• 대한안전경영과학회:학술대회논문집
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• 대한안전경영과학회 2009년도 춘계학술대회
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• pp.523-529
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• 2009

The ACF(Anisotropic Conductive Film) is used for bonding Drive IC and OLED display device panel. If ACF bonding process is problem, a malfunction of line defect can occur. Because electric resistance increase between the panel and drive IC after a period of time, drive IC can not supply enough current to the panel. This paper is studied on a method of test for line defect.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2003년도 하계종합학술대회 논문집 Ⅳ
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• pp.1783-1786
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• 2003

In this paper, an automated line-defect detection method for TFT-LCD panel is presented. A DFB(Directional Filter Bank) and line-projection method are used to find line-defect which is one of the major defects occurred in TFT-LCD panel. The experimental results show that the proposed algorithm gave promising results for applying automated inspection technique for TFT-LCD panel.

• Journal of Welding and Joining
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• 제19권6호
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• pp.608-613
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• 2001

In this study, the rotary bending fatigue test was carried out with two kinds of base metal, martensite stainless steel STR3 and austenite stainless steel STR35 and the dissimilar friction welded material with them. To compare the fatigue fifes according to the notch positions, the small circular defect was worked on the bonded line, 1.0mm and 0.5mm distance form the bonded line. The fatigue limits of the STR3 and STR35 base metal were 429.0MPa and 409.4MPa respectably. In comparison with fatigue life at the same notch positions, the STR35 specimens showed about 190% for base metal, 82% for 1.0mm distance notched specimens higher than that of the STR3. But the fatigue life of the 0.5mm distance notched STR35 specimen showed about 35% lower than that of the STR3 specimen. And the bonded line notched specimen was much lower fatigue life than the other specimens because of separation of the bonded line.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1999년도 하계학술대회 논문집 B
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• pp.668-670
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• 1999

We have developed a automatic surface inspection system for cold Rolled strips in steel making process for several years. We have experienced the various kinds of surface inspection systems, including linear CCD camera type and the laser type inspection system which was installed in cold rolled strips production lines. But, we did not satisfied with these inspection systems owing to insufficient detection and classification rate, real time processing performance and limited line speed of real production lines. In order to increase detection and computing power, we have used the Dark Field illumination with Infra_Red LED, Bright Field illumination with Xenon Lamp, Parallel Computing Processor with Area typed CCD camera and full software based image processing technique for the ease up_grading and maintenance. In this paper, we introduced the automatic inspection system and real time image processing technique using the Object Detection, Defect Detection, Classification algorithms. As a result of experiment, under the situation of the high speed processed line(max 1000 meter per minute) defect detection is above 90% for all occurred defects in real line, defect name classification rate is about 80% for most frequently occurred 8 defect, and defect grade classification rate is 84% for name classified defect.

• 비파괴검사학회지
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• 제22권6호
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• pp.637-642
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• 2002

An arc-shaped line array slit has been used for the laser generation of focused Lamb waves. The spatially expanded Nd:YAG pulse laser was illuminated through the arc-shaped line array slit on the surface of a sample plate to generate the Lamb waves of the same pattern as the slit. Then the generated Lamb waves were focused at the focal point of which distance from the slit position is dependent on the curvature of slit arc. The proposed method showed better spatial resolution than the conventional linear array slit in the detection of laser machined linear defect and drill machined circular defect on aluminum plates of 2mm thickness. Using the focused waves, we could detect the linear defect and the circular defect with the improvement of spatial resolution. The method can also be combined with the scanning mechanism to get an image just like by the scanning acoustic microscope(SAM).

