• Journal of Magnetics
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• 제18권3호
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• pp.317-320
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• 2013

We studied the polarization state in an apertureless scanning near-field microscopy (a-SNOM) operating in reflection mode by using three-dimensional Finite-difference Time-domain (FDTD) method. As a result, the electric field around tip apex in the near-field region enhanced four times stronger than the incident light for ppolarization when the tip-sample separation was 10 nm. We find that the p- and s-polarization state is maintained for the scattered light when the probe is perpendicular to the sample. When the probe is not perpendicular to the sample, the polarization state of scattered light will rotate an angle that equals to the inclination angle of probe with p-polarization illumination. On the other hand, the polarization state will not rotate with s-polarization illumination.

• Journal of the Optical Society of Korea
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• 제19권1호
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• pp.22-28
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• 2015

We propose a new method for improving the phase contrast of a multiphase digital holographic microscope using a spatial light modulator (SLM). Using the SLM as the annulus, our method improves the light contrast of the object edge to achieve higher accuracy. We demonstrate a digital holographic microscopy technique that provides a 30% improvement in the phase contrast compared to conventional microscopy, which utilizes a mechanical annulus. The phase-contrast improvement allows the 3D reconstructed hologram to be determined more precisely.

• Current Optics and Photonics
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• 제1권4호
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• pp.358-363
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• 2017

In this study, we present a detailed investigation of luminescence properties of a blue light-emitting diode using InGaN/GaN (indium component is 17.43%) multiple quantum wells as the active region grown on patterned sapphire substrate by low-pressure metal-organic chemical vapor deposition (MOCVD). High-resolution X-ray diffraction (HRXRD), atomic force microscopy (AFM), scanning electron microscopy (SEM), Raman scattering (RS) and photoluminescence (PL) measurements are employed to study the crystal quality, the threading dislocation density, surface morphology, residual strain existing in the active region and optical properties. We conclude that the crystalline quality and surface morphology can be greatly improved, the red-shift of peak wavelength is eliminated and the superior blue light LED can be obtained because the residual strain that existed in the active region can be relaxed when the LED is grown on patterned sapphire substrate (PSS). We discuss the mechanisms of growing on PSS to enhance the superior luminescence properties of blue light LED from the viewpoint of residual strain in the active region.

• 한국광학회지
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• 제10권5호
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• pp.369-372
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• 1999

마이켈슨 간섭계를 이용한 간섭계형 현미경을 구성하고 특성을 조사하였다. 본 마이켈슨 간섭계형 현미경은 시료 표면의 반사 신호와 거울의 반사 신호가 합쳐져서 일어난 간섭 신호를 이용해서 3차원 영상을 얻는다. He-Ne(λ=633 nm)레이저를 사용한 마이켈슨 간섭계는 반파장 (312.5 nm)의 경로차가 생길 때마다 같은 무늬가 반복해져 나타난다. 본 마이켈슨 간섭계형 현미경은 이러한 간섭 신호를 이용하기 때문에 white-light interferometer 수준의 수직 해상도를 얻을 수 있었다. 구성한 마이켈슨 간섭계형 현미경으로 얻은 영상을 공초점 현미경의 영상과 비교 분석하였다.

• Journal of the Optical Society of Korea
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• 제20권6호
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• pp.784-793
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• 2016

We present a single shot low coherence white light Hilbert phase microscopy (WL-HPM) for quantitative phase imaging of Si optoelectronic devices, i.e., Si integrated circuits (Si-ICs) and Si solar cells. White light interferograms were recorded by a color CCD camera and the interferogram is decomposed into the three colors red, green and blue. Spatial carrier frequency of the WL interferogram was increased sufficiently by means of introducing a tilt in the interferometer. Hilbert transform fringe analysis was used to reconstruct the phase map for red, green and blue colors from the single interferogram. 3D step height map of Si-ICs and Si solar cells was reconstructed at multiple wavelengths from a single interferogram. Experimental results were compared with Atomic Force Microscopy and they were found to be close to each other. The present technique is non-contact, full-field and fast for the determination of surface roughness variation and morphological features of the objects at multiple wavelengths.

