• Title/Summary/Keyword: nanometer

Search Result 595, Processing Time 0.029 seconds

Electrical Imaging of Thin Film Surface by Scanning Maxwell-stress Microscopy (주사형 맥스웰응력 현미경에 의한 표면의 전기적 이미지)

  • Shin, Hoon-Kyu;Kwon, Young-Soo
    • Proceedings of the KIEE Conference
    • /
    • 1998.07d
    • /
    • pp.1508-1510
    • /
    • 1998
  • Recent development of scanning probe microscope techniques has made it possible to investigate, not only microscopic surface topography, but also physical and chemical properties on the nanometer-scale. The scanning Maxwell-stress microscopy (SMM) is surface characterization tool capable of mapping both the surface topography and electrical properties, such as surface potential, surface charge dielectric constant of thin films with a nanometer-scale resolution by means of the AC voltage driven oscillation of metal coated cantilever. In this study, we observed the surface potential distribution and molecular ordering in thin films. We have demonstrated that the SMM can be used for imaging surface potential distribution over the film surface and also be used for detecting surface changes in thin films. This is first step towards the understanding of electrical phenomena in organic and inorganic materials, biological system with SMM.

  • PDF

Nanometer Scale Vacuum Lithography using Plasma Processes (플라즈마 공정을 이용한 나노미터 단위의 진공리소그래피)

  • Kim, S.O.;Park, B.K.;Park, J.k.;Lee, K.S.;Lee, J.;Yuk, J.H.;Ra, D.K.;Lee, D.C.
    • Proceedings of the KIEE Conference
    • /
    • 1998.07d
    • /
    • pp.1343-1345
    • /
    • 1998
  • This work was carried out to develop a pattern on the nanometer scale using plasma polymerization and plasma etching. This study is also aimed at developing a resist for the nano process and a vacuum lithography process. The thin films of plasma polymerization were fabricated by the plasma polymerization of inter-electrode capacitively coupled gas flow system. After delineating the pattern at accelerating voltage of 30[kV], ranging the dose of $1-500[{\mu}C/cm^2$], the pattern was developed with dry type and formed by plasma etching.

  • PDF

Wetting Characteristic of Single Droplet Impinging on Hole-Patterned Texture Surfaces (홀 패턴 텍스쳐 표면에서 충돌하는 단일 액적의 젖음 특성)

  • Moon, Joo Hyun;Lee, Sangmin;Jung, Jung-Yeul;Lee, Seong Hyuk
    • Journal of ILASS-Korea
    • /
    • v.20 no.3
    • /
    • pp.181-186
    • /
    • 2015
  • This study presents the dynamic wetting characteristics of an impact droplet on hole-patterned textured surfaces. The flat surfaces were manufactured by a drilling machine to generate the micro-order holes, leading to make the surface hydrophobic. Other flat surfaces were fabricated by the anodizing technique to make hydrophilic texture surfaces with a nanometer order. For hydrophilic and hydrophobic textured surfaces with similar texture area fractions, the impinging droplet experiments were conducted and compared with flat surface cases. As results, an anodized textured surface decreases apparent equilibrium contact angle and increases contact diameters, because of increase in contact area and surface energy. This is attributed to more penetration inside holes from larger capillary pressure on nanometer-order holes. On the other hand, temporal evolution of the contact diameter is smaller for the hydrophobic textured surface from less penetration on the micro-order holes.

Heat Conductivity Test and Conduction Mechanism of Nanofluid (나노유체의 열전도율 실험과 열전달 메커니즘의 제시)

  • Park, Kweon-Ha;Lee, Jin-A;Kim, Hye-Min
    • Journal of Advanced Marine Engineering and Technology
    • /
    • v.32 no.6
    • /
    • pp.862-868
    • /
    • 2008
  • Many studies have been conducted to increase heat transfer in fluid. One of the various heat transfer enhancement techniques is suspending fine metallic or nonmetallic solid powder in traditional fluid. Nanofluid is defined as a new kind of heat transfer fluid containing a very small quantity of nanometer particles that are uniformly and stably suspended in a liquid. This study investigates the effect of nanofluid containing diamond, CuNi and CuAg nanometer particles, and proposes the heat transport mechanism of nanofluid. The test result shows that the thermal conductivity of nanofluid is much higher than that of traditional fluid, and the increasing rate of the conductivity is dependent on the conductivity of the solid metal.

Multi-scale analysis of polymeric materials using OCTA (OCTA 를 이용한 폴리머 재료의 다중 스케일 해석)

  • Kim, Jae-Hyun;Choi, Byung-Ik;Kim, Jung-Yup
    • Proceedings of the KSME Conference
    • /
    • 2003.04a
    • /
    • pp.1094-1099
    • /
    • 2003
  • Nanometer-sized structures are being applied to many fields including micro/nano electronics, optoelectronics, quantum computing, biosensors, etc. Multi-scale analysis technology is required for designing the reliable nanometer-sized structures and predicting their mechanical, chemical and electronic behaviors. In this paper, some techniques for multi-scale analysis are reviewed and their applicability and limitation are discussed. Research activity of nano process analysis team in KIMM is outlined. Especially, we concentrate on OCTA of Nagoya University in Japan for the analysis of polymeric materials. Detailed structure of OCTA is described and some examples are presented.

