• Journal of the Optical Society of Korea
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• 제19권6호
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• pp.687-694
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• 2015

A photoluminescence (PL) imaging method using a vision camera was employed to inspect InGaN/GaN quantum-well light-emitting diode (LED) epi-wafers. The PL image revealed dark spot defective regions (DSDRs) as well as a spatial map of integrated PL intensity of the epi-wafer. The Shockley-Read-Hall (SRH) nonradiative recombination coefficient increased with the size of the DSDRs. The high nonradiative recombination rates of the DSDRs resulted in degradation of the optical properties of the LED chips fabricated at the defective regions. Abnormal current-voltage characteristics with large forward leakages were also observed for LED chips with DSDRs, which could be due to parallel resistances bypassing the junction and/or tunneling through defects in the active region. It was found that the SRH nonradiative recombination process was dominant in the voltage range where the forward leakage by tunneling was observed. The results indicated that the DSDRs observed by PL imaging of LED epi-wafers were high density SRH nonradiative recombination centers which could affect the optical and electrical properties of the LED chips, and PL imaging can be an inspection method for evaluation of the epi-wafers and estimation of properties of the LED chips before fabrication.

• 한국정보통신학회논문지
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• 제14권7호
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• pp.1647-1652
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• 2010

CdTe 및 Cu(In,Ga)$Se_2$ 박막 태양전지의 창층으로 널리 이용되는 CdS에서 Cd의 일부를 Zn으로 치환하면 두 물질 사이의 전자 친화력의 정합이 향상되고 에너지 밴드 갭이 증가하여 개방전압 및 광전류를 증가시킬 수 있다. 본 연구에서는 태양전지와 같은 광전소자에 적용되는 CdZnS와 CdTe로 구성되는 이종접합 소자를 제작하고 접합에서의 전류 전도기구를 조사하기 위해 온도에 따른 전류-전압 특성을 분석하였다. CdS/CdTe 접합의 전류 흐름은 계면 재결합과 터널링의 조합에 의해 조절되지만 CdZnS/CdTe 접합의 경우 상온 이상의 온도에서는 공핍층에서의 생성/재결합, 상온 이하의 온도에서는 누설 전류나 터널링에 의해 전류 흐름이 제한됨을 알 수 있었다.

• Current Photovoltaic Research
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• 제2권2호
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• pp.69-72
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• 2014

We investigated current-voltage (I-V) and capacitance (C)-V characteristics of solution-processed thin film solar cells, consisting of $Cu(In,Ga)S_2$ and $CuInS_2$ stacked absorber layers. The ideality factors, extracted from the temperature-dependent I-V curves, showed that the tunneling-mediated interface recombination was dominant in the cells. Rapid increase of both series- and shunt-resistance at low temperatures would limit the performance of the cells, requiring further optimization. The C-V data revealed that the carrier concentration of the $CuInS_2$ layer was about 10 times larger than that of the $Cu(In,Ga)S_2$ layer. All these results could help us to find strategies to improve the efficiency of the solution-processed thin film solar cells.

• 대한방사선방어학회:학술대회논문집
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• 대한방사선방어학회 2009년도 춘계 학술발표
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• pp.114-115
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• 2009

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• Journal of Information Display
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• 제8권3호
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• pp.11-16
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• 2007

Theoretical simulations of spatial distribution of charge carriers and recombination rate, and J-V characteristics of the multi-layer organic light emitting diodes are carried out. Drift-diffusion current transport, field-dependent carrier mobility, exponential and Gaussian trap distribution, and Langevin recombination models are included in this computer model. The simulated results show good agreement with the experimental data confirming the validity of the physical models for organic light emitting diodes.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1996년도 추계학술대회 논문집
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• pp.10-12
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• 1996

AlGaAs/GaAs Heterojunotion Bipolar Transistors (HBTs) with various emitter areas were fabricated and the device size dependence on the current gain was examined. With the different emitter areas, the passivated devices having the same peripheral length were fabricated and measured. The measured base current density in the Gummel plots shows an ideality factor of nearly 2. It is found that as the emitter area becomes small, the base current density with the ideality factor of 2 increases linearly, and as the emitter perimeter/area ratio becomes large, the surface recombination current density component increases. The current gain performance in AlGaAs/GaAs HBTs is mainly determined by either the larger emitter area or the smaller ratio of the emitter perimeter to the emitter area. These results will be compared with experimental works for GaInP/GaAs HBTs

