• Title/Summary/Keyword: p and n-type electrical properties

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Preparation and Characterization of MFIS Using PT/BFO/$HFO_2$/Si Structures

  • Kim, Kwi-Junga;Jeong, Shin-Woo;Han, Hui-Seong;Han, Dae-Hee;Jeon, Ho-Seung;Im, Jong-Hyun;Park, Byung-Eun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.06a
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    • pp.80-80
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    • 2009
  • Recently, multiferroics have attracted much attention due to their numorous potentials. In this work, we attemped to utilize the multiferroics as an alternative material for ferroelectrics. Ferroelectric materials have been stadied to ferroelectric random access memories, however, some inevitable problems prevent it from inplementation. multiferroics shows a ferroelectricity and has low process temperature $BiFeO_3$(BFO) films have good ferroelectric properties but poor leakage characterization. Thus we tried, in this work, to adopt $HfO_2$ insulating layer for metal-ferroelectric-insulator-semiconductor(MFMIS) structure to surpress to leakage current. $BiFeO_3$(BFO) thin films were fabricared by using a sol-gel method on $HfO_2/Si$ structure. Ferroelectric BFO films on a p-type Si(100)wafer with a $HfO_2$ buffer layer have been fabricated to form a metal-ferroelectric-insulator-semiconductor (MFIS) structure. The $HfO_2$ insulator were deposited by using a sol-gel method. Then, they were carried out a rapid thermal annealing(RTA) furnace at $750\;^{\circ}C$ for 10 min in $N_2$. BFO films on the $HfO_2/Si$ structures were deposited by sol-gel method and they were crystallized rapid thermal annealing in $N_2$ atomsphere at $550\;^{\circ}C$ for 5 min. They were characterized by atomic force microscopy(AFM) and Capacitance-voltage(C-V) curve.

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Effect of dopants(Tri-valent, Penta-valent) on the electrical and optical properties of SnO2 based transparent electrodes

  • Kim, G.W.;Sung, C.H.;Seo, Y.J.;Park, K.Y.;Heo, S.N.;Lee, S.H.;Koo, B.H.
    • Journal of Ceramic Processing Research
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    • v.13 no.spc2
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    • pp.394-397
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    • 2012
  • In this work, we studied the influence of the dopant elements concentration on the properties of SnO2 thin films deposited by pulsed laser deposition. X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), Hall effect measurement and UV-Vis studies were performed to characterize the deposited films. XRD results showed that the films had polycrystalline nature with tetragonal rutile structure. FE-SEM micrographs revealed that the as deposited films composed of dense microstructures with uniform grain size distribution. All the films show n-type conduction and the best transparent conductive oxide (TCO) performance was obtained on 6 wt% Sb2O5 doped SnO2 film prepared at pO2 of 60mtorr and Ts of 500 ℃. Its resitivity, optical transmittance, figure of merit are 7.8 × 10-4 Ω cm, 85% and 1.2 × 10-2 Ω-1, respectively.

Characteristics of Piezoelectric Transformer Using PMS-PZT, PMN-PZT Ceramics (PMS-PZT, PMN-PZT계 세라믹스를 이용한 압전변압기의 특성)

  • 이동균;안형근;한득영;윤석진;김현재
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.13 no.3
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    • pp.220-226
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    • 2000
  • The piezoelectric material for piezoelectric transformer needs the high electromechanical coupling factor( $k_{p}$) the piezoelectric constant( $d_{33}$) and the mechanical quality factor( $Q_{m}$)in order to obtain high voltage step-up ratio and low temperature rising. In this study the piezoelectric transformers were fabricated using Pb[$Zr_{0.45}$/ $Ti_{0}$48//L $u_{0.02}$(M $n_{1}$3//S $b_{2}$3/)$_{0.05}$$O_3$(PMS-PZT) and Pb[Z $r_{0.25}$/ $Ti_{0.375}$(M $g_{1}$3//N $b_{2}$3/)$_{0.375}$$O_3$+0.5wt%Mn $O_2$(PMN-PZT) ceramics. The piezoelectric properties of PMS-PZT and PMN-PZT were measured. The voltage set-up ratios of the piezoelectric transformers using PMS-PZT and PMN-PZT were the value of 15, 20 respectively under 100$_{KΩ}$ in Rosen type transformer.r.ormer.r.r.r.r.r.r.

