• Progress in Superconductivity and Cryogenics
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• v.9 no.4
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• pp.7-10
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• 2007

The transport current distribution across the tape width of a SmBCO coated conductor was investigated. The current distribution was estimated by applying an inversion process to the field distribution measured in the vicinity of the tape by using a scanning Hall probe method. The obtained result is well consistent with one predicted by the Bean model, however, at the edges the current are not constant and do not generally plateau, on the contrary.

• 한국신재생에너지학회:학술대회논문집
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• 2011.05a
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• pp.130.2-130.2
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• 2011

본 연구에서는 RF magnetron sputtering을 이용하여 실리콘 박막 태양전지용 ZnO:Al 전면전극을 제작하고 다양한 식각조건에 따른 ZnO:Al 박막의 표면형상 변화와 함께 전기적 및 광학적 특성 변화를 조사하였다. pin 구조를 갖는 실리콘 박막 태양전지의 효율 향상을 위해서는 입사광의 산란효과에 따른 광포획 증가가 필수적이며 이를 위하여 ZnO:Al 전면전극의 표면텍스처링 형성이 필요하다. 식각용액으로는 HCl과 HF 등을 사용하였으며 식각용액 농도 및 식각시간을 변화시켰다. 식각 후의 ZnO:Al 박막의 표면형상은 SEM(Scanning Electron Microscope)과 AFM(Atomic Force Microscope)을 이용하여 분석을 하였고, UV-visible-nIR spectrometer를 이용하여 총 투과도 및 산란 투과도를 측정하였다. 이 외에도 four-point probe 및 Hall measurement를 이용하여 전기적 특성 변화를 조사하였다. 다양한 식각조건에 따라 제조된 ZnO:Al 박막 위에 실리콘 박막 태양전지를 제작하여 전면전극의 표면형상에 따른 태양전지 성능변화를 비교 분석하였다.

• Proceedings of the Materials Research Society of Korea Conference
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• 2011.05a
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• pp.27.2-27.2
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• 2011

본 연구에서는 저저항/고투과 플렉시블 투명 전극 개발을 위해 금속 그리드가 적용된 투명 전극을 개발하였다. Lift off 공정을 도입하여 플렉시블 PET 기판 위에 Ag grid를 성막하고 이후 연속 공정이 가능한 Roll-to-Roll sputtering system을 이용하여 최적화된 ITO(40nm)/Ag(12nm)/ITO(40nm) 다층 투명 전극을 성막하였다. 제작된 플렉시블 투명 전극의 전기적, 광학적, 구조적 특성 및 기계적/전기적 안정성 평가를 위해 four-point probe measurement, Hall effect measurement, UV/Vis spectrometer, scanning electron microscopy 및 bending tester를 이용하여 각각의 특성을 분석하였다. Ag grid가 적용된 ITO/Ag/ITO 투명 전극에서 Ag의 배선 간격이 0.75 mm일 때 0.18 ohm/sq. 의 낮은 면 저항과 가시광선 영역에서 80% 이상의 높은 투과율을 나타내었으며, 이러한 저저항 및 고투과율 특성으로 인해 최적화된 배선 간격 0.75 mm에서 $538.11{\times}10^{-3}\;ohm^{-1}$의 매우 높은 figure of merit ($T^{10}/R_{sh}$) 값을 확보할 수 있었다. 기계적 응력에 따른 전기적 안정성 특성 분석 결과 5,000회 이상의 bending cycle 에서도 초기 저항 값과 유사한 전기적 특성을 나타냄으로써 Ag grid가 적용된 ITO/Ag/ITO 플렉시블 투명 전극의 기계적 응력에 따른 전기적 안정성을 확인할 수 있었다. Ag grid가 적용된 ITO/Ag/ITO 투명 전극의 투명 안테나 적용 가능성을 타진하기 위해 low band 및 high band 영역에서의 안테나 효율을 측정하였으며, 모든 영역에서 상용화된 copper 안테나와 유사한 효율을 나타내었다. Ag grid를 이용한 플렉시블 투명 전극의 저저항/고투과율 특성은 플렉시블 광전소자의 투명 안테나로의 적용 가능성을 나타낸다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.11a
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• pp.247-247
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• 2008

