• Title/Summary/Keyword: photosensitivity

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Fabrication and characteristics of PbO photoconductive layer (PbO 광도전막의 제작 및 그 특성)

  • Kim, Bum-Kyu;Park, Ki-Cheol;Choi, Kyu-Man;Park, Chang-Bae;Kim, Ki-Wan
    • Proceedings of the KIEE Conference
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    • 1987.07a
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    • pp.505-508
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    • 1987
  • The structure of vacuum evaporated PbO films is investigated. Also, the Photosensitivity and dark resistivity are measured. The dominant structure and orientation of these films were red (tetragonal) form, and <110> and <101> direction under- the suitable deposition conditions. And the crystallite size of them was about $2um{\times}0.2um$. These PbO films have good photosensitivity(r=0.9) and high dark resistivity. (${\rho}=10^{14}{\Omega}{\cdot}cm$)

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Effect of Dopping Conditions on a-Se Thin-Films : Microstructural and I-V Study (비정질 박막에 대한 도핑 조건의 영향 및 미세구조와 I-V 연구)

  • 박성광;박지군;강상식;공현기;김진섭;남상희
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.11a
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    • pp.492-496
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    • 2001
  • Due to their better photosensitivity in X-ray, the amorphous selenium based photoreceptor is widely used on the X-ray conversion materials. It was possible to control the charge carrier transport of amorphous selenium by suitably alloying a-Se with other elements(e,g. As, Cl). In this paper, We investigated dopants(As, Cl) composition rate to improve dark resistivity and transport properties of charge carrier in amorphous selenium using by direct X-ray conversion material. Alloying a-Se with As inhibits the recrystallization of a-Se but introduces undesirable deep hole traps. then doping with Cl(in the ppm range) compensates for the deep hole traps. We investigated their composition rate in various doping conditions and then obtained optimum dopant composition rate. The result was Se-As 0.3%-Cl 30 ppm and X-ray Sensitivity was 0.57 pc/pixel$.$mR at 137 $\mu\textrm{m}$ x 137 $\mu\textrm{m}$ Pixel area.

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Latent Charge Erasing Technique for a-Se Digital X-ray Detector (비정질 셀레늄 디지털 X선 검출기에 대한 잔류 전하 제거 기술)

  • 강상식;최장용;박지군;조진욱;문치웅
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.11a
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    • pp.505-508
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    • 2001
  • Currently there is much interested in removing latent charge that is caused to latent image effect and blurring of obtained image as well as reduction of x-ray conversion efficiency in digital radiography system. To remove latent charge a-Se film is irradiated by light with 3500 lux using halogen lamp and optical fiber. We measured dark current and photosensitivity to analyze removing effect of latent charge, then compared with and without light erasing method. The reduction of measured signal due to latent charge effect was 32.3%, and the removal effect of latent charge by using light erase method was its 95.5%.

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Interfacial Properties of a-Se Thick Films to Solve Charge Trap and Injection Problems (전하 트랩 및 주입 문제를 해결하기 위한 비정질 셀레늄 필름의 계면 특성)

  • 조진욱;최장용;박창희;김재형;이형원;남상희;서대식
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.11a
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    • pp.497-500
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    • 2001
  • Due to their better photosensitivity in X-ray, the amorphous selenium based photoreceptor is widely used on the X-ray conversion materials. It was possible to control the charge carrier transport of amorphous selenium by suitably alloying a-Se with other elements(e,g. As, Cl). The charge transport properties of amorphous Selenium is decided on hole which is induced from metal to selenium in metal-selenium junction and which is transferred in a-Se bulk. This phenomenon is resulted of changing electric field owing to increasing of space charge by deep trap of a-Se bulk. In this paper, We dopped the chlorine to compensate deep hole trap and deposited blocking layer using dielectric material to prevent from increasing space charge for injection charge between metal electrode and a-Se layer. We compared space charge and the decreasing of trap density through measuring dark and photo current.

