• Journal of the Optical Society of Korea
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• 제6권4호
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• pp.165-171
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• 2002

By using a semiconductor optical amplifier and a cross-phase modulation wavelength converter, fundamental all-optical logic gates including NOT, AND, NOR, XOR, and XNOR have been newly proposed and implemented. Realization of these all-optical logic gates will bring up not only all-optical networks but also all-optical computing and signal processing.

• Journal of Electrical Engineering and information Science
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• 제3권1호
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• pp.8-13
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• 1998

Often ESOP(Exclusive Sum of Products) expressions provide more compact representations of logic functions and implemented circuits are known to be highly testable. Motivated by the merits of using XOR(Exclusive-OR) gates in circuit design, ESOP(Exclusive Sum of Products) expressions are considered s the input to the logic synthesis for random pattern testability. The problem of interest in this paper is whether ESOP expressions provide better random testability than corresponding SOP expressions of the given function. Since XOR gates are used to collect product terms of ESOP expression, fault propagation is not affected by any other product terms in the ESOP expression. Therefore the test set for a fault in ESOP expressions becomes larger than that of SOP expressions, thereby providing better random testability. Experimental results show that in many cases, ESOP expressions require much less random patterns compared to SOP expressions.

• 전기학회논문지
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• 제58권8호
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• pp.1580-1584
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• 2009

We have theoretically analyzed the monolithic integration of vertical cavity lasers with depleted optical thyristor (VCL-DOT) structure and experimentally demonstrated optical logic gates such as AND-gate, OR-gate, and INVERTER implemented by VCL-DOT for an optical programmable gate array. The optical AND and OR gates have been realized by changing a input bias of the single VCL-DOTs and all kinds of optical logic functions are also implemented by adjusting an intensity of the reference input beams into the differential VCL-DOTs. To achieve the high sensitivity, high slope efficiency and low threshold current, a small active region of lasing part and a wide detecting area are simultaneously designed by using a selective oxidation process. The fabricated devices clearly show nonlinear s-shaped current-voltage characteristics and lasing characteristics of a low threshold current with 0.65 mA and output spectrum at 854 nm.

• JSTS:Journal of Semiconductor Technology and Science
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• 제7권4호
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• pp.215-220
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• 2007

Leakage current of CMOS circuits has become a major factor in VLSI design these days. Although many circuit-level techniques have been developed, most of them require significant amount of designers' effort and are not aligned well with traditional VLSI design process. In this paper, we focus on technology mapping, which is one of the steps of logic synthesis when gates are selected from a particular library to implement a circuit. We take a radical approach to push the limit of technology mapping in its capability of suppressing leakage current: we use a probabilistic leakage (together with delay) as a cost function that drives the mapping; we consider pin reordering as one of options in the mapping; we increase the library size by employing gates with larger gate length; we employ a new flipflop that is specifically designed for low-leakage through selective increase of gate length. When all techniques are applied to several benchmark circuits, leakage saving of 46% on average is achieved with 45-nm predictive model, compared to the conventional technology mapping.

• 한국통신학회논문지
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• 제12권3호
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• pp.292-297
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• 1987

선진국에서 硏究 開發하고 있는 各種 高速 GaAs 集積論理 gate 回路의 調査, SPICE 分析 硏究結果 動作特性 回路集積度 有用性 動作條件 製造技術의 制限 및 應用等에 대한 比較値를 얻었다. 우리나라에서 政策硏究課題로 되어 있는 高速 GaAs IC's 硏究開發에 본 論文이 참고가 될 것으로 사료된다.