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
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• pp.633-634
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• 2005

Transparent conducting glasses exhibit high ohmic losses that are apparent in the case of large size Dye Sensitized Solar Cells (DSSCs). In this study, we investigated the impact of current collectors over the efficiency of DSSCs. The Silver current collectors were prepared on both counter electrode and working electrode surface by screen printing method. For long term stability in electrolyte environment and also to avoid the charge recombination, current collectors are protected by sodium silicate overcoat layer. These current collectors were characterized for their microstructure parameters. Also current collector's stability in electrolyte environment has been investigated.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2012년도 제43회 하계 정기 학술대회 초록집
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• pp.172-173
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• 2012

Currently GaN based LED is known to show high internal or external efficiency at low current range. However, this LED operation occurs at high current range and in this range, a significant performance degradation known as 'efficiency droop' occurs. Auger process, carrier leakage process, field effect due to lattice mismatch and thermal effects have been discussed as the causes of loss of efficiency, and these phenomena are major hindrance in LED performance. In order to investigate the main effects of efficiency loss and overcome such effects, it is essential to obtain relative proportion of measurements of internal quantum efficiency (IQE) and various radiative and nonradiative recombination processes. Also, it is very important to obtain radiative and non-radiative recombination times in LEDs. In this research, we measured the IQE of InGaN/GaN multiple quantum wells (MQWs) LEDs with PSS and Planar substrate using modified ABC equation, and investigated the physical mechanism behind by analyzing the emission energy, full-width half maximum (FWHM) of the emission spectra, and carrier recombination dynamic by time-resolved electroluminescence (TREL) measurement using pulse current generator. The LED layer structures were grown on a c-plane sapphire substrate and the active region consists of five 30 ${\AA}$ thick In0.15Ga0.85N QWs. The dimension of the fabricated LED chip was $800um{\times}300um$. Fig. 1. is shown external quantum efficiency (EQE) of both samples. Peak efficiency of LED with PSS is 92% and peak efficiency of LED with planar substrate is 82%. We also confirm that droop of PSS sample is slightly larger than planar substrate sample. Fig. 2 is shown that analysis of relation between IQE and decay time with increasing current using TREL method.

• 반도체디스플레이기술학회지
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• 제18권4호
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• pp.120-123
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• 2019

The effect of surface plasmon on ZTO thin films was investigated. The phenomenon of depletion occurring in the interface of the ZTO thin film created a potential barrier and the dielectric layer of the depletion formed a non-mass particle called plasmon. ZTO thin film represents n-type semiconductor features, and surface current by plasma has been able to obtain the effect of improving electrical efficiency as a result of high current at positive voltage and low current at negative voltage. It can be seen that the reduction of electric charge due to recombination of electronic hole pairs by heat treatment of compound semiconductors induces higher surface current in semiconductor devices.

• 전기전자학회논문지
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• 제25권4호
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• pp.735-740
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• 2021

본 논문에서는 기존의 LTDDSCR의 구조를 개선하여 기생 NPN BJT의 낮은 전류이득으로 높은 홀딩전압을 갖는 새로운 ESD 보호 소자를 제안한다. 제안된 보호 소자는 Synopsys사의 TCAD simulation을 이용하여 HBM simulation으로 전기적 특성을 분석하였고 current flow와 impact ionization 및 recombination Simulation으로 추가된 BJT가 동작하는 것을 확인하였다. 또한, 설계변수 D1, D2로 홀딩전압 특성을 최적화하였다. Simulation 수행결과, 새로운 ESD 보호 소자는 기존의 LTDDSCR과 비교하여 높은 홀딩전압을 갖는 것이 검증되었고 대칭적인 양방향 특성을 갖는 것이 확인되었다. 따라서 제안된 ESD 보호 소자는 IC에 적용될시 높은 면적 효율성을 가지며 IC의 신뢰성을 향상시킬 것으로 기대된다.