• 제목/요약/키워드: polycrystalline 3C-SiC

검색결과 159건 처리시간 0.03초

GaOOH 선구체의 스핀코팅에 의한 GaN 박막의 성장 (Growth of GaN Thin-Film from Spin Coated GaOOH Precursor)

  • 이재범;김선태
    • 한국재료학회지
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    • 제17권1호
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    • pp.1-5
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    • 2007
  • GaN thin fan were grown by spin coated colloidal GaOOH precursor. Polycrystalline GaNs with crystalline size of $10{\sim}100nm$ were grown on $SiO_2$ substrate. The shape of crystallite above $900^{\circ}C$ had the hexagonal plate and column type. X-ray diffraction patterns for them correspond to those of the hexagonal wurtzite GaN. With increasing droplets. i.e, thickness of deposited layers, XRD intensity increased. PL (photoluminescence) spectrum consisted with an weak near band-edge emission at 3.45 eV and a broad donor-acceptor emission band at 3.32 eV. From the low temperature PL measurement on GaN grown at $800^{\circ}C$ that the shallow donor-acceptor recombination induced emission was more intense than the near band-edge excitonic emission.

단결정과 비정질 Si 기판에서 Co/Zr 이중층을 이용한 $CoSi_{2}$ 형성 (Formation of the $CoSi_{2}$ using Co/Zr Bilayer on the Amorphous and the Single Crystalline Si Substrates)

  • 김동욱;전형탁
    • 한국재료학회지
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    • 제8권7호
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    • pp.621-627
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    • 1998
  • 단결정 Si(100) 기판과 비정질 Si 기판위에 Co/Zr 이중층을 이용하여 형성시킨 Co 실리사이드의 성장 거동에 대하여 연구하였다. 전자빔 증착기를 사용하여 단결정과 비정질 Si 기판위에 Zr $50\AA$과 Co $100\AA$을 차례로 증착한 박막을 50$0^{\circ}C$부터 $800^{\circ}C$까지 $100^{\circ}C$ 간격으로 질소 분위기에서 30초 동안 급속열처리를 하여 Co 실리사이드를 형성시켰다. 각 온도에서 열처리된 시편의 상형성, 화학적 조성, 계면의 형상, 전기적 특성을 XRD, AES, RBS, TEM, HRTEM 등으로 분석하였다. 분석 결과 $CoSi_2$ 상이 단결정 기판에서는 $700^{\circ}C$ 이상에서 기판과 정합성장을 하였고 비정질 기판에서는 다결정 성장을 하였으며 Co 실리사이드의 상형성 온도는 단결정 기판에서보다 비정질 기판에서 $100^{\circ}C$정도 낮아졌다. $CoSi_2$와 같은 Co rich 중간상은 두 기판 모두 형성되지 않았으며 초기 Co 실리사이드의 상형성 온도는 Co 단일층으로 상을 형성시킬 때 보다 더 높았다. Co 실리사이드와 Si 기판의 계면의 형상은 단결정 기판의 경우보다 비정질 기판에서 더 균질하였다. 박막의 면저항은 $600^{\circ}C$이하의 열처리 온도에서는 비정질 기판에서 형성된 Co 실리사이드 박막이 더 낮은 값을 나타내었고 그 이상의 열처리 온도에서는 단결정 기판에서 형성된 박막의 면저항값이 더 낮은 값을 나타내었으며 두가지 기판에서 형성된 박막 모두$ 800^{\circ}C$에서 가장 낮은 면저항 값을 보였다.TEX>$10^{-8}$ A/$\textrm{cm}^2$로 양질의 SrTiO$_3$박막을 제조하였다.는 과정에서 전세계 수준에서 멸종위기 식물을 목록화가 필요하다. 특히, 목록 작업이 완성되면 해당 분류군에 대한 기본적인 자료 수집과 장단기 조사과정으로서, 해당 분류군에 대한 멸종위협 요인을 수집하고, 이 자료를 근간으로 정량적으로 IUCN 적색목록 평가방식이 추진할 필요가 있다.he oscillations are active in the derived unit hydrograph. 3)The parameter estimates are validated by extending the model to the Soyang river Dam site with elimination of the autocorrelation in the disturbances. Finally, this paper illustrates the application of the multiple regression model to drive an optimal unit hydrograph dealing with the multicollinearity and the autocorrelation which cause some problems. 우선적으로 고려하여 사용할 농약을 선택해야 할 것으로 보이나, 그 외 약제의 잔류성, 사용량, 사용시기와 함께 기후조건, 토양의 투수성, 토층이 깊이, 지하수 깊이 등의 지역적인 특성들이 농약의 용탈잠재성에 미치는 영향도 더욱 구체적으로 파악되어야 할 것이며 농약의 선택 과정에서도 이러한 특성들이 앞으로 고려되어야 할 것이다.calenol 및 citrostadienol 등이 함유(含有)되어 있었다. 6. 4-desmethylsterol fraction에 는 sitosterol (74.6%)이

