• Korean Journal of Optics and Photonics
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• v.2 no.2
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• pp.59-66
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• 1991

Resonance angle and optimum thinckness of various thin metal films for surface plasmon resonance were calculated using an admittance diagram and optical constants and thickness of thin Ag films and Al films were determined by fitting the measured reflectance of surface plasmon resonance. Two wavelengths of an Ar ion laser were employed to select the unique optical constants which have the same thickness at two wavelengths. Also, when these films were exposed to the air, the shift of surface plasmon resonance was measured and the optical constants of modified thin films were determined.

• Journal of the Optical Society of Korea
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• v.17 no.1
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• pp.38-43
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• 2013

In this study, we propose a simple and indirect method to determine the optical constants of Mo and ITO thin films in the extreme ultraviolet (EUV) wavelength region by using X-ray reflectometry (XRR) and Rutherford backscattering spectrometry (RBS). Mo and ITO films were deposited on silicon substrates by using an RF magnetron sputtering method. The density and the composition of the deposited films were evaluated from the XRR and RBS analysis, respectively and then the optical constants of the Mo and ITO films were determined by an indirect optical method. The results suggest that the indirect method by using the XRR and RBS analysis will be useful to search for suitable high absorbing EUVL mask material quickly.

• Korean Journal of Optics and Photonics
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• v.3 no.1
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• pp.1-10
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• 1992

A simple formula of the envelope method, which uses two envelopes fitted to the transmittance at quarter- and half-wave optical thicknesses, is derived to determine the optical constants (refractive index and extinction coefficient) and the thickness of weakly absorbing thin films. We applied the envelope method to ZnS and SiOx films deposited in a vacuum chamber and determined the optical constants at different deposition conditions. For SiOx films, the decrease in refractive index is consistent with the increase in stoichiometry as the backfilled oxygen pressure increases.

• Journal of the Korean Graphic Arts Communication Society
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• v.18 no.1
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• pp.47-58
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• 2000

Transmittances of SiO2 and ZrO2 thin films, made by the electron beam evaporation method, were measured with a spectrophotometer to be used in determining their optical constants and thicknesses in the envelop method. New color glass lenses with high transmittance, which now can be manufactured in the industry, was successfully designed by using these constants. Also the vacuum evaporator could be mechanically corrected with these constants as correction factors.

• Macromolecular Research
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• v.15 no.3
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• pp.211-215
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• 2007

Hybrid thin film nanostructures composed of metal nanoparticles (NPs) and self-assembled polymer films with different spatial distributions of NPs were analyzed by optical waveguide spectroscopy (OWS). Specifically, the dielectric constants were calculated using effective medium theory for the incorporation of 1 vol% Au NP into the block copolymer (BCP) films having a cylindrical nanodomain morphology. Three cases were considered: uniform distribution of NPs in the film; selective distribution of NPs only in the cylindrical domains; and segregation of NPs to the center of the cylindrical domains. The optical waveguide spectra derived from the calculated dielectric constants demonstrate the feasibility of experimentally distinguishing the composite nanostructures with different inner morphologies in the hybrid metal NP-BCP nanostructures, by the measurement of the dielectric constants using OWS.

• Proceedings of the Optical Society of Korea Conference
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• 2001.08a
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• pp.46-47
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• 2001

• Proceedings of the Optical Society of Korea Conference
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• 1999.08a
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• pp.138-139
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• 1999

• Bulletin of the Korean Chemical Society
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• v.34 no.1
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• pp.128-132
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• 2013

L-Arginine semi-oxalate (LASO) single crystal has been grown by solution growth technique at room temperature. The crystal structure and lattice parameters were determined for the grown crystal by single crystal X-ray diffraction studies. Photoluminescence studies confirm the violet fluorescence emission peak at 395 nm. Optical constants like band gap, refractive index, reflectance, extinction coefficient and electric susceptibility were determined from UV-VIS-NIR spectrum. The dielectric constant, dielectric loss and ac conductivity of the compound were calculated at different temperatures and frequencies to analyze the electrical properties. The solid state parameters such as plasma energy, Penn gap, Fermi energy and polarizability were calculated to analyze second harmonic generation (SHG). Nonlinear optical property was discussed to confirm the SHG efficiency of the grown crystal.

• Proceedings of the Optical Society of Korea Conference
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• 1998.08a
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• pp.70-71
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• 1998

• Proceedings of the Optical Society of Korea Conference
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• 2004.07a
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• pp.226-227
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• 2004