• 제목/요약/키워드: reliability dependent on time

검색결과 170건 처리시간 0.021초

Copula-ARMA Model for Multivariate Wind Speed and Its Applications in Reliability Assessment of Generating Systems

  • Li, Yudun;Xie, Kaigui;Hu, Bo
    • Journal of Electrical Engineering and Technology
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    • 제8권3호
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    • pp.421-427
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    • 2013
  • The dependence between wind speeds in multiple wind sites has a considerable impact on the reliability of power systems containing wind energy. This paper presents a new method to generate dependent wind speed time series (WSTS) based on copulas theory. The basic feature of the method lies in separating multivariate WSTS into dependence structure and univariate time series. The dependence structure is modeled through the use of copulas, which, unlike the cross-correlation matrix, give a complete description of the joint distribution. An autoregressive moving average (ARMA) model is applied to represent univariate time series of wind speed. The proposed model is illustrated using wind data from two sites in Canada. The IEEE Reliability Test System (IEEE-RTS) is used to examine the proposed model and the impact of wind speed dependence between different wind regimes on the generation system reliability. The results confirm that the wind speed dependence has a negative effect on the generation system reliability.

철도차량 접촉기의 신뢰성 분석 및 교환주기 결정에 대한 연구 (A Study on Reliability Analysis & Determination of Replacement Cycle of the Railway Vehicle Contactor)

  • 박민흥;이세헌
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제17권4호
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    • pp.316-324
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    • 2017
  • Purpose: The purpose of this study is to determine the replacement cycle applied age replacement policy by reliability analysis based on railway vehicle contactor's failure history data. Method: We performed reliability analysis based on railway vehicle contactor's failure history data. We found a suitable distribution by goodness of fit test and predicted the reliability through estimation of scale & shape parameter. Considering cost information we determined the replacement cycle that minimize the opportunity cost. Result: Suitable distribution was the Weibull and scale parameter & shape parameter are estimated by reliability analysis. The replacement cycle was predicted and MTTF, $B_6$ percentile life were suggested additionally. Conclusion: We confirmed that failure rate type of railway vehicle contactor is degradation model having a time dependent characteristic and examined the replacement cycle in our country's operating environment. We expect that this study result contribute to railway operation agency for maintenance policy decision.

Optimal replacement strategy under repair warranty with age-dependent minimal repair cost

  • Jung, K.M.
    • International Journal of Reliability and Applications
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    • 제12권2호
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    • pp.117-122
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    • 2011
  • In this paper, we suggest the optimal replacement policy following the expiration of repair warranty when the cost of minimal repair depends on the age of system. To do so, we first explain the replacement model under repair warranty. And then the optimal replacement policy following the expiration of repair warranty is discussed from the user's point of view. The criterion used to determine the optimality of the replacement model is the expected cost rate per unit time, which is obtained from the expected cycle length and the expected total cost for our replacement model. The numerical examples are given for illustrative purpose.

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과도상태 시뮬레이션을 사용한 OLED 픽셀 회로의 신뢰성 분석 방안 연구 (Study on the Reliability of an OLED Pixel Circuit Using Transient Simulation)

  • 정태호
    • 반도체디스플레이기술학회지
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    • 제20권4호
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    • pp.141-145
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    • 2021
  • The brightness of the Organic Light Emitting Diode (OLED) display is controlled by thin-film transistors (TFTs). Regardless of the materials and the structures of TFTs, an OLED suffers from the instable threshold voltage (Vth) of a TFT during operation. When designing an OLED pixel with circuit simulation tool such as SPICE, a designer needs to take Vth shift into account to improve the reliability of the circuit and various compensation methods have been proposed. In this paper, the effect of the compensation circuits from two typical OLED pixel circuits proposed in the literature are studied by the transient simulation with a SPICE tool in which the stretched-exponential time dependent Vth shift function is implemented. The simulation results show that the compensation circuits improve the reliability at the beginning of each frame, but Vth shifts from all TFTs in a pixel need to be considered to improve long-time reliability.

SUS 304鋼 의 크리이프 溫度領域 에 관한 時間依存型 및 사이클依存型 疲勞크랙 傳播 의 遷移 (Transition from Cycle-Dependent to Time-Dependent Fatigue Crack Propagation at Creep Temperature of SUS 304 Steel)

  • 유헌일;주원식
    • 대한기계학회논문집
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    • 제9권5호
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    • pp.539-547
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    • 1985
  • 본 논문에서는 이상과 같은 연구현상을 배경으로 응력비 R.geq.0인 사인응력파 에서도 사이클의존형 크랙전파가 공존하는가, 공존한다면 그 전이를 결정짓는 조건을 구하기 위해, 대표적인 고온용 재료인 SUS 304강을 이용하여 온도 650.deg. C, 대기중에서 반복속도 .nu., 응력비 R, 응력레벨 .sigma.$_{maxo}$등의 실험조건을 바꾸어 고온저사이클 피로실험을 하였다. 또 이 현상의 기초과정을 이해하는데 도움을 주기 위하여 파면 관찰을 행하였다.

