• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.518-521
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• 2004

The degradation characteristics of MgO protective layer and phosphors have been investigated in terms of the ion-induced secondary electron emission coefficient ${\gamma}$ and static margin of discharge voltages, respectively, in this experiment. The ion-induced secondary electron emission coefficients ${\gamma}$ for the degraded MgO protective layer and phosphors have been studied by ${\gamma}$ -focused ion beam system. The energy of Ne+ ions used is from 80 eV to 200 eV in this experiment. The degraded MgO and phosphor layers are found to have higher ${\gamma}$ than that of normal ones without degradations or aged one. Also, the static margin of discharge voltages for test panels with degraded MgO protective layer and phosphors been found to be seriously decreased in comparison with those of normal ones without degradations.

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.507-510
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• 2004

Oblique ion-induced secondary electron emission coefficient(${\gamma}$) with low energy ..and work function ${\phi}_{\omega}$(${\theta}$ = 0 and ${\theta}$ = 20) of the MgO thin film in AC-PDPs has been measured by ${\gamma}$-FIB system. The MgO thin film has been deposited from sintered material under electron beam evaporation method. The energy of $He^+$ ions used has been ranged from 50eV to 150eV. Oblique ion beam has been chosen to be 10 degree, 20 degree and 30 degree. It is found that the higher secondary electron emission coefficient(${\gamma}$) has been achieved by the higher oblique ion beam up to inclination angle of 30 degree than the perpendicular incident ion beam.

• Fire Science and Engineering
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• v.22 no.5
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• pp.43-47
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• 2008

Recently SIMS has attracted interest as new technique to distinguish the primary and the secondary arc beads. A Cs+ primary ion beam was used to detect the $^{12}C^-$, $^{63}Cu^-$, $^{18}O^-$, $^{35}Cl^-$ secondary ions which are formed during depth profiles in the copper wires. In this work, we studied thermal diffusion in the copper wire which are occurred with supplying over-current. The results demonstrated that Carbon and Chloride are diffused in PVC-coated copper wire deeper than none PVC-coated. However Oxygen showed the reverse diffusion property.

• Journal of the Korean Vacuum Society
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• v.11 no.2
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• pp.108-112
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• 2002

We investigated the secondary electron emission characteristics of MgO layer used as the protecting material in a.c. plasma display panel(a.c.-PDPs) using a pulsed ion beam technique, where the surface charging can be effectively suppressed during the measurement. The measurement of the secondary electron emission coefficients ($\gamma$) on the surface of $SiO_2$ was carried out and then, it was found that the yields were dependent on incident ion energies. In addition, it was clearly demonstrated that the sputtering on MgO surface leads to lower yields, which suggests that the surface plays a key role on the operating conditions, such as life time, fast response, and etc.

• Journal of Hydrogen and New Energy
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• v.23 no.4
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• pp.353-363
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• 2012

The relationship between the diffusivity and electrochemical characteristics of lithium secondary battery with the modified Si anode material prepared in HF/$AgNO_3$ solution was investigated. The crystallographic structure and images of the modified porous Si and modified Si/Cu was examined using the X-ray diffraction, BET and SEM. To examine the effect of metal composite and pore size distribution according to chemical etching on the electrochemical characterization, the electrodes for half cells were prepared with the modified Si, modified Si/Cu, and modified Si/Cu annealed with $600^{\circ}C$. Our results showed that the chemical diffusivity of lithium ions was related to structure and resistance of Si/Cu composite anode material. The lithium diffusivity in modified silicon compound calculated from the CV was at the range of $1{\times}10^{-12}$ to $9{\times}10^{-16}cm^2/s$. The effects of modified silicon structure and resistance on the cycling efficiency were significant.

• Journal of Astronomy and Space Sciences
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• v.35 no.4
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• pp.219-225
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• 2018

Cosmic rays are ions that move at relativistic speeds. They generate secondary cosmic rays by successive collisions with atmospheric particles, and then, the secondary particles reach the ground. The secondary particles are mainly neutrons and muons, and the neutrons are observed by the ground neutron monitor. This study compared the diurnal variation in cosmic ray intensity obtained via harmonic analysis and that obtained through the pile-up method, which was examined in a previous study. In addition, we analyzed the maximum phase of the diurnal variation using four neutron monitors with a cutoff rigidity below approximately 6 GV, located at similar longitudes to the Oulu and Rome neutron monitors. Expanding the data of solar cycles 20-24, we examined the time of the maximum cosmic ray intensity, that is, the maximum phase regarding the solar cyclic modulation. During solar cycles 20-24, the maximum phase derived by harmonic analysis showed no significant difference with that derived by the pile-up method. Thus, the pile-up method, a relatively straightforward process to analyze diurnal variation, could replace the complex harmonic analysis. In addition, the maximum phase at six neutron monitors shows the 22-year cyclic variation very clearly. The maximum phase tends to appear earlier and increase the width of the variation in solar cycles as the cutoff rigidity increases.

