• Bulletin of the Korean Mathematical Society
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• v.53 no.3
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• pp.779-791
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• 2016

Transfer of homological properties under base change is a classical field of study. Let $R{\rightarrow}S$ be a ring homomorphism. The relations of Gorenstein projective (or Gorenstein injective) dimensions of unbounded complexes between $U{\otimes}^L_RX$(or $RHom_R(X,U)$) and X are considered, where X is an R-complex and U is an S-complex. In addition, some sufficient conditions are given under which the equalities $G-dim_S(U{\otimes}^L_RX)=G-dim_RX+pd_SU$ and $Gid_S(RHom_R(X,U))=G-dim_RX+id_SU$ hold.

• Bulletin of the Korean Space Science Society
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• 2010.04a
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• pp.35.1-35.1
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• 2010

Using the spectroscopic analysis and the theoretical modeling, physical properties of the nearby astrometric binary $\mu$ Cas have been determined. In spite of the well-defined parallax and astrometric orbit, there has been a chronic mass ratio problem between components. Recently, the radius of the primary component has been detected from the optical interferometric observation of the CHARA array. Using the high resolution spectroscopic analysis, we found that $\mu$ Cas have $\alpha$-enhanced chemical composition with respect to the scaled solar abundance by a factor of two. Combining our abundance analysis with recently determined physical properties, the consistent models for $\mu$ Cas have been constructed within the frame work of standard stellar theory. Through a statistical minimization between theoretical model grids, a reliable set of physical dimensions has been defined. Furthermore, the mode oscillation frequency of the best model has been calculated.

• FOCUS: LIFE SCIENCE
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• no.1
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• pp.7.1-7.4
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• 2024

The document "Understanding the Relationship Between Particle Size, Performance, and Pressure" explores the impact of particle size on chromatographic performance and system pressure. The study highlights how smaller particles can improve separation efficiency by providing higher resolution and faster analysis times. However, this comes at the cost of increased backpressure, which can challenge the system's hardware and require higher operating pressures. The document discusses the balance needed between particle size, column dimensions, and system pressure to optimize performance without exceeding the pressure limits of chromatographic systems. It outlines the advantages of using superficially porous particles (SPPs) over fully porous particles (FPPs) in achieving high efficiency with lower backpressure. The study also emphasizes the importance of selecting appropriate column dimensions and flow rates to manage system pressure while maintaining optimal performance. In conclusion, understanding the interplay between particle size, performance, and pressure is crucial for optimizing chromatographic separations, ensuring system longevity, and achieving high-quality analytical results.

• Journal of the Korean Society for Nondestructive Testing
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• v.12 no.1
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• pp.9-15
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• 1992

Ultrasonic spectroscopy is likely to become a very powerful NDE method for detection of microfects and thickness measurement of thin film below the limit of ultrasonic distance resolution in the opaque materials, provides a useful information that cannot be obtained by a conventional ultrasonic measuring system. In this paper, we considered a thin film below the limit of ultrasonic distance resolution sandwitched between two substances as acoustical analysis model, demonstrated the usefulness of ultrasonic spectroscopic analysis technique using information of ultrasonic frequency for measurements of thin film thickness, regardless of interference phenomenon and phase reversion of ultrasonic waveform. By using frequency intervals(${\triangle}f$) of periodic minima from the ratio of reference power spectrum of reflective waveform obtained a sample to power spectrum of multiple reflective waves obtained interference phenomenon caused by ultrasonic waves reflected at the upper and lower surfaces of a thin layer, can measured even dimensions of interest are smaller than the ultrasonic wave length with simplicity and accuracy.