• 한국정밀공학회지
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• 제21권12호
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• pp.92-99
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• 2004

The formation degree of sustain (ITO pattern) decides quality of PDP (Plasma Display Panel). For this reason, it makes efforts in searching defects more than 30 un as 100%. Now, the existing inspection is dependent upon naked eye or microscope in off-line PDP manufacturing process. In this study developed prototype inspection system of PDP 170 glass is based on line-scan mechanism. Developed system creates information that detects and sorts kinds of defect automatically. Designed inspection technology adopts multi-vision method by slip-beam formation for the minimum of inspection time and detection algorithm is embodied in detection ability of developed system. Designed algorithm had to make good use of kernel matrix that draws up an approach to geometry. A characteristic of defects, as pin hole, substance, protrusion, are extracted from blob analysis method. Defects, as open, short, spots and et al, are distinguished by line type inspection algorithm. In experiment, we could have ensured ability of inspection that can be detected with reliability of up to 95% in about 60 seconds.

• 한국소성가공학회:학술대회논문집
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• 한국소성가공학회 1999년도 제3회 압연심포지엄 논문집 압연기술의 미래개척 (Exploitation of Future Rolling Technologies)
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• pp.412-422
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• 1999

Scale defects generated on the strip surface in a tandem finishing mill line are collected from the strip trapped among the production mills by freezing the growing scale on the strip by the melt glass coating and shutting down the line simultaneously. The samples observed of its cross sectional figure showed the process of scale defect formation where the defects are formed at the base metal surface by thicker oxidized scale during each rolling passes. The properties of the oxidized layer growth both at rolling and inter-rolling are detected down sized rolling test simulating carefully the rolling condition of the production line. The thickness of the oxidized layer at each rolling pass are simulated numerically. The critical scale thickness to avoid the defect formation is determined through the expression of mutual relation between oxidized layer thickness and the lanks of the strip called quality for the scale defects. The scale growth of scale less than the critical thickness and also to keep the bulk temperature tuning the water flow rate and cooling time appropriately. Two units of Inerstand Cooler are designed and settled among the first three stands in the production line. Two units of scale defect is counted from the recoiled strip and the results showed distinct decrease of the defects comparing to the conventionaly rolled products.

• 한국안광학회지
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• 제6권1호
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• pp.139-144
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• 2001

색각 검사용 Farnsworth Test Panel D-15를 CIELab color space 좌표에서 분석하기 위해 380~780nm의 반사광 spectrum 세기를 측정하였다. Test Panel D-15는 CIELab의 좌표(a,b)상에서 채도가 앞은 원점 근방에 위치하였다. 정상인은 색 차가 작은 색을 비슷한 색으로 지각하였고, 색각 이상자는 색차와 무관한 혼돈색 line과 중성점에 의존하였다. 색각이상인 제1색각 이상, 제2색각 이상, r-g defect, y-b defect의 경우 중성점 위치(a,b)는 각각(2.12, 1.02), (4.25, 2.05), (2.51, 0.25), (1.20, -1.10)였다.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2005년도 춘계학술대회 논문집
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• pp.946-949
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• 2005

This paper deals with the algorithm development that inspects defects such as Bright Defect Dots, Dark Defect Dots, and Line Defect caused by the process of LCD(Liquid Crystal Display). While most of LCD production process is automated, the inspection of LCD panel and its appearance depends on manual process. So, the quality of the inspection is affected by the condition of worker. Especially, the more LCD size increases, the more the worker feels fatigued, which causes the probability of miss judgement. So, the automated inspection is required to manage the consistent quality of the product and reduce the production costs. In this paper, to solve these problems, we developed the imaging processing algorithm to inspect the defects in captured image of LCD. Experimental results reveal that we can recognize various types of defect of LCD with good accuracy and high speed.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2009년도 춘계학술대회 논문집
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• pp.49-51
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• 2009

Photonic crystal is a dielectric materials or a set of different dielectric materials with periodic structure of refractive index. Line defect obtained by leaving out a row of rod along the $\Gamma$-X direction. We showed the change of group velocity in waveguide mode and found a small group velocity. Characteristic of the small group velocity described by electric field distribution. As the phase variation, small group velocity confirmed from positive to negative.