• 전자공학회논문지A
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• 제33A권3호
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• pp.176-186
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• 1996

As the density of VLSI increases, the conventional logic testing is not sufficient to completely detect the new faults generated in design and fabrication processing. Recently, IDDQ testing becomes very attractive since it can overcome the limitations of logic testing. In this paper, G-ATPG (gyeongsang automatic test pattern genrator) is designed which is able to be adapted to IDDQ testing for combinational CMOS VLSI. In G-ATPG, stuck-at, transistor stuck-on, GOS (gate oxide short)or bridging faults which can occur within priitive gate or XOR is modelled to primitive fault patterns and the concept of a fault-sensitizing gate is used to simulate only gates that need to sensitize the faulty gate because IDDQ test does not require the process of fault propagation. Primitive fault patterns are graded to reduce CPU time for the gates in a circuit whenever a test pattern is generated. the simulation results in bench mark circuits show that CPU time and fault coverage are enhanced more than the conventional ATPG using IDDQ test.

• 한국통신학회논문지
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• 제21권4호
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• pp.1059-1067
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• 1996

A 128/129 dual-modulus prescalar IC is designed for application to frequency synthesizers in high frequency communication systems. The FET logic used in this design is SCFL(Source Coupled FET Logic), employing depletion-mode 1.mu.m gate length GaAs MESFETs with the threshold voltage of -1.5V. This circuit consists of 8 flip-flops, 3 OR gates, 2 NOR gates, a modulus control buffer and I/O buffers, which are integrated with about 440 GaAs MESFETs on dimensions of 1.8mm. For $V_{DD}$ and $V_{SS}$ power supply voltages 5V and -3.3V Commonly used in TTL and ECL circuits are determined, respectively. The simulation results taking into account the threshold voltage variation of .+-.0.2V and the power supply variation of .+-.1V demonstrate that the designed prescalar can operate up to 2GHz. This prescalar is fabricated using the ETRI MMIC foundary process and the measured maximum operating frquency is 621MHz.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 1999년도 추계종합학술대회 논문집
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• pp.863-866
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• 1999

In this paper, we designed a Viterbi decoder with constraint length K=7, code rate R=1/2, encoder generator polynomial (171, 133)$_{8}$. This decoder makes use of 3-bit soft decision. We designed the Viterbi decoder using VHDL. We employed conventional logic circuit instead of ROM for branch metric units(BMUs) to reduce the number of gates. We adopted fully parallel structures for add-compare-select units(ACSUs). The size of the designed decoder is about 200, 000 gates.s.

• 한국산학기술학회논문지
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• 제15권9호
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• pp.5744-5749
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• 2014

다출력 논리식에서 공통식을 추출하는 것은 매우 중요한 기술이다. 본 논문에서는 배타 논리합 식 산출 원리를 이용해서 공통식을 추출하는 새로운 방법을 제안하였다. 산출된 논리식은 AND, OR, NOT 연산자만을 이용해서 전체 논리식을 표현하도록 고안하였다. 공통식 산출의 수행 시간과 리터럴 개수를 줄이기 위해서 선험 방법을 제안하였다. 실험 결과 제안한 방법이 기존의 방법들보다 리터럴 개수를 줄일 수 있음을 보였다.

• 대한전자공학회논문지
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• 제26권5호
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• pp.108-116
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• 1989

본 논문은 mixed level에서 VLSI회로의 논리설계를 검증하기 위한 논리 레벨 시뮬레이터인 LOSM(LOgic SIMulatos)에 대해서 논의한다. 본논문에서는 8개의 신호값과 2개의 신호강도를 이용하여 일반소자, 기능소자, transmission게이트 그리고 tri-state 게이트의 경우 종래의 시뮬레이터$^{[5~6,9]}$보다 정확한 결과를 얻을 수 있는 모델링 방법을 제안한다. LOSIM은 rise delay와 fall delay를 사용하여 주어진 회로에 대한 타이밍 분석과 hazard 분석이 가능하다. Hazard분석 및 검출은 5상태의 신호값과 time queue를 이용한 scheduled time을 이용한다. 개발된 알고리듬은 SUN-3/160 워크그테이션상에서 C-언어를 사용하여 구현되었으며, 정적 RAM셀과 비동기 회로에 대해서 프로그램의 동작 예재로 하였다.