• 제목/요약/키워드: scanning electron microscopy

검색결과 5,034건 처리시간 0.032초

Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy

  • Tay, Roland Yingjie;Lin, Jinjun;Tsang, Siu Hon;McCulloch, Dougal G.;Teo, Edwin Hang Tong
    • Applied Microscopy
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    • 제46권4호
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    • pp.217-226
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    • 2016
  • Monolayer hexagonal boron nitride (h-BN) is a phenomenal two-dimensional material; most of its physical properties rival those of graphene because of their structural similarities. This intriguing material has thus spurred scientists and researchers to develop novel synthetic methods to attain scalability for enabling its practical utilization. When probing the growth behaviors and structural characteristics of h-BN, the use of appropriate characterization techniques is important. In this review, we detail the use of scanning and transmission electron microscopies to investigate the atomic configurations of monolayer and bilayer h-BN grown via chemical vapor deposition. These advanced microscopy techniques have been demonstrated to provide intimate insights to the atomic structures of h-BN, which can be interpreted directly or indirectly using known growth mechanisms and existing theoretical calculations. This review provides a collective understanding of the structural characteristics and defects of synthetic h-BN films and facilitates a better perspective toward the development of new and improved synthesis techniques.

Transmission Electron Microscopy Sample Preparation of Ge2Sb2Te5 Nanowire Using Electron Beam

  • Lee, Hee-Sun;Lee, Jun-Young;Yeo, Jong-Souk
    • Applied Microscopy
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    • 제45권4호
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    • pp.199-202
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    • 2015
  • A simple and novel transmission electron microscopy (TEM) sample preparation method for phase change nanowire is investigated. A $Ge_2Sb_2Te_5$ (GST) nanowire TEM sample was meticulously prepared using nanomanipulator and gas injection system in a field emission scanning electron microscopy for efficient and accurate TEM analysis. The process can minimize the damage during the TEM sample preparation of the nanowires, thus enabling the crystallographic analysis of as-grown GST nanowires without unexpected phase transition caused by e-beam heating.

Biomedical Applications of Stereoscopy for Three-Dimensional Surface Reconstruction in Scanning Electron Microscopes

  • Kim, Ki Woo
    • Applied Microscopy
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    • 제46권2호
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    • pp.71-75
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    • 2016
  • The scanning electron microscope (SEM) offers two-dimensional (2D) micrographs of three-dimensional (3D) objects due to its inherent operating mechanisms. To overcome this limitation, other devices have been used for quantitative morphological analysis. Many efforts have been made on the applications of software-based approaches to 3D reconstruction and measurements by SEM. Based on the acquisition of two stereo images, a multi-view technique consists of two parts: (i) geometric calibration and (ii) image matching. Quantitative morphological parameters such as height and depth could be nondestructively measured by SEM combined with special software programs. It is also possible to obtain conventional surface parameters such as roughness and volume of biomedical specimens through 3D SEM surface reconstruction. There is growing evidence that conventional 2D SEM without special electron detectors can be transformed to 3D SEM for quantitative measurements in biomedical research.

Relationship of the Distribution Thickness of Dielectric Layer on the Nano-Tip Apex and Distribution of Emitted Electrons

  • Al-Qudah, Ala'a M.;Mousa, Marwan S.
    • Applied Microscopy
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    • 제46권3호
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    • pp.155-159
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    • 2016
  • This paper analyses the relationship between the distribution of a dielectric layer on the apex of a metal field electron emitter and the distribution of electron emission. Emitters were prepared by coating a tungsten emitter with a layer of epoxylite resin. A high-resolution scanning electron microscope was used to monitor the emitter profile and measure the coating thickness. Field electron microscope studies of the emission current distribution from these composite emitters (Tungsten-Clark Electromedical Instruments Epoxylite resin [Tungsten/CEI-resin emitter]) have been carried out. Two forms of image have been observed: bright single-spot images, thought to be associated with a smooth substrate and a uniform dielectric layer; and multi-spot images, though to be associated with irregularity in the substrate or the dielectric layer.