• Journal of Microbiology
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• v.41 no.3
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• pp.239-247
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• 2003

The LRV1-4 capsid protein possesses an endoribonuclease activity that is responsible for the single site-specific cleavage in the 5' untranslated region (UTR) of its own viral RNA genome and the formation of a conserved stem-loop structure (stem-loop IV) in the UTR is essential for the accurate RNA cleavage by the capsid protein. To delineate the nucleotide sequences, which are essential for the correct formation of the stem-loop structure for the accurate RNA cleavage by the viral capsid protein, a wildtype minimal RNA transcript (RNA 5' 249-342) and several synthetic RNA transcripts encoding point-mutations in the stem-loop region were generated in an in vitro transcription system, and used as substrates for the RNA cleavage assay and RNase mapping studies. When the RNA 5' 249-342 transcript was subjected to RNase T1 and A mapping studies, the results showed that the predicted RNA secondary structure in the stem-loop region using FOLD analysis only existed in the presence of Mg$\^$2＋/ ions, suggesting that the metal ion stabilizes the stem-loop structure of the substrate RNA in solution. When point-mutated RNA substrates were used in the RNA cleavage assay and RNase T1 mapping study, the specific nucleotide sequences in the stem-loop region were not required for the accurate RNA cleavage by the viral capsid protein, but the formation of a stem-loop like structure in a region (nucleotides from 267 to 287) stabilized by Mg$\^$2＋/ ions was critical for the accurate RNA cleavage. The RNase T1 mapping and EMSA studies revealed that the Ca$\^$2＋/ and Mn$\^$2＋/ ions, among the reagents tested, could change the mobility of the substrate RNA 5' 249-342 on a gel similarly to that of Mg$\^$2＋/ ions, but only Ca$\^$2＋/ ions identically showed the stabilizing effect of Mg$\^$2＋/ ions on the stem-loop structure, suggesting that binding of the metal ions (Mg$\^$2＋/ or Ca$\^$2＋/) onto the RNA substrate in solution causes change and stabilization of the RNA stem-loop structure, and only the substrate RNA with a rigid stem-loop structure in the essential region can be accurately cleaved by the LRV1-4 viral capsid protein.

• Journal of the Korean Chemical Society
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• v.53 no.4
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• pp.453-465
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• 2009

In this study, the descriptions of salt solubility in the textbooks of secondary school and college were reviewed to figure out the reason of low understanding of elementary and secondary school students and teachers about the solubility of a salt in the presence of other ions. The ionic strength dependence of salt solubility was not introduced in the secondary school textbooks and general chemistry textbooks. It appeared in the physical chemistry textbooks as a direct or an indirect explanation. However, most of college senior students who had learned the physical chemistry could not relate the salt solubility with the ionic strength change. The factors might affect salt solubility, such as the ion pair formation and the activity coefficient change by ionic strength, were mentioned and an experimental result was also shown to resolve the questions that college students and teachers might have. Because these explanations are beyond the secondary school level, we need to develope an easier and better explanation suitable for the secondary school students.

• Journal of the Korean Ceramic Society
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• v.40 no.4
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• pp.365-370
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• 2003

The phase development process of $Ba_2$ $Ti_{9}$ $O_{20}$ ceramics is not clearly known and frequently accompanies second phases which deteriorate dielectric properties. In synthesizing $Ba_2$ $Ti_{9}$ $O_{20}$ ceramics, in order to trace the reaction sequence during conventional solid-state reaction in BaO-Ti $O_2$ system, different barium sources of BaC0$_3$ and BaTi0$_3$ precursor were used as starting materials. From the analysis of XRD patterns, different secondary phases could be identified depending on the barium source used, which might mean that the equilibrium phases in BaO-Ti $O_2$ system are very difficult to be synthesized. Because the BaTi0$_3$ precursor provides short diffusion paths of ions, the system revealed less secondary phases during solid state reaction. In synthesizing BaO-xSm$_2$0$_3$-4.5Ti0$_2$ system using different barium sources, different secondary phases were developed also. Microstructure and dielectric properties were examined and discussed in terms of secondary phase development.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.36D no.4
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• pp.48-56
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• 1999

In this paper, we have investigated experimentally the effects of initial oxygen concentration on oxygen pileup phenomenon and the diffusion of implanted impurities. 1.2 MeV $^{11}B^{+}$ and 2.2 MeV $^{31}P^{+}$ ions were implanted into p-type (100) Si wafers with a dose of 1${\times}10^{15}$ / $\textrm{cm}^2$. Secondary ion mass spectrometry(SIMS) measurements were carried out to obtain depth distribution profiles for implanted impurities and oxygen atoms after two-step annealing of $700^{\circ}C$(20 hours)+$1000^{\circ}C$(10 hours). Residual secondary defect distribution and annealing behabiour were also studied by cross-sectional transmission electron microscopy(TEM) observations. Oxygen pileup nearly $R_p$(projected range) were observed by SIMS measurements and considerable amount of residual secondary defect layer were observed by TEM observations. It can be seen that oxygen atoms are trapped at the secondary defects by the experimental results. Enhanced diffusions of boron and phosphorus to the bulk direction were observed with the increasing of initial oxygen concentration.