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화학 용액 증착법으로 얻어진 $Bi_{4-x}Pr_{0.7}Ti_3O_{12}$ 박막의 강유전성과 미세구조에 관한 연구 (Ferroelectric Properties and Microstructure of Pr-Substituted Bismuth Titanate Prepared by Chemical Solution Deposition)

  • 강동균
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2006년도 하계학술대회 논문집 Vol.7
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    • pp.290-291
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    • 2006
  • The effect of praseodymium substitution on the ferroelectric properties of $Bi_4Ti_3O_{12}$ thin films have been investigated. Ferroelectric Pr-substituted $Bi_4Ti_3O_{12}$ thin films were fabricated by chemical solution deposition onto Pt/Ti/$SiO_2$/Si substrates. The structure and morphology of the films were analyzed using Xray diffraction, and scanning electron microscopy, respectively. About 200-nm-thick BPT films grown at $720^{\circ}C$ exhibited a polycrystalline structure and showed excellent ferroelectric properties with a remanent polarization ($2P_r$) of $28.21\;{\mu}C/cm^2$ at an applied voltage of 5 V. The films a1so demonstrate fatigue-free behavior up to $10^{11}$ read/write switching cycles with 1 MHz bipolar pulses at an electric field of ${\pm}5\;V$.

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Chemical Vapor Deposition of β-LiGaO2 Films on Si(100) Using a Novel Single Precursor

  • Sung, Myung M.;Kim, Chang G.;Kim, Yun-Soo
    • Bulletin of the Korean Chemical Society
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    • 제25권4호
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    • pp.480-484
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    • 2004
  • $LiGaO_2$ films have been grown on Si (100) substrates using a new single precursor $[Li(OCH_2CH_2OCH_3)_2-Ga(CH_3)_2]_2$ under high vacuum conditions $(5{\times}10^{-6}Torr)$. The $[Li(OCH_2CH_2OCH_3)_2Ga(CH_3)_2]_2$ was synthe-sized and characterized by using spectroscopic methods and single-crystal X-ray diffraction analysis. The chemical composition, crystalline structure, and morphology of the deposited films were investigated by X-ray photoelectron spectroscopy, X-ray diffraction, and scanning electron microscopy. The results show that polycrystalline $LiGaO_2$ films preferentially oriented in the [010] direction can be deposited on Si (100) at 500-550$^{\circ}C$ by metal organic chemical vapor deposition (MOCVD). The single precursor $[LiOCH_2CH_2OCH_3)_2-Ga(CH_3)_2]_2$ has been found suitable for chemical vapor deposition of $LiGaO_2$ thin films on Si substrates.

열화학기상증착법을 이용한 CsPbBr3 박막 성장 및 특성 연구 (A Growth and Characterization of CsPbBr3 Thin Film Grown by Thermal Chemical Vapor Deposition)

  • 김가은;김민진;류혜수;이상현
    • 마이크로전자및패키징학회지
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    • 제30권2호
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    • pp.71-75
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    • 2023
  • 본 연구에서는 열화학기상증착법을 이용한 세슘계 무기 페로브스카이트의 성장기판에 따른 결정 구조의 변화 및 광학적 특성을 비교 분석하였다. 무기 페로브스카이트 결정은 CsBr과 PbBr2를 전구체로 사용하여 SiO2/Si와 c-Al2O3 기판 위에 동일한 조건으로 CsPbBr3를 성장하였다. 비정질 구조를 가진 SiO2 표면에서는 Cs4PbBr6-CsPbBr3 혼합상의 결정 입자가 성장하였으며, 단결정 구조인 c-Al2O3 기판에서는 CsPbBr3 (100) 결정 면방향이 우세한 단일상의 박막이 형성되었다. 광학적 분석 결과 CsPbBr3는 약 91 meV의 반치폭을 갖고 약 534 nm 중심의 발광특성을 보였으며, Cs4PbBr6-CsPbBr3 혼합구조에서는 청색 변이에 의해 523 nm의 발광 및 6.88 ns의 빠른 광 소결시간을 확인하였다. 열화학기상증착법을 이용한 페로브스카이트의 결정구조의 제어 및 광특성의 변화는 디스플레이, 태양 전지, 광센서 등 다양한 광전 소자에 적용할 수 있을 것으로 기대된다.