  • PDF

A Study on Basic Research Trends of Ultra-Precision Machining Technology in Korea (우리나라 초정밀가공기술의 기초연구동향 분석 연구)

  • Park, Won-Kyoo;Lee, Dae-Myung;Hong, Won-Hwa
    • Journal of the Korean Society of Manufacturing Technology Engineers
    • /
    • v.20 no.1
    • /
    • pp.86-95
    • /
    • 2011
  • Ultra-precision machining technology is the essential core technology in today's micro-electronics and electro-optical industries. The needs for processing systems to manufacture products to nanometer(nm) accuracy and sub-nanometer resolutions are increased recently. By using ion beam, it is possible to fabricate ultra-precision and ultra-fine products with nm accuracy and sub-nm resolution. In this paper, the basic research trends of ultra precision machining technology in domestic are surveyed, and the ways to reach to the world-leading level of basic research capabilities in the field of ultra-precision machining technology in domestic is suggested.

Measurement and Compensation of Nonlinearity in Homodyne Interferometer (Homodyne 간섭계에서의 비선형성 측정과 보정)

  • Kim, Jong-Yun;Eom, Tae-Bong;Jeong, Kyu-Won;Choi, Tae-Young;Lee, Keon-Hee
    • Journal of the Korean Society for Precision Engineering
    • /
    • v.18 no.9
    • /
    • pp.171-178
    • /
    • 2001
  • The nonlinearity of a laser interferometer usually ranges from sub-nanometer to several manometers. This nonlinearity, which has periodic characteristics, limits the accuracy of the interferometer at the sub-nanometer level. The nonlinearity error of the one-frequency homodyne interferometer with quadrature fringe detection results from a number of factors including polarization mixing by imperfect optical elements, unequal gain of photo detectors, lack of quadrature between two signals and misalignment. In this paper, we described a method for measuring and compensating the nonlinearity of homodyne interferometer using the elliptical fitting technique with least-square method. Experimental results demonstrate that $^\pm$3.5 nm nonlinearity can be reduced to $^\pm$0.2 nm level.

  • PDF

Development of Nanoscale Thermoelectric Coefficient Measurement Technique Through Heating of Nano-Contact of Probe Tip and Semiconductor Sample with AC Current (탐침의 첨단과 반도체 시편 나노접접의 교류전류 가열을 통한 나노스케일 열전계수 측정기법 개발)

  • Kim, Kyeongtae;Jang, Gun-Se;Kwon, Ohmyoung
    • Transactions of the Korean Society of Mechanical Engineers B
    • /
    • v.30 no.1 s.244
    • /
    • pp.41-47
    • /
    • 2006
  • High resolution dopant profiling in semiconductor devices has been an intense research topic because of its practical importance in semiconductor industry. Although several techniques have already been developed. it still requires very expensive tools to achieve nanometer scale resolution. In this study we demonstrated a novel dopant profiling technique with nanometer resolution using very simple setup. The newly developed technique measures the thermoelectric voltage generated in the contact point of the SPM probe tip and MOSFET surface instead of electrical signals widely adopted in previous techniques like Scanning Capacitance Microscopy. The spatial resolution of our measurement technique is limited by the size of contact size between SPM probe tip and MOSFET surface and is estimated to be about 10 nm in this experiment.

Profile Measurements of Micro-Machined Surfaces by Scanning Tunneling Microscopy (터널링효과를 이용한 초미세 가공표면의 형상측정)

  • Jung, Seung-Bae;Lee, Young-Ho;Kim, Seung-Woo
    • Transactions of the Korean Society of Mechanical Engineers
    • /
    • v.17 no.7 s.94
    • /
    • pp.1731-1739
    • /
    • 1993
  • An application of Scanning Tunneling Microscopy(STM) is investigated for the measurement of 3-dimensional profiles of the macro-machined patterns of which critical dimensions lie in the range of submicrometers. Special emphasis of this investigation is given to extending the measuring ranges of STM upto the order of several micrometers while maintaining superb nanometer measuring resolution. This is accomplished by correcting hysteresis effects of piezoelectric actuators by using non-linear compensation models. Detailed aspects of design and control of a prototype measurement system are described with some actual measuring examples in which fine It patterns can successfully be traced with a resolution of 1 nanometer over a surface range of $4{\times}2$ micrometers.

Design and Multi-scale Analysis of Micro Contact Printing (미세접촉인쇄기법의 설계와 다중스케일해석)

  • Kim, Jung-Yup;Kim, Jae-Hyun;Choi, Byung-Ik
    • Proceedings of the KSME Conference
    • /
    • 2003.11a
    • /
    • pp.1927-1931
    • /
    • 2003
  • Nanometer-sized structures are being applied to many fields including micro/nano electronics, optoelectronics, quantum computing, biosensors, etc. Micro contact printing is one of the most promising methods for manufacturing the nanometer-sized structures. The crucial element for the micro contact printing is the nano-resolution printing technique using polymeric stamps. In this study, a multi-scale analysis scheme for simulating the micro contact printing process is proposed and some useful analysis results are presented. Using the slip-link model [1], the dependency of viscoelasticity on molecular weight of polymer stamp is predicted. Deformation behaviors of polymeric stamps are analyzed using finite element method based upon the predicted viscoelastic properties.

  • PDF