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Fabrication and Characterization of Ge/B-doped Optical Fiber for UV Poling Applications (UV 폴링용 Ge와 B가 첨가된 실리카 유리 광섬유 제조 및 특성 평가)

  • Kim, Bok-Hyeon;Ahn, Tae-Jun;Heo, Jong;Shin, Dong-Wook;Han, Won-Taek
    • Journal of the Korean Ceramic Society
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    • v.39 no.12
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    • pp.1158-1163
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    • 2002
  • An Ge/B-doped optical fiber with high photosensitivity was fabricated to induce large second-order optical nonlinearity by UV poling. It was found that long period fiber gratings were inscribed on the fiber by the 248 nm KrF excimer laser irradiation with pulse energy of 116 mJ/$cm^2$ and pulse frequency of 10 Hz without hydrogen loading treatment. The photosensitivity was measured by use of the long period fiber grating pair method and the refractive index change of 3.3$10{\times}^{-3}$ was found to be induced in the core of the optical fiber by the KrF excimer laser irradiation of 8.67 kJ/$cm^2$. An H-shaped optical fiber was also fabricated for the UV poling through optimization of the fiber drawing condition.

Characteristics of Damage on Photosensor Irradiated by Intense Illumination : Thermal Diffusion Model (고섬광에 노출된 광센서의 손상 특성 : 열확산 모델)

  • Kwon, Chan-Ho;Shin, Myeong-Suk;Hwang, Hyon-Seok;Kim, Hong-Lae;Kim, Seong-Shik;Park, Min-Kyu
    • Journal of the Korea Institute of Military Science and Technology
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    • v.15 no.2
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    • pp.201-207
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    • 2012
  • Pulsed lasers at the 613 nm and 1064 nm wavelengths on nanoseconds have been utilized to characterize the damage on Si photodiode exposed to intense illumination. Morphological damages and structural changes at sites on the photodiode irradiated during microseconds of laser pulses were analyzed by FE-SEM images and XRD patterns, respectively. The removal of oxide coating, ripple, melting marks, ridges, and crater on photodiodes were definitely observed in order of increasing the pulse intensities generated above the damage threshold. Then, the degradation in photosensitivity of the Si photodiode irradiated by high power density pulses was measured as a function of laser irradiation time at the various wavelengths. The free charge carrier and thermal diffusion mechanisms could have been invoked to characterize the damage. The relative photosensitivity data calculated using the thermal diffusion model proposed in this paper have been compared with the experimental data irradiated above the damage threshold.

Studies on Polymer Resist for Fine Line Lithography (Fine Line Lithography를 위한 Polymer Resist에 관한 연구)

  • 박이순
    • Journal of the Korean Graphic Arts Communication Society
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    • v.11 no.1
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    • pp.71-84
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    • 1993
  • Practically to put use high-photosensitive polymer, poly(vinyl cinnamoyl acetate), we investigated and confirmed UCHIDA`s synthesis, according to control solvent, which is the esterification of poly (vinyl alcohol) with monochloroacetic acid and can be freely conrolled the successive cinnamoyl acetoxyl esterfication of PVCiA, and intruducing photosensitizers,studied the photosensitivity of PVCiA.

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p-Toluenesulfonate Ester Derivatives of Benzendiol as Novel Acid Amplifiers (새로운 산증식제로 벤젠다이올의 p-톨루엔술폰산 에스터 유도체에 관한 연구)

  • Kang, Ji Eun;Hong, Kyoun Il;Lim, Kwon Taek;Jeong, Yeon Tae
    • Applied Chemistry for Engineering
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    • v.16 no.5
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    • pp.660-663
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    • 2005
  • Aiming the development of novel acid amplifiers, 2-hydroxyphenyl-4-methylbenzenesulfonate (1), 3-hydroxyphenyl-4-methylbenzene sulfonate (2), 4-hydroxyphenyl-4-methylbenzenesulfonate (3) were synthesized as the aromatic acid amplifiers with good thermal stability. They were autocatalytically generated p-toluenesulfonic acid in the presence of small amount of acid evolved from a photoacid generator. These aromatic sulfonates showed excellent thermal stability in PtBMA film and were proven to be the first aromatic acid amplifier to act as a photosensitivity enhancer. When these compounds were coupled with a chemically amplified photoresist system, photosensitivity was enhanced up to 3~6 folds.