In this work, VOx thin films have been deposited by DC magnetron sputtering method on glass substrate using argon and oxygen gases. We examined the effects of the post annealing temperature on the structural, optical, and electrical variations of VOx films. The films were annealed at temperatures ranging from 300 to $500^{\circ}C$ in steps of $100^{\circ}C$ using RTA equipment in air ambient. The thickness of the film and interface between film and substrate were observed by field emission scanning electron microscopy (FESEM). To analysis the structural properties of VOx with various annealng temperatures, we used XRD method. Also, we investigated the electrical and optical properties of VOx thin films using hall measurement, 4-point probe, and UV-visible methods.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.11a
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• pp.412-413
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• 2007

We report on the electrical, optical, and structural properties of indium zinc tin oxide (IZTO) anode films grown at room temperature on glass substrate. The IZTO anode films grown by a RF magnetron sputtering were investigated as functions of RF power, working pressure, and process time in pure Ar ambient. To investigate electrical, optical and structural properties of IZTO anode films, 4-point probe, Hall measurement, UV/Vis spectrometer, Field Emission Scanning Electron Microscopy (FE-SEM), and X-ray diffraction (XRD) were performed, respectively. A sheet resistance of $13.88\;{\Omega}/{\square}$, average transmittance above 80 % in visible range were obtained from optimized IZTO anode films grown on glass substrate. These results shown the amorphous structure regardless of RF power and working pressure due to low substrate temperature.

• Journal of the Semiconductor & Display Technology
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• v.17 no.2
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• pp.71-75
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• 2018

In this study, we prepared OLED cell with ITO (Indium Tin Oxide) films grown on the glass substrate by facing targets sputtering. Before fabrication of OLED cells, we investigated properties of ITO films deposited at various sputtering conditions. To investigate properties of as-prepared films, we employed four-point probe, UV-VIS spectrometer, X-ray diffractometer (XRD), field emission scanning electron microscopy (FE-SEM), hall-effect measurement. As a results, as-prepared ITO films have high transmittance of over 85 % in the visible range (300-800 nm) and a resistivity of under $10^{-4}$ (${\Omega}-cm$). Their resistivity increased as a function of oxygen gas flow and substrate temperature. OLED cell with ITO films were fabricated by thermal evpoeartor. Properties of OLEDs cell referring to properties of ITO films.

• Progress in Superconductivity and Cryogenics
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• v.12 no.4
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• pp.13-16
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• 2010

The Lorentz force distribution of a high $T_c$ superconducting tape with increasing transport currents in magnetic field ($H_a$) was visualized. The external magnetic field was applied normally to the coated conductor tape surface after zero-field cooling, and the transport current ($I_a$) was increased stepwise from 0 to 90 % of the values of the critical current ($I_c$ ($H_a$)) at applied filed, Ha. The field distribution (H(x)) near the sample surface across the tape width (2w) was measured using the scanning Hall probe method. Applying an inversion to the measured field distribution, we obtained the underlying current distribution (J(x)), from which the magnetic induction, B(x) was calculated with Biot-Savart law. Then Lorentz force per unit length was calculated using F(x)=J(x)${\times}$B(x), which appears to be very inhomogeneous along the tape width due to the complicated distributions of J(x) and B(x).

• Korean Journal of Materials Research
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• v.24 no.10
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• pp.543-549
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• 2014

