The Development of Pattern Classification for Inner Defects in Semiconductor Packages by Self-Organizing Map
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김재열
(조선대학교 기계공학부)
윤성운 (조선대학교 기계공학부) 김훈조 (광주인력개발원 기계설계제작과) 김창현 (조선대하교 대학원 정밀기계공학과) 양동조 (조선대학교 대학원 정밀기계공학과) 송경석 (조선대학교 대학원 광응용공학과) |
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Neural Networks
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A Study on Prediction of Optimized Penetration Using the Neural Network and Empirical Models
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과학기술학회마을 |
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The Classification of Roughness for Machined Surface Image Using Neural Network
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과학기술학회마을 |
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The Self-Organizing Map
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DOI ScienceOn |
11 |
Pattern Recognition and Image Processing
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A Study on the Detection of Interfacial Defect to Boundary Surface in Semiconductor Package by Ultrasonic Signal Processing
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A Study on the Image Processing of Micro-Defects Detection of Semiconductor Pakage by Ultrasonic Wave
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Gray Level Transformation for Interactive Image Enhancement
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DOI ScienceOn |
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