• Title/Summary/Keyword: layer-by-layer process

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Stability analysis of a three-layer film casting process

  • Lee, Joo-Sung;Shin, Dong-Myeong;Jung, Hyun-Wook;Hyun, Jae-Chun
    • Korea-Australia Rheology Journal
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    • v.19 no.1
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    • pp.27-33
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    • 2007
  • The co-extrusion of multi-layer films has been studied with the focus on its process stability. As in the single-layer film casting process, the productivity of the industrially important multi-layer film casting and the quality of thus produced films have often been hampered by various instabilities occurring in the process including draw resonance, a supercritical Hopfbifurcation instability, frequently encountered when the draw ratio is raised beyond a certain critical value. In this study, this draw resonance instability along with the neck-in of the film width has been investigated for a three-layer film casting using a varying width non-isothermal 1-D model of the system with Phan-Thien and Tanner (PTT) constitutive equation known for its robustness in portraying extensional deformation processes. The effects of various process conditions, e.g., the aspect ratio, the thickness ratio of the individual film layers, and cooling of the process, on the stability have been examined through the nonlinear stability analysis.

Oxidation Process of Epitaxial Ni(111) Thin Films Deposited on GaN/Sapphire(0001) Substrates (GaN/Sapphire(0001) 기판위에 증착한 epitaxial Ni(111) 박막의 산화 과정)

  • Seo, S.H.;Kang, Hyon-Chol
    • Journal of the Korean Society for Heat Treatment
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    • v.22 no.6
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    • pp.354-360
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    • 2009
  • This paper reports the oxidation mechanism of epitaxial Ni thin films grown on GaN/sapphire(0001) substrates, investigated by real-time x-ray diffraction and scanning electron microscopy. At the initial stage of oxidation process, a thin NiO layer with a thickness of ${\sim}50\;{\AA}$ was formed on top of the Ni films. The growth of such NiO layer was saturated and then served as a passive oxide layer for the further oxidation process. For the second oxidation stage, host Ni atoms diffused out to the surfaces of initially formed NiO layer through the defects running vertically to form NiO grains, while the sites that were occupied by host Ni, became voids. The crystallographic properties of resultant NiO films, such as grain size and mosaic distribution, rely highly on the oxidation temperatures.

Perovskite Solar Cells through Application of Hole Transporting Layers based on Vacuum Thermal Evaporation (진공 열 증착 기반의 정공수송층 적용을 통한 페로브스카이트 태양전지)

  • Kim, Hye Seung;Song, Myoung Hoon
    • Current Photovoltaic Research
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    • v.10 no.1
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    • pp.23-27
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    • 2022
  • In this study, we investigate organic-inorganic halide perovskite solar cells with a vacuum thermal evaporated hole transporting layer (NPB/MoO3-x). By replacing solution process based Spiro-MeOTAD with vacuum thermal evaporation based NPB/MoO3-x, a thin hole transporting layer was implemented. In addition, parasitic absorption that may occur during the doping process was eliminated by excluding solution process doping. In a solar cell with a thin vacuum thermal evaporated hole transporting layer, the short-circuit current density (Jsc) increased to 23.93 mA/cm2, resulting in the highest power converstion efficiency (PCE) at 18.76%. Considering these results, it is essential to control the thickness of hole transporting layer located at the top in solar cell configuration.

Magnetotransport Properties of Co-Fe/Al-O/Co-Fe Tunnel Junctions Oxidized with Microwave Excited Plasma

  • Nishikawa, Kazuhiro;Orata, Satoshi;Shoyama, Toshihiro;Cho, Wan-Sick;Yoon, Tae-Sick;Tsunoda, Masakiyo;Takahashi, Migaku
    • Journal of Magnetics
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    • v.7 no.3
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    • pp.63-71
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    • 2002
  • Three fabrication techniques for forming thin barrier layer with uniform thickness and large barrier height in magnetic tunnel junction (MTJ) are discussed. First, the effect of immiscible element addition to Cu layer, a high conducting layer generally placed under the MTJ, is investigated in order to reduce the surface roughness of the bottom ferromagnetic layer, on which the barrier is formed. The Ag addition to the Cu layer successfully realizes the smooth surface of the ferromagnetic layer because of the suppression of the grain growth of Cu. Second, a new plasma source, characterized as low electron energy of 1 eV and high density of $10^{12}$ $cm^{-3}$, is introduced to the Al oxidation process in MTJ fabrication in order to reduce damages to the barrier layer by the ion-bombardment. The magnetotransport properties of the MTJs are investigated as a function of the annealing temperature. As a peculiar feature, the monotonous decrease of resistance area product (RA) is observed with increasing the annealing temperature. The decrease of the RA is due to the decrease of the effective barrier width. Third, the influence of the mixed inert gas species for plasma oxidization process of metallic Al layer on the tunnel magnetoresistance (TMR) was investigated. By the use of Kr-O$_2$ plasma for Al oxidation process, a 58.8 % of MR ratio was obtained at room temperature after annealing the junction at $300{^{\circ}C}$, while the achieved TMR ratio of the MTJ fabricated with usual Ar-$0_2$ plasma remained 48.4%. A faster oxidization rate of the Al layer by using Kr-O$_2$ plasma is a possible cause to prevent the over oxidization of Al layer and to realize a large magnetoresistance.

