Study of Thermal Diffusion in the Copper Wire Using SIMS Depth Profiling |
Park, Jong-Jin
(국립과학수사연구소)
Hong, Tae-Eun (한국기초과학지원연구원) Cho, Young-Jin (국립과학수사연구소) Seo, Young-Il (국립과학수사연구소) Moon, Byung-Sun (국립과학수사연구소) Park, Jong-Chan (국립과학수사연구소) Pak, Hyuk-Kyu (부산대학교 물리학과) Lee, Jeong-Sik (경성대학교 물리학과) |
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