• Title/Summary/Keyword: polycrystalline

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Creep Deformation Characteristics of Polycrystalline Ice and its Numerical Simulation in the Flow of Polar Glaciers (극지 빙하유동에 있어서 Polycrystalline Ice의 Creep 변형특성 수치 시뮬레이션)

  • 최경식
    • Journal of Korean Society of Coastal and Ocean Engineers
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    • v.2 no.2
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    • pp.59-66
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    • 1990
  • Various types of ice distribution under low temperature greatly influence the environment of the Arctic and Antarctic Oceans. To understand fundamentals of ice properties such as Polar glaciers, icebergs and sea ice, this study focuses on the material behaviors and failure mechanisms of polycrystalline ice. Utilizing the continuum damage theory, a three-dimensional constitutive model to describe creep deformation characteristics in the glacial flow is developed in consideration of micro-cracking as the major physical process of ice deformation. The numerical model is compared with the published experimental data especially in uniaxial constant stress creep tests. The model can simulate primary and secondary creeps as well as tertiary creep characteristics due to the microcrack accumulation.

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Ohmic contact characteristics of polycrystalline 3C-SiC for high-temperature MEMS applications (초고온 MEMS용 다결정 3C-SiC의 Ohmic Contact 특성)

  • Chung, Gwiy-Sang;Ohn, Chang-Min
    • Journal of Sensor Science and Technology
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    • v.15 no.6
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    • pp.386-390
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    • 2006
  • This paper describes the ohmic contact formation of polycrystalline 3C-SiC films deposited on thermally grown Si wafers. In this work, a TiW (titanium tungsten) film as a contact material was deposited by RF magnetron sputter and annealed with the vacuum process. The specific contact resistance (${\rho}_{c}$) of the TiW contact was measured by using the C-TLM (circular transmission line method). The contact phase and interfacial reaction between TiW and 3C-SiC at high-temperature as also analyzed by XRD (X-ray diffraction) and SEM (scanning electron microscope). All of the samples didn't show cracks of the TiW film and any interfacial reaction after annealing. Especially, when the sample was annealed at $800^{\circ}$ for 30 min., the lowest contact resistivity of $2.90{\times}10{\Omega}cm^{2}$ was obtained due to the improved interfacial adhesion. Therefore, the good ohmic contact of polycrystalline 3C-SiC films using the TiW film is very suitable for high-temperature MEMS applications.

Physical Characteristics of Polycrystalline 3C-SiC Thin Films Grown by LPCVD (LPCVD로 성장된 다결정 3C-SiC 박막의 물리적 특성)

  • Chung Gwiy-Sang;Kim Kang-San
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.19 no.8
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    • pp.732-736
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    • 2006
  • This paper describes the physical characterizations of polycrystalline 3C-SiC thin films heteroepitaxially grown on Si wafers with thermal oxide, In this work, the 3C-SiC film was deposited by LPCVD (low pressure chemical vapor deposition) method using single precursor 1, 3-disilabutane $(DSB:\;H_3Si-CH_2-SiH_2-CH_3)\;at\;850^{\circ}C$. The crystallinity of the 3C-SiC thin film was analyzed by XPS (X-ray photoelectron spectroscopy), XRD (X-ray diffraction) and FT-IR (fourier transform-infrared spectometers), respectively. The surface morphology was also observed by AFM (atomic force microscopy) and voids or dislocations between SiC and $SiO_2$ were measured by SEM (scanning electron microscope). Finally, residual strain was investigated by Raman scattering and a peak of the energy level was less than other type SiC films, From these results, the grown poly 3C-SiC thin film is very good crystalline quality, surface like mirror, and low defect and strain. Therefore, the polycrystalline 3C-SiC is suitable for harsh environment MEMS (Micro-Electro-Mechanical-Systems) applications.

