• International Journal of Fuzzy Logic and Intelligent Systems
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• 제2권3호
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• pp.215-220
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• 2002

This paper proposes a method to apply the Backpropagation(BP) algorithm of MVL(Multi-Valued Logic) Neural Network to pattern recognition. It extracts the property of an object density about an original pattern necessary for pattern processing and makes the property of the object density mapped to MVL. In addition, because it team the pattern by using multiple valued logic, it can reduce time f3r pattern and space fer memory to a minimum. There is, however, a demerit that existed MVL cannot adapt the change of circumstance. Through changing input into MVL function, not direct input of an existed Multiple pattern, and making it each variable loam by neural network after calculating each variable into liter function. Error has been reduced and convergence speed has become fast.

• International Journal of Quality Innovation
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• 제7권3호
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• pp.58-69
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• 2006

This paper presents neural network-based recognition system for automatic light emitting diode (LED) inspection. The back-propagation neural network (BPNN) is proposed and tested. The current-voltage (I-V) characteristic data of LED from the inspection process is used for the network training and testing. This study selects 300 random samples as network training and employs 100 samples as network testing. The experimental results show that if the classification work is done well, the accuracy of recognition is 100%, and the testing speed of the proposed recognition system is almost one half faster than the traditional inspection system does. The proposed neural-network approach is successfully demonstrated by real data sets and can be effectively developed as a recognition system for a practical application purpose.

• 지능정보연구
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• 제16권2호
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• pp.95-108
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• 2010

본 연구에서는 동영상으로부터 동적 수신호 패턴을 효과적으로 인식하기 위한 방법론으로서 복합형 신경망 모델을 제안한다. 제안된 모델은 특징추출 모듈과 패턴분류 모듈로 구성되는데, 이들 각각을 위하여 수정된 구조의 CNN 모델과, WFMM 모델을 도입한다. 또한 목표물의 움직임 정보에 기초한 시공간적 템플릿 구조의 데이터표현을 소개한다. 본 논문에서는 우선 수신호 패턴 데이터에서 특징점의 시간적 변이 및 공간적 변이에 의한 영향을 보완하기 위하여 3차원 수용영역 구조로 확장된 CNN 모델을 제시한다. 이어서 패턴분류 단계를 위하여 가중치를 갖는 구조의 FMM 신경망 모델을 소개하고, 신경망의 구조와 동작특성에 관해 기술한다. 또한 제안된 모델이 기존의 FMM 신경망에서 중첩 하이퍼박스의 축소과정에서 발생하는 학습효과의 왜곡현상을 개선할 수 있음을 보인다. 응용으로 가전제품 원격제어 문제를 전제하여 간략화된 수신호패턴 인식 문제에 적용한 실험결과로부터 제안된 이론의 타당성을 고찰한다.

• Journal of Electrical Engineering and Technology
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• 제9권1호
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• pp.293-300
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• 2014

This paper proposes a novel pattern recognition approach based on the radial basis function (RBF) neural network for identifying insulation defects of high-voltage electrical apparatus arising from partial discharge (PD). Pattern recognition of PD is used for identifying defects causing the PD, such as internal discharge, external discharge, corona, etc. This information is vital for estimating the harmfulness of the discharge in the insulation. Since an insulation defect, such as one resulting from PD, would have a corresponding particular pattern, pattern recognition of PD is significant means to discriminate insulation conditions of high-voltage electrical apparatus. To verify the proposed approach, experiments were conducted to demonstrate the field-test PD pattern recognition of cast resin current transformer (CRCT) models. These tests used artificial defects created in order to produce the common PD activities of CRCTs by using feature vectors of field-test PD patterns. The significant features are extracted by using nonlinear principal component analysis (NLPCA) method. The experimental data are found to be in close agreement with the recognized data. The test results show that the proposed approach is efficient and reliable.

• 한국공작기계학회논문집
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• 제12권2호
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• pp.65-70
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• 2003

In this study, researchers developed the estimative algorithm for artificial defect in semiconductor packages and performed it by pattern recognition technology. For this purpose, the estimative algorithm was included that researchers made software with MATLAB. The software consists of some procedures including ultrasonic image acquisition, equalization filtering, Self-Organizing Map and Backpropagation Neural Network. Self-organizing Map and Backpropagation Neural Network are belong to methods of Neural Networks. And the pattern recognition technology has applied to classify three kinds of detective patterns in semiconductor packages : Crack, Delamination and Normal. According to the results, we were confirmed that estimative algerian was provided the recognition rates of 75.7% (for Crack) and 83.4% (for Delamination) and 87.2 % (for Normal).