NiO를 첨가한 WO3 박막의 미세 구조 거동 (The behavior of WO3 Thin Film on NiO Addition)

  • 김광호;나동명;최광표;박진성
    • 한국재료학회지
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    • 제15권7호
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    • pp.486-490
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    • 2005
  • Thin films of tungsten oxide and nickel oxide were deposited on $Al_2O_3/Si-substrate$ by high vacuum thermal evaporation. The properties of microstructure and crystallinity were analyzed by SEM and XRD respectively. $WO_3$ films without addition of NiO showed polycrystalline structure after annealing at $500^{\circ}C$ for SO min. There were the cracks between the polycrystalline grains and the crack width was increased with the thickness of $WO_3$ films. The cracks in the $WO_3$ films could be controlled by an optimum deposition of NiO on $WO_3$ films and either less or more than the optimum addition fails to suppress the cracks. A process mechanism to suppress the crack has been discussed.

PEMOCVD of Ti(C,N) Thin Films on D2 Steel and Si(100) Substrates at Low Growth Temperatures

  • Kim, Myung-Chan;Heo, Cheol-Ho;Boo, Jin-Hyo;Cho,Yong-Ki;Han, Jeon-Geon
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 1999년도 제17회 학술발표회 논문개요집
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    • pp.211-211
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    • 1999
  • Titanium nitride (TiN) thin films have useful properties including high hardness, good electrical conductivity, high melting point, and chemical inertness. The applications have included wear-resistant hard coatings on machine tools and bearings, decorative coating making use of the golden color, thermal control coatings for widows, and erosion resistant coatings for spacecraft plasma probes. For all these applications as feature sizes shrink and aspect ratios grow, the issue of good step coverage becomes increasingly important. It is therefore essential to manufacture conformal coatings of TiN. The growth of TiN thin films by chemical vapor deposition (CVD) is of great interest for achieving conformal deposition. The most widely used precursor for TiN is TiCl4 and NH3. However, chlorine impurity in the as-grown films and relatively high deposition temperature (>$600^{\circ}C$) are considered major drawbacks from actual device fabrication. To overcome these problems, recently, MOCVD processes including plasma assisted have been suggested. In this study, therefore, we have doposited Ti(C, N) thin films on Si(100) and D2 steel substrates in the temperature range of 150-30$0^{\circ}C$ using tetrakis diethylamido titanium (TDEAT) and titanium isopropoxide (TIP) by pulsed DC plamsa enhanced metal-organic chemical vapor deposition (PEMOCVD) method. Polycrystalline Ti(C, N) thin films were successfully grown on either D2 steel or Si(100) surfaces at temperature as low as 15$0^{\circ}C$. Compositions of the as-grown films were determined with XPS and RBS. From XPS analysis, thin films of Ti(C, N) with low oxygen concentration were obtained. RBS data were also confirmed the changes of stoichiometry and microhardness of our films. Radical formation and ionization behaviors in plasma are analyzed by optical emission spectroscopy (OES) at various pulsed bias and gases conditions. H2 and He+H2 gases are used as carrier gases to compare plasma parameter and the effect of N2 and NH3 gases as reactive gas is also evaluated in reduction of C content of the films. In this study, we fond that He and H2 mixture gas is very effective in enhancing ionization of radicals, especially N resulting is high hardness. The higher hardness of film is obtained to be ca. 1700 HK 0.01 but it depends on gas species and bias voltage. The proper process is evident for H and N2 gas atmosphere and bias voltage of 600V. However, NH3 gas highly reduces formation of CN radical, thereby decreasing C content of Ti(C, N) thin films in a great deal. Compared to PVD TiN films, the Ti(C, N) film grown by PEMOCVD has very good conformability; the step coverage exceeds 85% with an aspect ratio of more than 3.

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짐바브웨산 블랙다이아몬드 원석의 보석학적 감별연구 (Gemological Identification of Black Diamonds Roughs from Zimbabwe)

  • 송오성;김준환;김기훈
    • 한국산학기술학회논문지
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    • 제10권11호
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    • pp.3054-3059
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    • 2009
  • 블랙다이아몬드는 단결정형, 다결정형, 혼합형 등의 결정질을 가지고 산업용, 보석용으로 활용도가 높다. 3ct~30ct급의 짐바브웨에서 산출된 천연 블랙 다이아몬드 러프(roughs)를 이용하여 통상적인 감별법인 열전도, 밀도검사, 스크래치검사, 확대검사와 첨단 감정 방안인 라만스펙트럼과 XRD회절 및 Lang이미지 분석을 실시하였다. 통상적인 감별방안으로는 신속성과 경제성을 고려하면 SiC스크래치검사와 확대검사를 혼합하는 방안이 유리하였다. 첨단 감정 방안으로는 라만분석으로는 블랙다이아몬드의 감별이 용이하였으나, 블랙다이아몬드 러프는 단결정과 다결정의 경우가 많아서 XRD 회절 방법으로 원석의 결정성 판단이 어려울 수 있었다. 그러나 일단 확인된 회절조건에서는 손쉽게 결정립을 Lang이미지분석을 통하여 원석의 결정상태의 시각화가 가능하였다.

