A Flexure Guided Planar Scanner for Scanning Probe Microscope ; Part 2. Evaluation of Static and Dynamic Properties (주사 현미경용 평면 스캐너 Part 2 : 정 · 동 특성 평가)
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- Transactions of the Korean Society for Noise and Vibration Engineering
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- v.15 no.11 s.104
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- pp.1295-1302
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- 2005