Conversion Process of Amorphous Si-Al-C-O Fiber into Nearly Stoichiometric SiC Polycrystalline Fiber

  • Usukawa, Ryutaro;Oda, Hiroshi;Ishikawa, Toshihiro
    • Journal of the Korean Ceramic Society
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    • v.53 no.6
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    • pp.610-614
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    • 2016
  • Tyranno SA (SiC-polycrystalline fiber, Ube Industries Ltd.) shows excellent heat-resistance up to $2000^{\circ}C$ with relatively high mechanical strength. This fiber is produced by the conversion process from a raw material (amorphous Si-Al-C-O fiber) into SiC-polycrystalline fiber at very high temperatures over $1500^{\circ}C$ in argon. In this conversion process, the degradation reaction of the amorphous Si-Al-C-O fiber accompanied by a release of CO gas for obtaining a stoichiometric composition and the subsequent sintering of the degraded fiber proceed. Furthermore, vaporization of gaseous SiO, phase transformation and active diffusion of the components of the Si-Al-C-O fiber competitively occur. Of these changes, vaporization of the gaseous SiO during the conversion process results in an abnormal SiC-grain growth and also leads to the non-stoichiometric composition. However, using a modified Si-Al-C-O fiber with an oxygen-rich surface, vaporization of the gaseous SiO was effectively prevented, and then consequently a nearly stoichiometric SiC composition could be obtained.

Effects of Ozone Oxidation on the Contact Resistance of DRAM Cell (오존 산화가 DRAM 셀의 콘택 저항에 미치는 영향)

  • 최재승;이승욱;신봉조;박근형;이재봉
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.2
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    • pp.121-126
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    • 2004
  • In this paper, the effects of the ozone oxidation of the landing polycrystalline silicon on the cell contact resistance of the DRAM device were studied. For this study, the ozone oxidation of the landing polycrystalline silicon layer was performed under various conditions, which was followed by the normal DRAM processes. Then, the cell contact resistance and $t_{WR}$ (write recovery time) of the devices were measured and analyzed. The experimental results showed that the cell contact resistance was more significantly increased for higher temperature of oxidation, longer time of oxidation, and higher concentration of ozone in the oxidation furnace. In addition, the TEM cross-sectional micrographs clearly showed that the oxide layer at the interface between the landing polycrystalline silicon layer and the plug polycrystalline silicon layer was increased by the ozone oxidation. Furthermore, the rate of the device failure due to too large write recovery time was also found to be well correlated with the increase of the cell contact resistance.

Simulation by heat transfer of ADS process for large sized polycrystalline silicon ingot growth (대형 다결정 실리콘 잉곳 성장을 위한 ADS 법의 열유동에 관한 공정모사)

  • Shur, J.W.;Hwang, J.H.;Kim, Y.J.;Moon, S.J.;So, W.W.;Yoon, D.H.
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.18 no.1
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    • pp.45-49
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    • 2008
  • The development of manufacturing process of silicon (Si) ingots is one of the important issues to the growth of the photovoltaic industry. Polycrystalline Si wafers shares more than 60% of the photovoltaic market due to its cost advantage compared to mono crystalline silicon wafers. Several solidification processes have been developed by industry including casting, heat exchange method (HEM) and electromagnetic casting. In this paper, the advanced directional solidification (ADS) method is used to growth of large sized polycrystalline Si ingot. This method has the advantages of the small heat loss, short cycle time and efficient directional solidification. The numerical simulation of the process is applied using a fluid dynamics model to simulate the temperature distribution. The results of simulations are confirmed efficient directional solidification to the growth of large sized polycrystalline Si ingot above 240 kg.

Effects of Grain Size Distribution on the Mechanical Properties of Polycrystalline Graphene