조선시대 태아 미라 두피조직의 보존상태 분석 (Analysis on the Preservation of Scalp Collected from Full-Term Baby Mummy of Medieval Joseon Dynasty)

  • 장병수
    • Applied Microscopy
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    • 제38권2호
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    • pp.135-140
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    • 2008
  • 본 연구에서 분만 중에 사망한 여성미라의 자궁 내에 있는 태아미라의 두피를 주사전자현미경과 투과전자현미경을 사용하여 관찰하였다. 주사전자현미경상에서 태아 두피의 표면은 잘 보존된 상태로 관찰되었으며, 각질층에 각화세포도 모양을 그대로 유지하고 있었다. 또한 땀샘과 모발도 원형 그대로 유지하고 있었으며 일부 두피표면에 모발이 빠져서 형성된 모공들이 다수 관찰되었다. 채취한 두피의 횡단면 두께는 약 1mm로 나타났으며 표피와 진피 및 피하조직이 뚜렷하게 존재하였다. 투과전자현미 경상에서 상피세포의 구조나 형태는 관찰되지 않았으며 또한, 세포의 형태를 그대로 유지하고 있는 어떠한 세포들도 전혀 관찰할 수 없었다. 그러나 진피의 교원섬유들은 잘 보존되어 있었고 이들 사이에 Clostridium 속으로 추정되는 부패세균들이 다수 관찰되었다.

시화지구 연약점토의 광물학적 특성 (Characteristics of Clay Minerals in Sihwa Area)

  • 김낙경;박종식;김유신
    • 한국지반공학회:학술대회논문집
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    • 한국지반공학회 2003년도 봄 학술발표회 논문집
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    • pp.773-780
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    • 2003
  • The characteristics of soft clays is very important for the land development plan. This study is to investigate correlations between the engineering properties and the characteristics of clay minerals of the disturbed clay samples obtained from Sihwa area. This study included X-Ray Diffraction Analysis, X-Ray Fluorescence Spectrometer Analysis, Scanning Electron Microscopy Analysis and Energy Dispersive X-Ray Spectrometer Analysis. The correlations between the clay mineral properties and the laboratory and field testing results were investigated.

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초경합금의 와이어 방전가공에 의한 특성 (Characteristics in W-EDM of Tungsten Carbide)

  • 맹민재
    • 한국안전학회지
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    • 제16권4호
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    • pp.7-13
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    • 2001
  • Wire electrical discharge machining experiments in conducted to investigate characteristics of acoustic emission (AE) and electrical discharge energy due to current peak (I$_{p}$), pulse on time($\tau$/on/). The AE signals are obtained with a sensor attached to workpiece side. Machining states are identified with scanning electron microscopy and residual stress analyzer. It is demonstrated that the residual stress provide reliable informations about the machining states. Moreover, machining states can be detected successfully using both the residual stress and AE count rate.e.

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고압동결고정을 이용한 애기장대 줄기의 cryo-SEM 분석법 (Cryo-SEM Methodology of Arabidopsis thaliana Stem Using High-Pressure Freezing)

  • 최윤정;이경환;제아름;채희수;장지훈;이은지;권희석
    • Applied Microscopy
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    • 제42권2호
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    • pp.111-114
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    • 2012
  • The scanning electron microscopy is an ideal technique for examining plant surface at high resolution. Most hydrate samples, however, must be fix and dehydrate for observation in the scanning electron microscope. Because the microscopes operate under high vacuum, most specimens, especially biological samples, cannot withstand water removal by the vacuum system without morphological distortion. Cryo-techniques can observe in their original morphology and structure without various artifacts from conventional sample preparation. Rapid cooling is the method of choice for preparing plant samples for scanning electron microscopy in a defined physiological state. As one of cryo-technique, high-pressure freezing allows for fixation of native non-pretreated samples up to $200{\mu}M$ thick and 2 mm wide with minimal or no ice crystal damage for the freezing procedure. In this study, we could design to optimize structural preservation and imaging by comparing cryo-SEM and convention SEM preparation, and observe a fine, well preserved Arabidopsis stem's inner ultrastructure using HPF and cryo-SEM. These results would suggest a useful method of cryo-preparation and cryo-SEM for plant tissues, especially intratubule and vacuole rich structure.