• 한국공작기계학회논문집
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• 제15권3호
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• pp.39-44
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• 2006

In this study, we nodestructive test based on ultrasonic test as inspection method and compared backpropagation neural network(BPNN) with probabilistic neural network(PNN) as pattern recognition algorithm of welding flasw. For this purpose, variables are applied the same to two algorithms. Where, feature variables are zooming flaw signals of reflected whole signals from welding flaws in time domain. Through this process, we confirmed advantages/disadvantages of two algorithms and identified application methods of two algorithms.

• 한국통신학회논문지
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• 제22권3호
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• pp.481-492
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• 1997

This paper presents an algorithm for recognizing surface mount device(SMD) IC pattern based on the error back propoagation(EBP) neural network and discrete cosine transform(DCT). In this approach, we chose such parameters as frequency, angle, translation and amplitude for the shape informantion of SMD IC, which are calculated from the coefficient matrix of DCT. These feature parameters are normalized and then used for the input vector of neural network which is capable of adapting the surroundings such as variation of illumination, arrangement of objects and translation. Learning of EBP neural network is carried out until maximum error of the output layer is less then 0.020 and consequently, after the learning of forty thousand times, the maximum error have got to this value. Experimental results show that the rate of recognition is 100% in case of the random pattern taken at a similar circumstance as well as normalized training pattern. It also show that proposed method is not only relatively relatively simple compare with the traditional space domain method in extracting the feature parameter but also able to re recognize the pattern's class, position, and existence.

• Tribology and Lubricants
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• 제11권3호
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• pp.24-30
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• 1995

This paper was undertaken to recognize the pattern of the wear debris by neural network as a link for the development of diagnosis system for movable condition of the lubricated machine surface. The wear test was carried out under different experimental conditions using the wear test device was made in laboratory and wear testing specimen of the pin-on-disk type were rubbed in paraffine series base oil, by varying applied load, sliding distance and mating material. The neural network has been used to pattern recognition of four parameter (diameter, elongation, complex and contrast) of the wear debris and learned the friction condition of five values (material 3, applied load 1, sliding distance 1). The three kinds of the wear debris had a different pattern characteristic and recognized the friction condition and materials very well by the neural network. The characteristic parameter of the large wear debris over a few micron size enlarged recognition ability.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1998년도 하계학술대회 논문집 G
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• pp.2448-2450
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• 1998

For the exact classification of the arm motion this paper proposes EMG pattern recognition method with neural network. For this autoregressive coefficient, linear cepstrum coefficient, and adaptive cepstrum coefficient are selected for the feature parameter of EMG signal, and they are extracted from time series EMG signal. For the function recognition of the feature parameter a radial basis function network, a field of neural network is designed. For the improvement of recognition rate, a number of radial basis function network are combined in parallel, comparing with a backpropagation neural network an existing method.

• 전자공학회논문지S
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• 제34S권7호
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• pp.102-111
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• 1997

In this paper, a patern recognition method of surface mount device(SMD) IC using wavelet transform and neural network is proposed. We chose the feature parameter according to the characteristics of coefficient matrix which is obtained from four level discrete wavelet transform (DWT). These feature parameters are normalized and then used for the input vector of neural network which is capable of adapting the surroundings such as variation of illumination, arrangement of objects and translation. Experimental results show that when the same form of feature pattern, as is used for learning, is put into neural network and gained 100% rate ofrecognition irrespective of SMD IC kinds, location and variation of illumination. In the case of unused feature pattern for learning, the recognition rate is 85.9% under the similar surroundings, where as an average recognition rate is 96.87% for the case of reregulated value of illumination. Proosed method is relatively simple compared with the traditional space domain method in extracting the feature parameter and is also well suited for recognizing the pattern's class, position and existence. It can also shorten the processing tiem better than method extracting feature parameter with the use of discrete cosine transform(DCT) and adapt the surroundings such as variation of illumination, the arrangement and the translation of SMD IC.