Hak-Gi;Jeong, Chang-Ryong;Heo, Uk;Park, Ji-Su;Lee, Nae-Eung
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2009.05a
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    • pp.250-251
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    • 2009
  • For the fabrication of a multilevel resist (MLR) based on a very thin amorphous carbon (a-C) layer an $Si_{3}N_{4}$ hard-mask layer, the selective etching of the $Si_{3}N_{4}$ layer using physical-vapor-deposited (PVD) a-C mask was investigated in a dual-frequency superimposed capacitively coupled plasma etcher by varying the following process parameters in $CH_{2}F_{2}/H_{2}/Ar$ plasmas : HF/LF powr ratio ($P_{HF}/P_{LF}$), and $CH_{2}F_{2}$ and $H_2$ flow rates. It was found that infinitely high etch selectivities of the $Si_{3}N_{4}$ layers to the PVD a-C on both the blanket and patterned wafers could be obtained for certain gas flow conditions. The $H_2$ and $CH_{2}F_{2}$ flow ratio was found to play a critical role in determining the process window for infinite $Si_{3}N_{4}$/PVDa-C etch selectivity, due to the change in the degree of polymerization. Etching of ArF PR/BARC/$SiO_x$/PVDa-C/$Si_{3}N_{4}$ MLR structure supported the possibility of using a very thin PVD a-C layer as an etch-mask layer for the $Si_{3}N_{4}$ layer.

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Gravure Halftone Dots by Laser Direct Patterning (레이저 직접 패터닝에 의한 그라비아 망점 형성)

  • Suh, Jeong;Han, You-Hie;Kang, Lae-Heuck
    • Journal of the Korean Society for Precision Engineering
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    • v.17 no.11
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    • pp.191-198
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    • 2000
  • Laser direct patterning of the coated photoresist (PMER-NSG31B) layer was studied to make halftone dots on gravure printing roll. The selective laser hardening of photoresist by Ar-ion laser(wavelength: 333.6~363.8nm) was controlled by the A/O modulator. The coating thickness in the range of 5~11$\mu m$ could be obtained by using the up-down directional moving device along the vertically located roll. The width, thickness and hardness of the hardened lines formed under the laser power of 200~260㎽ and irradiation time of 4.4~6.6 $\mu$sec/point were investigated after developing. The hardened width increased as the coating thickness increased. Though the hardened thickness was changed due to the effect of the developing solution, the hardened layer showed good resistance to the scratching of 2H pencil. Also, the hardened minimum line widths of 10$\mu m$ could be obtained. The change of line width was also found after etching, and the minimum line widths of 6$\mu m$ could be obtained. The hardened lines showed the good resistance to the etching solution. Finally, the experimental data could be applied to make gravure halftone dots using the developed imaging process, successfully.

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A study on the highly selective SiO2 etching using a helicon plasma (헬리콘 플라즈마를 이용한 고선택비 산화막 식각에 관한 연구)

  • 김정훈;김진성;김윤택;황기웅;주정훈
    • Journal of the Korean Vacuum Society
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    • v.7 no.4
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    • pp.397-402
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    • 1998
  • $SiO_2$ etch characteristics were studied as a function of the basic parameters, such as the main RF power and the operating pressure in a helicon plasma. $SiO_2$ etch characteristics were improved as the main RF power was increased and the operating pressure was decreased. $SiO_2$ etch selectivity over silicon increased from 2.9 to 25.33 when the RF input power increased from 300 W to 2 kW and from 2.3 to 16.21 when the operating pressure decreased from 10 mTorr to 1.5 mTorr with $C_4F_8$ plasma. We used a quadrupole mass spectrometer to measure the relative abundancies of various ionic and radical species to explain the experimental results and found that when the operating pressure is low and the RF input power is high, the highly selective $SiO_2$ etch is achieved as a result of density increment of the densities of various ionic species.

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InGaN/GaN 양자 우물 구조를 갖는 마이크로 피라미드 구조 발광다이오드의 구현과 광.전기적 특성 분석

  • Kim, Do-Hyeong;Bae, Si-Yeong;Lee, Dong-Seon
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.143-144
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    • 2011
  • 최근 광전자 분야에서는 미래 에너지 자원에 대한 관심과 함께 GaN 기반 발광다이오드에 대한 연구가 활발히 진행되고 있다. 특히 InGaN/GaN 양자 우물 구조는 푸른색, 녹색 발광다이오드 구현에 있어 우수한 물질적 특성을 가지고 있다고 알려져 있다. 하지만 우수한 물질적 특성에도 불구하고 고인듐 고품위 막질 성장의 어려움으로 인해 높은 효율의 녹색 발광다이오드 구현하는 것은 여전히 어려운 실정이다. 이를 극복하기 위한 대안 중에 하나인 선택 영역 박막성장법(Selective Area Growth)은 마스크 패터닝을 통해 열린 영역에서만 박막을 성장하는 방법으로써 인듐 함량을 향상 시킬 수 있는 방법으로 주목 받고 있다. 선택 영역 박막 성장법을 이용하여 GaN를 성장하기 위해 그림 1의 공정을 통하여 n-GaN층 위에 SiO2 마스크를 포토리소그라피와 Reactive Ion Etching (RIE)를 이용한 건식 식각 공정을 통해 형성한 후 Metal Organic Chemical Vapor Deposition (MOCVD) 장비를 이용하여 선택적으로 에피를 성장하였다. 성장된 마이크로 피라미드 발광다이오드 구조는 n-GaN 피라미드 구조위에 양자우물 및 p-GaN을 성장함으로써 p-GaN/MQW/n-GaN 구조를 갖는다. 이렇게 생성된 피라미드 구조의 에피를 이용하여 발광다이오드를 제작한 후 그에 대한 전기적, 광학적 특성을 측정하였다. 2인치 웨이퍼의 중심을 원점 좌표인 (0,0)으로 설정하였을 때 2인치 웨이퍼에서 좌표에 해당하는 위치에서의 Photoluminescence (PL) 측정한 결과 일반적인 구조의 발광다이오드의 경우 첨두치가 441~451nm인데 반해 피라미드 구조의 발광다이오드의 경우 첨두치가 558nm~563nm 임을 알 수 있었다. 이를 통해 피라미드 구조 발광다이오드의 경우 일반적인 구조의 발광다이오드에 비해 인듐의 함유량을 증가시킬 수 있다는 것을 알 수 있다. 본 논문에서는 선택 영역 박막 성장법을 이용하여 마이크로 피라미드 InGaN/GaN 양자 우물 구조 구현과 광 전기적 특성에 대해 더 자세히 논의 하도록 하겠다.