• 제어로봇시스템학회:학술대회논문집
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• 1990.10b
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• pp.1150-1155
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• 1990

This paper proposes an optimal redundancy resolution of a kinematically redundant manipulator while considering homotopy classes. The necessary condition derived by minimizing an integral cost criterion results in a second-order differential equation. Also boundary conditions as well as the necessary condition are required to uniquely specify the solution. In the case of a cyclic task, we reformulate the periodic boundary value problem as a two point boundary value problem to find an initial joint velocity as many dimensions as the degrees of redundancy for given initial configuration. Initial conditions which provide desirable solutions are obtained by using the basis of the null projection operator. Finally, we show that the method can be used as a topological lifting method of nonhomotopic extremal solutions and also show the optimal solution with considering the manipulator dynamics.

• Transactions of the Korean Society of Mechanical Engineers
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• v.17 no.7 s.94
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• pp.1731-1739
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• 1993

An application of Scanning Tunneling Microscopy(STM) is investigated for the measurement of 3-dimensional profiles of the macro-machined patterns of which critical dimensions lie in the range of submicrometers. Special emphasis of this investigation is given to extending the measuring ranges of STM upto the order of several micrometers while maintaining superb nanometer measuring resolution. This is accomplished by correcting hysteresis effects of piezoelectric actuators by using non-linear compensation models. Detailed aspects of design and control of a prototype measurement system are described with some actual measuring examples in which fine It patterns can successfully be traced with a resolution of 1 nanometer over a surface range of $4{\times}2$ micrometers.

• 한국정보디스플레이학회:학술대회논문집
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• 2005.07a
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• pp.676-678
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• 2005

Future Mobile displays and the emerging systems on Glass for the upcoming TFT_LCDs or Active-OLEDs based on LTPS, and the exciting c-Si critically require very-high resolution lithography. We report the methodology and latest results on the alignment, magnification control and stitching systems on a HMA500 holographic mask aligner for printing $0.5{\mu}m-resolution$ display patterns onto glass substrates of dimensions up to $500mm{\times}400mm$.

• Journal of the Semiconductor & Display Technology
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• v.3 no.2
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• pp.27-33
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• 2004

This paper is concerned with development of a micro tensile testing machine for optical functional materials such as single or poly crystal silicon and nickel film. Two micro tensile testers have been developed for various types of materials and dimensions. One of the testers is actuated by a PZT and the other is actuated by a servo motor for a precise displacement control. The specifications of PZT actuated micro tensile tester developed are as follows: the volumetric size of tester is desktop sized of 710$\times$200$\times$270 $mm^3$; the minimum load capacity and the load resolution in the load cell of 1N are 3 mN and 0.1 mN respectively; the full stroke and the stoke resolution of piezoelectric actuator are 1 mm and 10nm respectively. A special automatic specimen installing equipment is applied in order to prevent unexpected deformation and misalignment of specimens during handling of specimen for testing.

• Proceedings of the Korean Society of Propulsion Engineers Conference
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• 2010.11a
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• pp.760-763
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• 2010

The expansion of 1D numerical code to 2D or 3D is needed in order to improve the analysis accuracy of the interior ballistics. The cut cell method has been imposed for the code expansion to multi dimensions. The MUSCL-Hancock scheme as a high resolution method has been selected. A feasibility of the cut cell method has been verified by analyzing the free piston problem.

• International Journal of Precision Engineering and Manufacturing
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• v.6 no.4
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• pp.14-20
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• 2005

In this paper, a new field of metrology called 'precision nanometrology' is presented. The 'precision nanometrology' is the result of evolutions of the traditional 'precision metrology' and the new 'nanometrology'. 'Precision nanometrology' is defined here as the science of dimensional measurement and motion measurement with 100 nm to 0.1 nm resolution/uncertainty within a range of micrometer to meter. The definition is based on the fact that nanometrology in nanoengineering and the precision industries, such as semiconductor industry, precision machine tool industry, precision instrument industry, is not only concerned with the measurement resolution and/or uncertainty but also the range of measurement. It should also be pointed out that most of the measurement objects in nanoengineering have dimensions larger than 1 micrometer. After explaining the definition of precision nanometrology, the paper provides several examples showing the critical roles of precision nanometrology in precision nanosystems, including nanometrology system, nanofabrication system, and nanomechatronics system.