• Journal of Magnetics
• /
• v.18 no.3
• /
• pp.317-320
• /
• 2013

We studied the polarization state in an apertureless scanning near-field microscopy (a-SNOM) operating in reflection mode by using three-dimensional Finite-difference Time-domain (FDTD) method. As a result, the electric field around tip apex in the near-field region enhanced four times stronger than the incident light for ppolarization when the tip-sample separation was 10 nm. We find that the p- and s-polarization state is maintained for the scattered light when the probe is perpendicular to the sample. When the probe is not perpendicular to the sample, the polarization state of scattered light will rotate an angle that equals to the inclination angle of probe with p-polarization illumination. On the other hand, the polarization state will not rotate with s-polarization illumination.

• Journal of the Optical Society of Korea
• /
• v.19 no.1
• /
• pp.22-28
• /
• 2015

We propose a new method for improving the phase contrast of a multiphase digital holographic microscope using a spatial light modulator (SLM). Using the SLM as the annulus, our method improves the light contrast of the object edge to achieve higher accuracy. We demonstrate a digital holographic microscopy technique that provides a 30% improvement in the phase contrast compared to conventional microscopy, which utilizes a mechanical annulus. The phase-contrast improvement allows the 3D reconstructed hologram to be determined more precisely.

• Current Optics and Photonics
• /
• v.1 no.4
• /
• pp.358-363
• /
• 2017

In this study, we present a detailed investigation of luminescence properties of a blue light-emitting diode using InGaN/GaN (indium component is 17.43%) multiple quantum wells as the active region grown on patterned sapphire substrate by low-pressure metal-organic chemical vapor deposition (MOCVD). High-resolution X-ray diffraction (HRXRD), atomic force microscopy (AFM), scanning electron microscopy (SEM), Raman scattering (RS) and photoluminescence (PL) measurements are employed to study the crystal quality, the threading dislocation density, surface morphology, residual strain existing in the active region and optical properties. We conclude that the crystalline quality and surface morphology can be greatly improved, the red-shift of peak wavelength is eliminated and the superior blue light LED can be obtained because the residual strain that existed in the active region can be relaxed when the LED is grown on patterned sapphire substrate (PSS). We discuss the mechanisms of growing on PSS to enhance the superior luminescence properties of blue light LED from the viewpoint of residual strain in the active region.

• Korean Journal of Optics and Photonics
• /
• v.10 no.5
• /
• pp.369-372
• /
• 1999

We have constructed an interferometric microscopy using a Michelson interferometer and a He-Ne laser. The three dimensional image was obtained by the interference from the reflected signal by a sample surface and from the reflected signal by a mirror. The axial resolution obtained by Michelson interferometric microscopy is as good as that of the white-light interferometer, but the same fringe is obtained when optical path difference is half-wavelength. The image from Michelson interferometric microscopy was compared with the images from the various types of confocal microscopy.

• Journal of the Optical Society of Korea
• /
• v.20 no.6
• /
• pp.784-793
• /
• 2016

We present a single shot low coherence white light Hilbert phase microscopy (WL-HPM) for quantitative phase imaging of Si optoelectronic devices, i.e., Si integrated circuits (Si-ICs) and Si solar cells. White light interferograms were recorded by a color CCD camera and the interferogram is decomposed into the three colors red, green and blue. Spatial carrier frequency of the WL interferogram was increased sufficiently by means of introducing a tilt in the interferometer. Hilbert transform fringe analysis was used to reconstruct the phase map for red, green and blue colors from the single interferogram. 3D step height map of Si-ICs and Si solar cells was reconstructed at multiple wavelengths from a single interferogram. Experimental results were compared with Atomic Force Microscopy and they were found to be close to each other. The present technique is non-contact, full-field and fast for the determination of surface roughness variation and morphological features of the objects at multiple wavelengths.

• Korean Journal of Optics and Photonics
• /
• v.23 no.4
• /
• pp.135-142
• /
• 2012

We have developed a measurement method of the refractive index profile of an optical fiber by using diffraction phase microscopy. In the microscope system, the reference light was extracted directly from the probe light that passed through the sample by means of pinhole filtering with a diffraction grating. The spatial interference pattern produced by the probe light and the reference light was processed to generate the phase image of the sample fiber. The index profile was obtained by the inverse Abel transform of the phase profile. In order to remove the background phase that originated from the index difference between the cladding and the surrounding medium, the background phase was calculated from the phase data of the cladding to make a core phase profile that can be directly transformed to the index profile of the core without the full phase image that includes the entire cladding part.

• 한국정보디스플레이학회:학술대회논문집
• /
• 2005.07a
• /
• pp.493-495
• /
• 2005

The director profiles of the Bloch walls are directly visualized using fluorescence confocal polarizing microscopy. Both pure twist Bloch walls and diffuse Bloch walls are analyzed. Polar anchoring energy was measured from optical simulation of the transmitted light interference pattern or the fluorescence intensity profile of a pure twist wall..

• Proceedings of the Korean Society of Precision Engineering Conference
• /
• 2002.05a
• /
• pp.187-190
• /
• 2002

Confocal microscopy is very popular technology in bio-medical inspection due to its ability to reject background signals and to measure very thin slide of thick specimens, which is called optical sectioning. But intensity of detected signal in fluorescence type confocal microscopy is so small that only 0.2% of emitted fluorescence light can be detected in the best case. In this paper, we proposed the reflecting optical system to improve the detection intensity and designed the optical system by optimal design method. At the end of the paper, we analyzed the characteristics of the proposed reflecting optical system.

• Proceedings of the Materials Research Society of Korea Conference
• /
• 2011.05a
• /
• pp.22.2-22.2
• /
• 2011

Reliability and degradation mechanism of conventional phosphor-converted white GaN-based light-emitting diodes (LEDs) were investigated. Under electro-thermal stress condition, the optical output degraded rapidly at the initial stress time accompanied by the change of chromatic properties. This could be attributed to the optical degradation of packaged materials, in particular, the browning of encapsulants and the darkening of reflective packages. At longer stress times, the optical output gradually decreased according to the degree of the reverse leakage currents, namely, the generation ofnonradiative recombination defects. This indicates that the optical degradation of white LEDs are dominated by the darkening of packaged materials and the generation of defects depending on the injection current and ambient temperatures. Using analyses of electroluminescence spectra, optical microscopy, electrical, optical, and thermal properties, optical degradations of white LEDs are discussed.

• Journal of the Optical Society of Korea
• /
• v.15 no.1
• /
• pp.9-14
• /
• 2011

In this study, the internal structure of an optical waveguide embedded in a flexible optical circuit board is observed with a confocal microscope. In order to increase the light reflection from an internal material interface with a very small index difference, and thus enhance the signal contrast, a theta microscopy scheme has been integrated into a conventional confocal microscope, and a high NA oil-immersion lens has been used. The interface reflectivity is increased from roughly 0.0015% to 0.025% by the proposed method, and the internal structure can thus be successfully measured.