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Thermoelectric Properties of the (Pb$_{1-x}$Sn/$_{x}$)Te Sintered by AC Applied Hot Pressing (AC 통전식 Hot Press 법에 의해 제조된 (Pb$_{1-x}$Sn/$_{x}$)Te 열전반도체의 물성)

  • 신병철;황창원;오수기;최승철;백동규
    • Journal of the Microelectronics and Packaging Society
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    • v.7 no.4
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    • pp.1-5
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    • 2000
  • Properties of AC applied hot pressed ($Pb_{1-x}Sn_{x}$) Te thermoelectrics were investigated. Mechanical alloying process used to produce alloyed powder to reduce the inhomogeneity and to avoid vaporization of constituents. It showed an increase in the mechanical alloying time with increasing of Sn contents in ($Pb_{1-x}Sn_{x}$)Te. ($Pb_{1-x}Sn_{x}$)Te were sintered at 873 to 923K for 1-4 minutes, under 150 kgf/$\textrm{cm}^2$ by AC applied hot pressng method. The short sintering time of AC applied hot pressing process could reduce the vaporization of Te. The density of ($Pb_{1-x}Sn_{x}$) Te was more dependent on the sintering temperature than the sintering time. The p-n transition was observed at x=0.1 but only p type conduction behavior was observed at more than 20 mol% of Sn compositions. The maximum value of Seebeck coefficient is 250 $\mu$V/K for x=0.2 at 500K. As the amount of Sn increases, the peak value of Seebeck coefficient drops and shifts to higher temperature and the peak value of electrical conductivity decreased with increasing temperature.

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A Study on the Characteristics Analysis and Design of High Sensitivity Silicon Photodiode for Laser Detector (레이저 검출용 고감도 실리콘 포토다이오드 제조 및 특성 분석에 관한 연구)

  • Lee, Jun-Myung;Kang, Eun-Young;Park, Keon-Jun;Kim, Yong-Kab
    • The Journal of the Korea institute of electronic communication sciences
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    • v.9 no.5
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    • pp.555-560
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    • 2014
  • In order to improve spectrum sensitivity of photodiode for detection of the laser wavelength at 850 nm ~ 1000 nm of near-infrared band, this study has produced silicon-based photodiode whose area is $5000{\mu}m{\times}2000{\mu}m$, and the thickness is $280{\mu}m$. It was packed by the TO-5 type. The electrical properties of the dark currents have valued of approximately 0.1 nA for 5 V reverse bias, while the capacitance showed 32.5 pF at frequency range of 1 kHz and about 32.4 pF at the range of 200 kHz for 0 V. In addition, the rising time of output signal was as fast response as 20.92 ns for 10V. For the optical properties, the best spectrum sensitivity was 0.57 A/W for 890 nm, while it was relatively excellent value of 0.37 A/W for 1,000 nm. Over all, there were good spectrum sensitivity for this diode over the range of 870 ~ 920 nm.

Optimizing Surface Reflectance Properties of Low Cost Multicrystalline EFG Ribbon-silicon (저가 다결정 EFG 리본 웨이퍼의 표면 반사도 특성 최적화)

  • Kim, Byeong-Guk;Lee, Yong-Koo;Chu, Hao;Oh, Byoung-Jin;Park, Jae-Hwan;Lee, Jin-Seok;Jang, Bo-Yun;An, Young-Soo;Lim, Dong-Gun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.24 no.2
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    • pp.121-125
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    • 2011
  • Ribbon silicon solar cells have been investigated because they can be produced with a lower material cost. However, it is very difficult to get good texturing with a conventional acid solution. To achieve high efficiency should be minimized for the reflectance properties. In this paper, acid vapor texturing and anti-reflection coating of $SiN_x$ was applied for EFG Ribbon Si Wafer. P-type ribbon silicon wafer had a thickness of 200 ${\mu}m$ and a resistivity of 3 $\Omega-cm$. Ribbon silicon wafers were exposed in an acid vapor. Acid vapor texturing was made by reaction between the silicon and the mixed solution of HF : $HNO_3$. After acid vapor texturing process, nanostructure of less than size of 1 ${\mu}m$ was formed and surface reflectance of 6.44% was achieved. Reflectance was decreased to 2.37% with anti-reflection coating of $SiN_x$.

Applications of XPS and SIMS for the development of Si quantum dot solar cell

  • Kim, Gyeong-Jung;Hong, Seung-Hwi;Kim, Yong-Seong;Lee, U;Kim, Yeong-Heon;Seo, Se-Yeong;Jang, Jong-Sik;Sin, Dong-Hui;Choe, Seok-Ho
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.297-297
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    • 2010
  • Precise control of the position and density of doping elements at the nanoscale is becoming a central issue for realizing state-of-the-art silicon-based optoelectronic devices. As dimensions are scaled down to take benefits from the quantum confinement effect, however, the presence of interfaces and the nature of materials adjacent to silicon turn out to be important and govern the physical properties. Utilization of visible light is a promising method to overcome the efficiency limit of the crystalline Si solar cells. Si quantum dots (QDs) have been proposed as an emission source of visible light, which is based on the quantum confinement effect. Light emission in the visible wavelength has been reported by controlling the size and density of Si QDs embedded within various types of insulating matrix. For the realization of all-Si QD solar cells with homojunctions, it is prerequisite not only to optimize the impurity doping for both p- and n-type Si QDs, but also to construct p-n homojunctions between them. In this study, XPS and SIMS were used for the development of p-type and n-type Si quantum dot solar cells. The stoichiometry of SiOx layers were controlled by in-situ XPS analysis and the concentration of B and P by SIMS for the activated doping in Si nano structures. Especially, it has been experimentally evidenced that boron atoms in silicon nanostructures confined in SiO2 matrix can segregate into the Si/$SiO_2$ interfaces and the Si bulk forming a distinct bimodal spatial distribution. By performing quantitative analysis and theoretical modelling, it has been found that boron incorporated into the four-fold Si crystal lattice can have electrical activity. Based on these findings, p-type Si quantum dot solar cell with the energy-conversion efficiency of 10.2% was realized from a [B-doped $SiO_{1.2}$(2 nm)/$SiO_2(2\;nm)]^{25}$ superlattice film with a B doping level of $4.0{\times}10^{20}\;atoms/cm^2$.