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Electrochemical properties of porous AuCu dendrite surface for the oxygen reduction reaction in alkaline solutions (알칼리 수용액에서 산소환원반응에 대한 다공성 AuCu 덴드라이트 표면의 전기화학적 특성 평가)

  • Kim, Min-Yeong;Lee, Jong Won;Cho, Soo Yeon;Park, Da Jung;Jung, Hyun Min;Lee, Joo Yul;Lee, Kyu Hwan
    • Journal of Surface Science and Engineering
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    • v.54 no.1
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    • pp.1-11
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    • 2021
  • Porous dendrite structure AuCu alloy was formed using a hydrogen bubble template (HBT) technique by electroplating to improve the catalytic performance of gold, known as an excellent oxygen reduction reaction (ORR) catalyst in alkaline medium. The rich Au surface was maximized by selectively electrochemical etching Cu on the AuCu dendrite surface well formed in a leaf shape. The catalytic activity is mainly due to the synergistic effect of Au and Cu existing on the surface and inside of the particle. Au helps desorption of OH- and Cu contributes to the activation of O2 molecule. Therefore, the porous AuCu dendrite alloy catalyst showed markedly improved catalytic activity compared to the monometallic system. The porous structure AuCu formed by the hydrogen bubble template was able to control the size of the pores according to the formation time and applied current. In addition, the Au-rich surface area increased by selectively removing Cu through electrochemical etching was measured using an electrochemical calculation method (ECSA). The results of this study suggest that the alloying of porous AuCu dendrites and selective Cu dissolution treatment induces an internal alloying effect and a large specific surface area to improve catalyst performance.

Investigation of Firing Conditions for Optimizing Aluminum-Doped p+-layer of Crystalline Silicon Solar Cells

  • Lee, Sang Hee;Lee, Doo Won;Shin, Eun Gu;Lee, Soo Hong
    • Current Photovoltaic Research
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    • v.4 no.1
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    • pp.12-15
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    • 2016
  • Screen printing technique followed by firing has commonly been used as metallization for both laboratory and industrial based solar cells. In the solar cell industry, the firing process is usually conducted in a belt furnace and needs to be optimized for fabricating high efficiency solar cells. The printed-Al layer on the silicon is rapidly heated at over $800^{\circ}C$ which forms a layer of back surface field (BSF) between Si-Al interfaces. The BSF layer forms $p-p^+$ structure on the rear side of cells and lower rear surface recombination velocity (SRV). To have low SRV, deep $p^+$ layer and uniform junction formation are required. In this experiment, firing process was carried out by using conventional tube furnace with $N_2$ gas atmosphere to optimize $V_{oc}$ of laboratory cells. To measure the thickness of BSF layer, selective etching was conducted by using a solution composed of hydrogen fluoride, nitric acid and acetic acid. The $V_{oc}$ and pseudo efficiency were measured by Suns-$V_{oc}$ to compare cell properties with varied firing condition.

New Mechanism of Thin Film Growth by Charged Clusters

  • Hwang, Nong-Moon;Kim, Doh-Yeon
    • Proceedings of the Korea Association of Crystal Growth Conference
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    • 1999.06a
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    • pp.115-127
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    • 1999
  • The charged clusters or particles, which contain hundreds to thousands of atoms or even more, are suggested to form in the gas phase in the thin film processes such as CVD, thermal evaporation, laser ablation, and flame deposition. All of these processes are also used in the gas phase synthesis of the nanoparticles. Ion-induced or photo-induced nucleation is the main mechanism for the formation of these nanoclusters or nanoparticles inthe gas phase. Charged clusters can make a dense film because of its self-organizing characteristics while neutral ones make a porous skeletal structure because of its Brownian coagulation. The charged cluster model can successfully explain the unusual phenomenon of simultaneous deposition and etching taking place in diamond and silicon CVD processes. It also provides a new interpretation on the selective deposition on a conducting material in the CVDd process. The epitaxial sticking of the charged clusters on the growing surface is gettign difficult as the cluster size increases, resulting in the nanostructure such as cauliflowr or granular structures.

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