Study of optimum growth condition of phase change Ge-Sb-Te thin films as an optical recording medium using in situ ellipsometry (In situ 타원법을 사용한 광기록매체용 Ge-Sb-Te 박막의 최적성장조건 연구)
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- Korean Journal of Optics and Photonics
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- v.14 no.1
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- pp.23-32
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- 2003