• Journal of the Optical Society of Korea
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• v.6 no.4
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• pp.165-171
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• 2002

By using a semiconductor optical amplifier and a cross-phase modulation wavelength converter, fundamental all-optical logic gates including NOT, AND, NOR, XOR, and XNOR have been newly proposed and implemented. Realization of these all-optical logic gates will bring up not only all-optical networks but also all-optical computing and signal processing.

• Journal of Electrical Engineering and information Science
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• v.3 no.1
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• pp.8-13
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• 1998

Often ESOP(Exclusive Sum of Products) expressions provide more compact representations of logic functions and implemented circuits are known to be highly testable. Motivated by the merits of using XOR(Exclusive-OR) gates in circuit design, ESOP(Exclusive Sum of Products) expressions are considered s the input to the logic synthesis for random pattern testability. The problem of interest in this paper is whether ESOP expressions provide better random testability than corresponding SOP expressions of the given function. Since XOR gates are used to collect product terms of ESOP expression, fault propagation is not affected by any other product terms in the ESOP expression. Therefore the test set for a fault in ESOP expressions becomes larger than that of SOP expressions, thereby providing better random testability. Experimental results show that in many cases, ESOP expressions require much less random patterns compared to SOP expressions.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.58 no.8
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• pp.1580-1584
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• 2009

We have theoretically analyzed the monolithic integration of vertical cavity lasers with depleted optical thyristor (VCL-DOT) structure and experimentally demonstrated optical logic gates such as AND-gate, OR-gate, and INVERTER implemented by VCL-DOT for an optical programmable gate array. The optical AND and OR gates have been realized by changing a input bias of the single VCL-DOTs and all kinds of optical logic functions are also implemented by adjusting an intensity of the reference input beams into the differential VCL-DOTs. To achieve the high sensitivity, high slope efficiency and low threshold current, a small active region of lasing part and a wide detecting area are simultaneously designed by using a selective oxidation process. The fabricated devices clearly show nonlinear s-shaped current-voltage characteristics and lasing characteristics of a low threshold current with 0.65 mA and output spectrum at 854 nm.

• JSTS:Journal of Semiconductor Technology and Science
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• v.7 no.4
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• pp.215-220
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• 2007

Leakage current of CMOS circuits has become a major factor in VLSI design these days. Although many circuit-level techniques have been developed, most of them require significant amount of designers' effort and are not aligned well with traditional VLSI design process. In this paper, we focus on technology mapping, which is one of the steps of logic synthesis when gates are selected from a particular library to implement a circuit. We take a radical approach to push the limit of technology mapping in its capability of suppressing leakage current: we use a probabilistic leakage (together with delay) as a cost function that drives the mapping; we consider pin reordering as one of options in the mapping; we increase the library size by employing gates with larger gate length; we employ a new flipflop that is specifically designed for low-leakage through selective increase of gate length. When all techniques are applied to several benchmark circuits, leakage saving of 46% on average is achieved with 45-nm predictive model, compared to the conventional technology mapping.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.12 no.3
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• pp.292-297
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• 1987

High-speed GaAs IC Logic Gates being widely studied and developed in the develped countries were reanalysed and reexamined through SPICE simulations. And, furthermore, the detailed examinations of their characteristics such as operation characteristics and conditions, integration densities, service-ableness, and the limitation of both fabrication and application, give us a clue of the feasibility and application of them in the real integrated circuits. This paper will provide a reasonably good guide to set-up one of goals or future development of high-speed GaAs IC's being led by the goverment recently in our country.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.3
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• pp.176-186
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• 1996

As the density of VLSI increases, the conventional logic testing is not sufficient to completely detect the new faults generated in design and fabrication processing. Recently, IDDQ testing becomes very attractive since it can overcome the limitations of logic testing. In this paper, G-ATPG (gyeongsang automatic test pattern genrator) is designed which is able to be adapted to IDDQ testing for combinational CMOS VLSI. In G-ATPG, stuck-at, transistor stuck-on, GOS (gate oxide short)or bridging faults which can occur within priitive gate or XOR is modelled to primitive fault patterns and the concept of a fault-sensitizing gate is used to simulate only gates that need to sensitize the faulty gate because IDDQ test does not require the process of fault propagation. Primitive fault patterns are graded to reduce CPU time for the gates in a circuit whenever a test pattern is generated. the simulation results in bench mark circuits show that CPU time and fault coverage are enhanced more than the conventional ATPG using IDDQ test.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.21 no.4
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• pp.1059-1067
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• 1996

A 128/129 dual-modulus prescalar IC is designed for application to frequency synthesizers in high frequency communication systems. The FET logic used in this design is SCFL(Source Coupled FET Logic), employing depletion-mode 1.mu.m gate length GaAs MESFETs with the threshold voltage of -1.5V. This circuit consists of 8 flip-flops, 3 OR gates, 2 NOR gates, a modulus control buffer and I/O buffers, which are integrated with about 440 GaAs MESFETs on dimensions of 1.8mm. For $V_{DD}$ and $V_{SS}$ power supply voltages 5V and -3.3V Commonly used in TTL and ECL circuits are determined, respectively. The simulation results taking into account the threshold voltage variation of .+-.0.2V and the power supply variation of .+-.1V demonstrate that the designed prescalar can operate up to 2GHz. This prescalar is fabricated using the ETRI MMIC foundary process and the measured maximum operating frquency is 621MHz.

• Proceedings of the IEEK Conference
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• 1999.11a
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• pp.863-866
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• 1999

In this paper, we designed a Viterbi decoder with constraint length K=7, code rate R=1/2, encoder generator polynomial (171, 133)$_{8}$. This decoder makes use of 3-bit soft decision. We designed the Viterbi decoder using VHDL. We employed conventional logic circuit instead of ROM for branch metric units(BMUs) to reduce the number of gates. We adopted fully parallel structures for add-compare-select units(ACSUs). The size of the designed decoder is about 200, 000 gates.s.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.15 no.9
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• pp.5744-5749
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• 2014

An extraction technique for a common logic expression is an extremely important part of multiple-output logic synthesis. This paper presents a new Boolean extraction technique using an exclusive-OR logic synthesis principle. The logic circuits produced only have AND, OR and NOT gates. Heuristic methods can also be applied to reduce the execution time and the number of literals. The experimental results showed improvements in the literal counts over the previous methods.

• Journal of the Korean Institute of Telematics and Electronics
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• v.26 no.5
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• pp.108-116
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• 1989

The simulator described here-LOSIM(LOgic SIMulator)-was developed to verify the logic design for VLSI(Very Large Scale Integrated) circuits at mixed level. In this paper, we present a modeling approach to obtain more accurate results than conventional logic simulators [5-6,9] for general elements, functional elements, transmission gates and tri-state gates using eight signal values and two gignal strengths. LOSIM has the capability which can perform timing and hazard analysis by using assignable rise and fall delays. We also prosent an efficient algorithm to accurately detectdynamic and static hazards which may be caused by the circuit delays. Our approach is based on five logic values and the scheduled time. LOSIM has been implemented on a UN-3/160 workstation running Berkeley 4.2 UNIX, and the program is written in C language. Static RAM cell and asynchronous circuit are illustrated as an example.