텅스텐 폴리사이드를 이용한 게이트 산화막의 절연특성 개선에 관한연구 (A study on the dielectric characteristics improvement of gate oxide using tungsten policide)

  • 엄금용;오환술
    • 전자공학회논문지D
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    • 제34D권6호
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    • pp.43-49
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    • 1997
  • Tungsten poycide has studied gate oxide reliability and dielectric strength charactristics as the composition of gate electrode which applied submicron on CMOS and MOS device for optimizing gate electrode resistivity. The gate oxide reliability has been tested using the TDDB(time dependent dielectric breakdwon) and SCTDDB (stepped current TDDB) and corelation between polysilicon and WSi$_{2}$ layer. iN the case of high intrinsic reliability and good breakdown chracteristics on polysilicon, confirmed that tungsten polycide layer is a better reliabilify properities than polysilicon layer. Also, hole trap is detected on the polysilicon structure meanwhile electron trap is detected on polycide structure. In the case of electron trap, the WSi$_{2}$ layer is larger interface trap genration than polysilicon on large POCL$_{3}$ doping time and high POCL$_{3}$ doping temperature condition. WSi$_{2}$ layer's leakage current is less than 1 order and dielectric strength is a larger than 2MV/cm.

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동적시스템의 신뢰도 평가를 위한 베이지안망의 적용 (An Application of Bayesian Network for Dynamic System Reliability Assessment)

  • 안선응;구정모
    • 산업경영시스템학회지
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    • 제27권2호
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    • pp.93-101
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    • 2004
  • This paper is intended to assess a dynamic system reliability. Bayesian networks, however, have difficulties in their application for assessing the system reliability especially when the system consists of dependent components and the probability of failure of each component varies over time. Hence, we suggest a method for resolving the difficulties by considering a hoist system composed of two wires. Firstly, we explain the method of calculating the failure probability of the system components. Secondly, we show how to calculate the failure probability of the system for two cases that failure probability of each wire is constant and varying in time, respectively. finally, based on the calculated failure probability of the system, we infer the probability that two interesting events occur.

Effect of cover cracking on reliability of corroded reinforced concrete structures

  • Chen, Hua-Peng;Nepal, Jaya
    • Computers and Concrete
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    • 제20권5호
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    • pp.511-519
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    • 2017
  • The reliability of reinforced concrete structures is frequently compromised by the deterioration caused by reinforcement corrosion. Evaluating the effect caused by reinforcement corrosion on structural behaviour of corrosion damaged concrete structures is essential for effective and reliable infrastructure management. In lifecycle management of corrosion affected reinforced concrete structures, it is difficult to correctly assess the lifecycle performance due to the uncertainties associated with structural resistance deterioration. This paper presents a stochastic deterioration modelling approach to evaluate the performance deterioration of corroded concrete structures during their service life. The flexural strength deterioration is analytically predicted on the basis of bond strength evolution caused by reinforcement corrosion, which is examined by the experimental and field data available. An assessment criterion is defined to evaluate the flexural strength deterioration for the time-dependent reliability analysis. The results from the worked examples show that the proposed approach is capable of evaluating the structural reliability of corrosion damaged concrete structures.

Dielectric Characteristics of Magnetic Tunnel Junction

  • Kim, Hong-Seog
    • 공학논문집
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    • 제6권2호
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    • pp.33-38
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    • 2004
  • To investigate the reliability of the MTJs on the roughness of insulating tunnel barrier, we prepared two MTJs with the different uniformity of barrier thickness. Namely, the one has uniform insulating barrier thickness; the other has non-uniform insulating barrier thickness as compared to different thing. As to depositing amorphous layer CoZrNb under the pinning layer IrMn, we achieved MTJ with uniform barrier thickness. Toinvestigate the reliability of the MTJs dependent on the bottom electrode, time-dependent dielectric breakdown (TDDB) measurements were carried out under constant voltage stress. The Weibull fit of out data shows clearly that $t_{BD}$ scales with the thickness uniformity of MTJs tunnel barrier. Assuming a linear dependence of log($t_{BD}$) on stress voltages, we obtained the lifetime of $10^4$years at a operating voltage of 0.4 V at MTJs comprising CoNbZr layers. This study shows that the reliabilityof new MTJs structure was improved due to the ultra smooth barrier, because the surface roughness of the bottom electrode influenced the uniformity of tunnel barrier.

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무전극형광램프의 고온 신뢰성 연구 (High Temperature Reliability Study of Low Frequency In-door Electrodeless Lamp)

  • 정의효;형재필;임성용;임홍우;장중순
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제14권3호
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    • pp.203-207
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    • 2014
  • Electrodeless lamp is famous for its long life. But its reliability is dependent not only on electrodes but also on materials and structures. To evaluate end product's reliability, we studied high temperature durability by $60^{\circ}C$, $75^{\circ}C$ and $90^{\circ}C$ temperature tests, and predicted failure times by an exponential model through regression analysis. However, the test showed that temperature does not affect degradation of electrodeless lamps. Their luminous outputs degrade during the early time of the test (till 250 hours) and then converge to a saturation points. Also, '410nm ~ 530nm' spectrum degrades more than other spectra.