• 한국광학회지
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• 제23권4호
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• pp.135-142
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• 2012

본 연구에서는 공동경로간섭계(common-path interferometer)에 기반한 회절위상현미경(diffraction phase microscopy)을 이용한 광섬유의 굴절률 프로파일(refractive index profile) 측정기술을 개발하였다. 투과형 회절격자를 이용하여 광섬유 시료를 통과한 빛으로부터 핀홀을 이용하여 영의 공간주파수 성분만을 갖는 기준광을 생성하고, 기준광을 다시 시료의 위상정보를 갖는 시료광과 간섭시키는 방법을 통해 시료의 위상정보를 가진 간섭무늬를 형성시켰다. 이렇게 얻어진 간섭 이미지로부터 수치적 처리과정을 거쳐 공간적 위상정보 곧, 위상 이미지를 획득하고 이 데이터를 역아벨변환(inverse Abel transform)을 통해 굴절률 프로파일로 변환할 수 있었다. 이때 클래딩과 광섬유 주변의 매질 사이의 굴절률차로 인해 발생하는 배경위상을 이론적으로 얻어진 함수형태에 맞춰 예측하고 이를 측정된 위상에서 제거하는 배경위상제거 방법을 개발하여 사용하였다. 이를 통해 광섬유 코어 부근의 위상정보만으로도 굴절률 프로파일을 성공적으로 이뤄질 수 있음이 입증되었다. 본 연구를 통하여 회절위상현미경 특유의 측정 안정성과 편의성을 가진 광섬유 굴절률 프로파일 측정장치를 개발하였고 광섬유 및 도파로의 굴절률 분포를 비파괴적으로 분석할 수 있어 광섬유 및 광섬유소자 개발에 활용될 수 있을 것으로 기대된다.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2005년도 International Meeting on Information Displayvol.I
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• pp.493-495
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• 2005

The director profiles of the Bloch walls are directly visualized using fluorescence confocal polarizing microscopy. Both pure twist Bloch walls and diffuse Bloch walls are analyzed. Polar anchoring energy was measured from optical simulation of the transmitted light interference pattern or the fluorescence intensity profile of a pure twist wall..

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2002년도 춘계학술대회 논문집
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• pp.187-190
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• 2002

Confocal microscopy is very popular technology in bio-medical inspection due to its ability to reject background signals and to measure very thin slide of thick specimens, which is called optical sectioning. But intensity of detected signal in fluorescence type confocal microscopy is so small that only 0.2% of emitted fluorescence light can be detected in the best case. In this paper, we proposed the reflecting optical system to improve the detection intensity and designed the optical system by optimal design method. At the end of the paper, we analyzed the characteristics of the proposed reflecting optical system.

• 한국재료학회:학술대회논문집
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• 한국재료학회 2011년도 춘계학술발표대회
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• pp.22.2-22.2
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• 2011

Reliability and degradation mechanism of conventional phosphor-converted white GaN-based light-emitting diodes (LEDs) were investigated. Under electro-thermal stress condition, the optical output degraded rapidly at the initial stress time accompanied by the change of chromatic properties. This could be attributed to the optical degradation of packaged materials, in particular, the browning of encapsulants and the darkening of reflective packages. At longer stress times, the optical output gradually decreased according to the degree of the reverse leakage currents, namely, the generation ofnonradiative recombination defects. This indicates that the optical degradation of white LEDs are dominated by the darkening of packaged materials and the generation of defects depending on the injection current and ambient temperatures. Using analyses of electroluminescence spectra, optical microscopy, electrical, optical, and thermal properties, optical degradations of white LEDs are discussed.

• Journal of the Optical Society of Korea
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• 제15권1호
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• pp.9-14
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• 2011

In this study, the internal structure of an optical waveguide embedded in a flexible optical circuit board is observed with a confocal microscope. In order to increase the light reflection from an internal material interface with a very small index difference, and thus enhance the signal contrast, a theta microscopy scheme has been integrated into a conventional confocal microscope, and a high NA oil-immersion lens has been used. The interface reflectivity is increased from roughly 0.0015% to 0.025% by the proposed method, and the internal structure can thus be successfully measured.