  • Park, Youngho;Hyun, Sangil
    • Journal of the Korean Ceramic Society
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    • v.54 no.6
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    • pp.506-510
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    • 2017
  • One of the characteristics of polycrystalline graphene that determines its material properties is grain size. Mechanical properties such as Young's modulus, yield strain and tensile strength depend on the grain size and show a reverse Hall-Petch effect at small grain size limit for some properties under certain conditions. While there is agreement on the grain size effect for Young's modulus and yield strain, certain MD simulations have led to disagreement for tensile strength. Song et al. showed a decreasing behavior for tensile strength, that is, a pseudo Hall-Petch effect for the small grain size domain up to 5 nm. On the other hand, Sha et al. showed an increasing behavior, a reverse Hall-Petch effect, for grain size domain up to 10 nm. Mortazavi et al. also showed results similar to those of Sha et al. We suspect that the main difference of these two inconsistent results is due to the different modeling. The modeling of polycrystalline graphene with regular size and (hexagonal) shape shows the pseudo Hall-Petch effect, while the modeling with random size and shape shows the reverse Hall-Petch effect. Therefore, this study is conducted to confirm that different modeling is the main reason for the different behavior of tensile strength of the polycrystalline structures. We conducted MD simulations with models derived from the Voronoi tessellation for two types of grain size distributions. One type is grains of relatively similar sizes; the other is grains of random sizes. We found that the pseudo Hall-Petch effect and the reverse Hall-Petch effect of tensile strength were consistently shown for the two different models. We suspect that this result comes from the different crack paths, which are related to the grain patterns in the models.

The Study on the WEDM of Polycrystalline Diamond (다결정 다이아몬드의 와이어방전가공에 관한 연구)

  • Kim, Chang-Ho;Kang, Jae-Won;Oh, Jang-Uk;Seo, Jae-Bong
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.7 no.3
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    • pp.67-74
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    • 2008
  • Polycrystalline diamonds(PCD) tools are widely used in machining a large variety of advanced materials. However, the manufacture of PCD tool blanks is not an economical process. The shaping of PCD blanks with conventional machining methods(such a grinding) is long, labor-intensive process. This paper reports experimental investigation of the influence of electrical machining conditions on the metal removal rate of WEDM of PCD. Experimental results show that the longer pulse-on time and the shorter pulse-off time increase the metal removal rate and worsen the surface quality. The smaller grain size of diamond yields the metal removal rate and shows the better surface quality. Higher electrical conductivity of water yields worse surface roughness.

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Effect of Substrate Temperature on Polycrystalline Silicon Film Deposited on Al Layer (Al 박막을 이용한 다결정 Si 박막의 제조에서 기판온도 영향 연구)

  • Ahn, Kyung Min;Kang, Seung Mo;Ahn, Byung Tae
    • 한국신재생에너지학회:학술대회논문집
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    • 2010.06a
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    • pp.96.2-96.2
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    • 2010
  • The surface morphology and structural properties of polycrystalline silicon (poly-Si) films made in-situ aluminum induced crystallization at various substrate temperature (300~600) was investigated. Silicon films were deposited by hot-wire chemical vapor deposition (HWCVD), as the catalytic or pyrolytic decomposition of precursor gases SiH4 occurs only on the surface of the heated wire. Aluminum films were deposited by DC magnetron sputtering at room temperature. continuous poly-Si films were achieved at low temperature. from cross-section TEM analyses, It was confirmed that poly-Si above $450^{\circ}C$ was successfully grown on and poly-Si films had (111) preferred orientation. As substrate temperature increases, Si(111)/Si(220) ratio was decreased. The electrical properties of poly-Si film were investigated by Hall effect measurement. Poly-Si film was p-type by Al and resistivity and hall effect mobility was affected by substrate temperature.

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Effects of Texture on the Electrochemical Properties of Single Grains in Polycrystalline Zinc

  • Park, Chan-Jin;Lohrengel, Manuel M.;Hamelmann, Tobias;Pllaski, Milan;Kwon, Hyuk-Sang
    • Corrosion Science and Technology
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    • v.3 no.2
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    • pp.54-58
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    • 2004
  • Effects of texture on the electrochemical behaviors of single grains in polycrystalline zinc were investigated using a capillary-based micro-droplet cell. Pontiodynamic sweeps and capacity measurements were carried out in pH 9 borate buffer solution. The cyclic voltammograms and the capacity measurements on single grains with different crystallographic orientations in polycrystalline Zn showed a strong dependence of oxide growth on crystallographic grain orientation. The total charge consumed for oxide formation and the inverse capacity increased with an increase of surface packing density of grain. suggesting the oxide formation was greater on grains with higher surface packing density.