• Proceedings of the Korean Society of Precision Engineering Conference
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• 2007.06a
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• pp.763-764
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• 2007

• Journal of the Korea Academia-Industrial cooperation Society
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• v.12 no.2
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• pp.829-834
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• 2011

Exposure process is the most important technology to fabricate highly integrated circuit. Up to now, mask type lithography process has been generally used. However, it is not efficient for small quantity and/or frequently changing products. Therefore, maskless lithography technology is raised in exposure process. In this study, relations between multi-beam energy and overlay were analyzed. Exposure experiment of generating pattern was performed. It was from presented scan line by multi- beam simulation. As a result, optimal scan line distance was proposed by simulation, and micro pattern accuracy could be improved by exposure experiment using laser direct imaging system.

• Proceedings of the Optical Society of Korea Conference
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• 2009.02a
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• pp.225-226
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• 2009

본 연구에서는 마스크리스 노광장치의 두 프로젝션 광학계 사이에 있는 마이크로프리즘 어레이에 관한 연구이다. 마이크로프리즘의 원리와 종류에 대해 알아보고, 마이크로프리즘의 출사부의 모양에 따라 패턴의 모양이 변함을 확인하였다. 그리고 원하는 패턴을 만들 수 있는 마이크로프리즘을 설계하였다.

• Proceedings of the Korean Vacuum Society Conference
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• 2009.02a
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• pp.231.1-231.1
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• 2009

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2007.06a
• /
• pp.655-656
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• 2007

• Proceedings of the Optical Society of Korea Conference
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• 2008.02a
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• pp.207-208
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• 2008

• Proceedings of the Optical Society of Korea Conference
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• 2008.07a
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• pp.387-388
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• 2008

• Polymer Science and Technology
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• v.24 no.3
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• pp.245-249
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• 2013

• ETRI Journal
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• v.34 no.5
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• pp.706-712
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• 2012

In previous work, novel maskless bumping and no-flow underfill technologies for three-dimensional (3D) integrated circuit (IC) integration were developed. The bumping material, solder bump maker (SBM) composed of resin and solder powder, is designed to form low-volume solder bumps on a through silicon via (TSV) chip for the 3D IC integration through the conventional reflow process. To obtain the optimized volume of solder bumps using the SBM, the effect of the volumetric mixing ratio of resin and solder powder is studied in this paper. A no-flow underfill material named "fluxing underfill" is proposed for a simplified stacking process for the 3D IC integration. It can remove the oxide layer on solder bumps like flux and play a role of an underfill after the stacking process. The bumping process and the stacking process using the SBM and the fluxing underfill, respectively, for the TSV chips are carefully designed so that two-tier stacked TSV chips are sucessfully stacked.

• Journal of the Korean Graphic Arts Communication Society
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• v.26 no.2
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• pp.45-54
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• 2008

We have manufactured a photoresist which has excellent dispersity and good applying property due to 330 cps of viscosity for environment-friendly and economical maskless screen plate making. And the photoresist applied on the screen stretched was exposed with mask by UV-LED light source so we could manufacture the photoresist which proper for the UV light source. And it was developed by air spray with $1.7\;kgf/cm^2$ of injection pressure. Because of the excellence of power and resolution of the UV-LED light sourse, the pencil hardness and solvent resistance of curing photoresist film were excellent as those of conventional photoresist film. Moreover the $100{\mu}m$-width stripe image which has sharp edges was formed. So we confirmed a possibility of dry development process by air spray method.