• Journal of the Korea Academia-Industrial cooperation Society
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• v.11 no.4
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• pp.1278-1284
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• 2010

In this paper, we propose a new mura detection algorithm for TFT-LCD effectively, which is based on multi-point, 2-dimensional FFT. Since mura in TFT-LCD has a certain area shape, it is seen as a sin wave in a LCD line. Since shapes of mura can be seen a circle, horizontal oval, or vertical oval, it is shown that they can be detected by 2-dimensional FFT easily. Through simulation for test image, it is shown that proposed algorithm can detect various sizes of mura. The proposed algorithm can be utilized in automatic test equipment for effective TFT-LCD mura detection.

• Industrial Engineering and Management Systems
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• v.8 no.3
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• pp.148-154
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• 2009

In recent days, large-sized flat-panel display (FPD) has been increasingly applied to computer monitors and TVs. Mura defects, appearing as low contrast or non-uniform brightness region, sometimes occur in manufacturing of the Thin-Film Transistor Liquid-Crystal Displays (TFT-LCD). Implementation of automatic Mura inspection methods is necessary for TFT-LCD production. Various existing Mura detection methods based on regression diagnostics, surface fitting and data transformation have been presented with good performance. This paper proposes an efficient Mura detection method that is based on a regression diagnostics using studentized residuals for automatic Mura inspection of FPD. The input image is estimated by a linear model and then the studentized residuals are calculated for filtering Mura regions. After image dilation, the proposed threshold is determined for detecting the non-uniform brightness region in TFT-LCD by means of monitoring the every pixel in the image. The experimental results obtained from several test images are used to illustrate the effectiveness and efficiency of the proposed method for Mura detection.

• Journal of IKEEE
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• v.18 no.2
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• pp.234-239
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• 2014

This paper proposes a new automatic detection method to inspect mura defects on display film surface using morphological image processing and labeling. This automatic detection method for mura defects on display films comprises 3 phases of preprocessing with morphological image processing, Gabor filtering, and labeling. Since distorted results could be obtained with the presence of non-uniform illumination, preprocessing step reduces illumination components using morphological image processing. In Gabor filtering, mura images are created with binary coded mura components using Gabor filters. Subsequently, labeling is a final phase of finding the mura defect area using the difference between large mura defects and values in the periphery. To evaluate the accuracy of the proposed detection method, detection rate was assessed by applying the method in 200 display film samples. As a result, the detection rate was high at about 95.5%. Moreover, the study was able to acquire reliable results using the Semu index for luminance mura in image quality inspection.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08b
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• pp.1597-1599
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• 2007

In TFT-LCD, mura is a defect which degrades the display quality. The resistance difference between gate lines is the main cause of H-Block mura. Two methods could eliminate this defect. A thinner gate layer or gate fan-out pattern decrease mura level. H-Block mura has been reduced after implementing the new schemes.

• 한국정보디스플레이학회:학술대회논문집
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• 2009.10a
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• pp.991-994
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• 2009

This paper reports of camera detection of Mura. The type, location, size, orientation and amplitude are found. As the luminance variation in Mura is down to less than app. 0.3 %, measurement apparatus, techniques and algorithms are developed to measure low noise data and to extract the Mura from data with the residual noise in the same magnitude as the Mura.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.10 no.3
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• pp.529-534
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• 2009

In this paper, we propose a new algorithm which can detect Mura in TPT-LCD effectively. Since Mura in TFT-LCD has a certain area shape, it is seen as a sin wave in a LCD line. Consequently, it is shown that this type of Mura can be detected easily through FFT. Even multiple size of Mura patterns exist, those patterns can be detected with multi-point FFT. Proposed algorithm can be utilized in automatic Mura detection systems instead of human Mura detection methods.

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.1062-1065
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• 2004

We have analyzed the cause of black "mura" and measured it in prism light guide plate(LGP). Properties of components used in a backlight uint(BLU) have changed by simulation tool. We get major factor of black "mura" for improvement in prism LGP. For the improvement of black "mura", removal of brightness "mura" at input light part must precede preferentially because of reflection characteristic of the prism LGP. Removal of brightness "mura" is improved by hanging of input light part in LGP and dispersion treatment.

• Journal of Information Display
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• v.12 no.3
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• pp.121-124
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• 2011

The mechanism for lattice-shaped mura defects was proposed by characterizing the electro-optic properties of liquid crystal (LC), which showed different transmission properties between the normal and mura defect areas. An increase in the mura defect rate was observed when the dotted LC in the one drop filling (ODF) was exposed for a longer time. The dotted LC droplet at the edge evaporated more rapidly than that in the center. This resulted in a higher concentration of polar singles at the edge of the dotted LC droplet, leading to a higher ${\Delta}n$ value and higher transmittance. This implies that the reductio of the exposure time of the dotted LC to air plays a critical role in decreasing the occurrence of lattice-shaped mura defects in ODF.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.05a
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• pp.165-168
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• 2004

We have analyzed the cause of black "mura" and measured it in prism light-guide plate (LGP). Properties of components used in a back light. unit (BLU) have changed by Simulation Tool. We get major factor of black "mura" for improvement in prism LGP. For the improvement of black "mura", removal of brightness "mura" at input light part must precede preferentially because of reflection characteristics of the prism LGP. Removal of brightness "mura" is improved by changing of input light part in LGP and dispersion treatment.

• 한국정보디스플레이학회:학술대회논문집
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• 2006.08a
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• pp.1465-1468
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• 2006

We developed a new ellipsometer for MURA detection. This ellipsometer can measure MURA along the slit line on the sample with high sensitivity, because this ellipsometer irradiates a slit beam onto the sample but can reject the reflected light from the back surface of the substrate. This ellipsometer is suitable for measuring MURA of the surface of sample with high sensitivity.