다결정 Ge1-xMnx 박막에서 Ge3Mn5 상의 형성과 특성 (Formation of Ferromagnetic Ge3Mn5 Phase in MBE-grown Polycrystalline Ge1-xMnx Thin Films)

  • 임형규;찬티난안;유상수;백귀종;임영언;김도진;김효진;김창수
    • 한국자기학회지
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    • 제19권3호
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    • pp.85-88
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    • 2009
  • 다결정 $Ge_{1-x}Mn_x$ 박막의 자기적 상들에 관한 연구가 이루어졌다. Molecular beam epitaxy(MBE) 장비를 이용해 $400^{\circ}C$ 에서 $Ge_{1-x}Mn_x$ 박막을 성장시켰다. $Ge_{1-x}Mn_x$ 박막의 캐리어 유형은 P타입 이였고, 전기 비저항 값은 $4.0{\times}10^{-2}{\sim}1.5{\times}10^{-4}ohm-cm$이었다. 자기적인 특성과 미세구조의 분석에 기초하여 $Ge_{1-x}Mn_x/SiO_2$/Si(100) 박막에 310 K 이내의 큐리에온도를 지닌 강자성의 $Ge_3Mn_5$ 상이 형성되었음을 알 수 있었다. 게다가, $Ge_3Mn_5$ 상이 형성된 $Ge_{1-x}Mn_x$ 박막은 20 K, 9 T의 자기장에서 약 9%의 음의 자기저항을 보였다.

$TiO_2$ Thin Film Patterning on Modified Silicon Surfaces by MOCVD and Microcontact Printing Method

  • 강병창;이종현;정덕영;이순보;부진효
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2000년도 제18회 학술발표회 논문개요집
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    • pp.77-77
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    • 2000
  • Titanium oxide (TiO2) thin films have valuable properties such as a high refractive index, excellent transmittance in the visible and near-IR frequency, and high chemical stability. Therefore it is extensively used in anti-reflection coating, sensor, and photocatalysis as electrical and optical applications. Specially, TiO2 have a high dielectric constant of 180 along the c axis and 90 along the a axis, so it is highlighted in fabricating dielectric capacitors in micro electronic devices. A variety of methods have been used to produce patterned self-assembled monolayers (SAMs), including microcontact printing ($\mu$CP), UV-photolithotgraphy, e-beam lithography, scanned-probe based micro-machining, and atom-lithography. Above all, thin film fabrication on $\mu$CP modified surface is a potentially low-cost, high-throughput method, because it does not require expensive photolithographic equipment, and it produce micrometer scale patterns in thin film materials. The patterned SAMs were used as thin resists, to transfer patterns onto thin films either by chemical etching or by selective deposition. In this study, we deposited TiO2 thin films on Si (1000 substrateds using titanium (IV) isopropoxide ([Ti(O(C3H7)4)] ; TIP as a single molecular precursor at deposition temperature in the range of 300-$700^{\circ}C$ without any carrier and bubbler gas. Crack-free, highly oriented TiO2 polycrystalline thin films with anatase phase and stoichimetric ratio of Ti and O were successfully deposited on Si(100) at temperature as low as 50$0^{\circ}C$. XRD and TED data showed that below 50$0^{\circ}C$, the TiO2 thin films were dominantly grown on Si(100) surfaces in the [211] direction, whereas with increasing the deposition temperature to $700^{\circ}C$, the main films growth direction was changed to be [200]. Two distinct growth behaviors were observed from the Arhenius plots. In addition to deposition of THe TiO2 thin films on Si(100) substrates, patterning of TiO2 thin films was also performed at grown temperature in the range of 300-50$0^{\circ}C$ by MOCVD onto the Si(100) substrates of which surface was modified by organic thin film template. The organic thin film of SAm is obtained by the $\mu$CP method. Alpha-step profile and optical microscope images showed that the boundaries between SAMs areas and selectively deposited TiO2 thin film areas are very definite and sharp. Capacitance - Voltage measurements made on TiO2 films gave a dielectric constant of 29, suggesting a possibility of electronic material applications.

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