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High Temperature Reliability Study of Low Frequency In-door Electrodeless Lamp  

Jeong, Ui-Hyo (Korea Testing Certification)
Hyung, Jae-Phil (Korea Testing Certification)
Lim, Seong-Yong (Korea Testing Certification)
Lim, Hong-Woo (Korea Testing Certification)
Jang, Joong-Soon (Graduate school of Ajou University)
Publication Information
Journal of Applied Reliability / v.14, no.3, 2014 , pp. 203-207 More about this Journal
Abstract
Electrodeless lamp is famous for its long life. But its reliability is dependent not only on electrodes but also on materials and structures. To evaluate end product's reliability, we studied high temperature durability by $60^{\circ}C$, $75^{\circ}C$ and $90^{\circ}C$ temperature tests, and predicted failure times by an exponential model through regression analysis. However, the test showed that temperature does not affect degradation of electrodeless lamps. Their luminous outputs degrade during the early time of the test (till 250 hours) and then converge to a saturation points. Also, '410nm ~ 530nm' spectrum degrades more than other spectra.
Keywords
Electrodeless Lamp; Accelerated Life Test; Weibull Distribution; Fluorescent Lamp;
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