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A study on the Dielectric Properties of IPN based on the Epoxy/Silicon and Epoxy/Urethane (Epoxy/Silicon Epoxy/Urethane계 IPN 복합재료의 개발에 관한 연구)

  • Shin, Joong-Hong;Jung, Eun-Shik;Park, Chung-Hoo
    • Proceedings of the KIEE Conference
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    • 1987.11a
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    • pp.504-507
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    • 1987
  • Interpenerating Polymer Networks (IPNs) are unique type of polymer blend, synthesized by swelling a crossed polymer (Epoxy) with second polymer (Silicon) and also we adopted Urethane as the second polymer. The relationship between dielectric and mechanical properties of high temperature curing IPNs(E/S, E/U) are investigated. The ratios of weight that we formed we re two kind of thing, one (E/S) about 1[wt%]. 3[wt%], 5[wt%], 7[wt%], 10[wt%], and the other (E/U) about 5[wt%], 15[wt%], 25[wt%]. It was heat-cured for 24hours at $100^{\circ}C$ 48 hours at $10^{\circ}C$, 5 hours at $130^{\circ}C$, 15hours at $130^{\circ}C$ in E/S and also for 5 hours at $130^{\circ}C$ in E/U. From the viewpoint of dielectric and mechanical properties, the optimum condition is obtained from the sample cured for 5hours at $130^{\circ}C$ for 1[wt%] in the E/S, and also obtained from the sample cure d for 5 hours at $130^{\circ}C$ in E/U.

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Enhancing Gas Response Characteristics of Mixed Metal Oxide Gas Sensors

  • Balamurugan, Chandran;Song, Sun-Ju;Kim, Ho-Sung
    • Journal of the Korean Ceramic Society
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    • v.55 no.1
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    • pp.1-20
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    • 2018
  • Semiconducting nanomaterials have attracted considerable interest in recent years due to their high sensitivity, selectivity, and fast response time. In addition, for portable applications, they have low power consumption, lightweight, simple in operation, a low maintenance cost. Furthermore, it is easy to manufacture microelectronic sensor structures with metallic oxide sensitive thin layers. The use of semiconducting metal oxides to develop highly sensitive chemiresistive sensing systems remains an important scientific challenge in the field of gas sensing. According to the sensing mechanisms of gas sensors, the overall sensor conductance is determined by surface reactions and the charge transfer processes between the adsorbed species and the sensing material. The primary goal of the present study is to explore the possibility of using semiconducting mixed metal oxide nanostructure as a potential sensor material for selective gases.

Interfacial Microstructure and Electrical Properties of $Al_2O_3/Si$ Interface of Mono-crystalline Silicon Solar Cells (단결정 실리콘 태양전지에서 후열처리에 따른 $Al_2O_3/Si$ 계면조직의 특성 변화)

  • Paek, Sin Hye;Kim, In Seob;Cheon, Joo Yong;Chun, Hui Gon
    • Journal of the Semiconductor & Display Technology
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    • v.12 no.3
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    • pp.41-46
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    • 2013
  • Efficient and inexpensive solar cells are necessary for photo-voltaic to be widely adopted for mainstream electricity generation. For this to occur, the recombination losses of charge carriers (i.e. electrons or holes) must be minimized using a surface passivation technique suitable for manufacturing. Recently it has been shown that aluminum oxide thin films are negatively charged dielectrics that provide excellent surface passivation of silicon solar cells to attract positive-charged holes. Especially aluminum oxide thin film is a quite suitable passivation on the rear side of p-type silicon solar cells. This paper, it demonstrate the interfacial microstructure and electrical properties of mono-crystalline silicon surface passivated by $Al_2O_3$ films during firing process as applied for screen-printed solar cells. The first task is a comparison of the interfacial microstructure and chemical bonds of PECVD $Al_2O_3$ and of PEALD $Al_2O_3$ films for the surface passivation of silicon. The second is to study electrical properties of double-stacked layers of PEALD $Al_2O_3$/PECVD SiN films after firing process in the temperature range of $650{\sim}950^{\circ}C$.