A zinc oxide (ZnO) hybrid structure was successfully fabricated on a glass substrate by metal organic chemical vapor deposition (MOCVD). In-situ growth of a multi-dimensional ZnO hybrid structure was achieved by adjusting the growth temperature to determine the morphologies of either film or nanorods without any catalysts such as Au, Cu, Co, or Sn. The ZnO hybrid structure was composed of one-dimensional (1D) nanorods grown continuously on the two-dimensional (2D) ZnO film. The ZnO film of 2D mode was grown at a relatively low temperature, whereas the ZnO nanorods of 1D mode were grown at a higher temperature. The change of the morphologies of these materials led to improvements of the electrical and optical properties. The ZnO hybrid structure was characterized using various analytical tools. Scanning electron microscopy (SEM) was used to determine the surface morphology of the nanorods, which had grown well on the thin film. The structural characteristics of the polycrystalline ZnO hybrid grown on amorphous glass substrate were investigated by X-ray diffraction (XRD). Hall-effect measurement and a four-point probe were used to characterize the electrical properties. The hybrid structure was shown to be very effective at improving the electrical and the optical properties, decreasing the sheet resistance and the reflectance, and increasing the transmittance via refractive index (RI) engineering. The ZnO hybrid structure grown by MOCVD is very promising for opto-electronic devices as Photoconductive UV Detectors, anti-reflection coatings (ARC), and transparent conductive oxides (TCO).

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.24 no.7
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• pp.568-573
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• 2011

AZO (Al doped ZnO) thin films were deposited on the quartz substrates with thickness variation from 25 to 300 nm by using PLD (pulsed laser deposition). XRD (x-ray diffractometer), SPM (scanning probe microscopy), Hall effect measurement and uv-visible spectrophotometer were employed to investigate the structural, morphological, electrical and optical properties of the thin films. XRD results demonstrated that films were preferrentially oriented along the c-axis and crystallinity of film was improved with increase of film thickness. As for the surface morphologies, the mean diameter and root mean square of grains were increased as the film thickness was increased. When the film thickness was 200 nm, the lowest resistivity of $4.25{\times}10^{-4}\;{\Omega}cm$ obtained with carrier concentration of $6.84{\times}10^{20}\;cm^{-3}$ and mobility of $21.4\;cm^2/V{\cdot}S$. All samples showed more than 80% of transmittance in the visible range. Upon these results, it is found that the samples thickness can affect their structural, morphological, optical and electrical properties. This study suggests that the resistivity can be improved by controlling film thickness.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.08a
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• pp.231-231
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• 2011

본 연구에서는 co-sputtering 시스템을 이용하여 아나타세 TiO2의 도핑 농도 변화에 따른 다성분계 TiO2-ITO (TITO) 박막의 전기적, 광학적, 구조적 특성 변화 및 급속 열처리(RTA) 공정에 따른 전기적, 광학적 특성 변화를 분석하였다. 실험을 위해 아나타세 TiO2 타겟과 ITO 타겟(10 wt% $SnO_2$ doped $In_2O_3$)이 tilted cathode에 장착되었으며, ITO 타겟의 인가전류를 120 W로 고정한 채 아나타세 TiO2 타겟의 인가전류를 증가시킴으로써 도핑 농도를 변화하였다. 제작된 TITO 투명 전극의 전기적, 광학적, 구조적 특성 평가를 위해 four-point probe measurement, Hall effect measurement, UV/Vis. spectrometry, scanning electron microscopy (SEM) 이용하여 각각의 특성을 분석하였다. 상온에서 제작된 TITO의 경우 최적화된 $TiO_2$ 인가전류 100W에서 460.8 ohm/sq. 의 전기적 특성과 가시광선 영역 400~550 nm에서 85% 이상의 광학적 투과율을 확보할 수 있었다. 뿐만 아니라 상온에서 최적화된 TITO 투명 전극의 급속 열처리 시 600$^{\circ}C$ 급속 열처리 조건에서 매우 낮은 25.94 ohm/sq.면저항, $5.1{\times}10^{-4}$ ohm-cm 비저항과 81% 투과율을 확보할 수 있었다. 아나타세 $TiO_2$가 도핑된 TITO 투명 전극의 급속 열처리 공정에도 불구하고 매우 평탄한 표면을 나타냄을 SEM 이미지를 통하여 확인할 수 있었다. 이러한 TITO 투명 전극의 우수한 전기적, 광학적, 구조적 특성은 indium saving 투명 전극으로써 고가 ITO 박막의 대치가능성을 나타낸다.