Properties of Defective Regions Observed by Photoluminescence Imaging for GaN-Based Light-Emitting Diode Epi-Wafers |
Kim, Jongseok
(Smart Manufacturing Technology Group, Korea Institute of Industrial Technology)
Kim, HyungTae (Smart Manufacturing Technology Group, Korea Institute of Industrial Technology) Kim, Seungtaek (Smart Manufacturing Technology Group, Korea Institute of Industrial Technology) Jeong, Hoon (Smart Manufacturing Technology Group, Korea Institute of Industrial Technology) Cho, In-Sung (Soft-Epi) Noh, Min Soo (Soft-Epi) Jung, Hyundon (Etamax) Jin, Kyung Chan (Smart Manufacturing Technology Group, Korea Institute of Industrial Technology) |
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