Influence of surface roughness of ZnO layer on the growth of polycrystalline Si layer via aluminum-induced layer exchange process

  • Choi, Sung-Kuk;Chang, Won-Beom;Jung, Soo-Hoon;Hara, Kosuke;Watanabe, Haruna;Usami, Noritaka;Chang, Ji-Ho
    • Journal of Advanced Marine Engineering and Technology
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    • v.40 no.8
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    • pp.692-697
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    • 2016
  • This study investigated the effect of surface roughness of zinc oxide (ZnO) layer on the growth of polycrystalline Si layer via an Al-induced layer exchange process. It was found that the growth rate, grain size, crystallization fraction, and preferential orientation of the polycrystalline Si layer were strongly influenced by the surface roughness of the underlying ZnO layer. As the roughness of the ZnO surface increased, a higher growth rate (~40 min) and preferential Si (100) orientation were obtained because of the spatial concentration fluctuations in the Al-Si alloy, induced by the surface roughness of the underlying ZnO layer.

Wear Analysis of the Ti-N Coated Punch in Piercing According to the Volume of Production (생산수량에 따른 Ti-N 코팅 펀치의 마멸해석)

  • 황상홍;고대철;김병민
    • Journal of the Korean Society for Precision Engineering
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    • v.17 no.3
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    • pp.149-157
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    • 2000
  • Tool wear in the shearing process such as blanking, piercing and trimming is very important, because it has great effects on the dimensional accuracy, working efficiency and economy. Most of tools in the shearing process have the coated layer at surface fur good wear and corrosion resistance. When the surface of tool is teated, the wear Phenomena of coated surface layer and inner layer may be different. This paper describes a computer modelling technique by the finite element method in order to investigate the wear mechanism and to predict the wear profile of Ti-N coated tool in piercing process according to the volume of Production. Wear coefficients of the coated layer and inner layer are obtained through Pin-on-Disk wear test, respectively. To verify the effectiveness of the suggested technique, the technique is applied to wear analysis in piercing recess of piston pin and simulation results are compared with experimental ones.

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Effect of Structure Change in Second-Generation Superconducting Wire Stabilization Layer on Resistivity Characteristics (2세대 초전도 선 안정화 층 구조변화가 비저항 특성에 미치는 영향)

  • Ban, Sang-Jae;Du, Ho-Ik;Jeong, Hyun-Gi;Doo, Seung-Gyu;Yang, Sung-Chae
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.35 no.2
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    • pp.172-177
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    • 2022
  • The quench voltage of the second-generation superconducting wire is affected by the resistivity characteristics of the stabilization layer. The specific resistance of the stabilization layer can be changed by the deposition process using RF magnetron sputtering. In this paper, a thin film made of a homogeneous material (Ag) and a dissimilar material (Cu) was deposited on the stabilization layer of the second-generation superconducting wire through RF magnetron sputtering. We found that the specific resistance was reduced by increasing the thickness of the stabilization layer. The reduction in the resistivity of the stabilization layer led to a decrease in the quench voltage of the second-generation superconducting wire. We suggest that various characteristic changes of the second-generation superconducting wire can be expected through the successful change in the resistivity of the stabilization layer of the proposed deposition process.

Study on Characteristics of Micro Patterned Copper Electrodeposition according to Parameters in Laser Beam Machining (레이저빔 가공 인자에 따른 구리도금 미세 패터닝 특성 연구)

  • Shin, Hong Shik
    • Journal of Institute of Convergence Technology
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    • v.5 no.2
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    • pp.21-25
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    • 2015
  • This paper proposes a fabrication process of deposited layer with micro patterns that uses a combination of a pulsed laser beam machining and an electrodeposition. This process consists of the electrodeposition and the laser beam machining. The deposited layer on metal can be selectively eliminated by laser ablation. As a result, the deposited layer with micro patterns can be fabricated without a mask. The characteristics of the deposited layer on stainless steel were investigated according to the average power and marking speed in the pulsed laser beam machining. The optimal laser beam conditions for precise micro patterning of the deposited layer were determined. Finally, the deposited copper layer with micro text was successfully fabricated by the pulsed laser beam machining.

Effect of Pre/Post-Treatment on the Performance of Cu(In,Ga)(S,Se)2 Absorber Layer Manufactured in a Two-Step Process (KCN 에칭 및 CdS 후열처리가 Cu(In,Ga)(S,Se)2 광흡수층 성능에 미치는 영향)

  • Kim, A-Hyun;Lee, GyeongA;Jeon, Chan-Wook
    • New & Renewable Energy
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    • v.17 no.4
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    • pp.36-45
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    • 2021
  • To remove the Cu secondary phase remaining on the surface of a CIGSSe absorber layer manufactured by the two-step process, KCN etching was applied before depositing the CdS buffer layer. In addition, it was possible to increase the conversion efficiency by air annealing after forming the CdS buffer layer. In this study, various pre-treatment/post-treatment conditions wereapplied to the S-containing CIGSSe absorber layerbefore and after formation of the CdS buffer layer to experimentally confirm whether similareffects as those of Se-terminated CIGSe were exhibited. Contrary to expectations, it was noted that CdS air annealing had negative effects.

Fabrications of nano-sized patterns using bi-layer UV Nano imprint Lithography (UV NIL을 이용한 Lift-off가 용이한 패턴 형성 연구)

  • Yang K.Y.;Hong S.H.;Lee H.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.06a
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    • pp.1489-1492
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    • 2005
  • Compared to other nano-patterning techniques, Nano imprint Lithography (NIL) has some advantages of high throughput and low process cost. To imprint low temperature and pressure, UV Nano imprint Lithography, which using the monomer based UV curable resin is suggested. Because fabrication of high fidelity pattern on topographical substrate is difficult, bi-layer Nano imprint lithography, which are consist of easily removable under-layer and imprinted pattern, is being used. If residual layer is not remained after imprinting, and under-layer is removed by oxygen RIE etching, we might be able to fabricate the bi-layer pattern for easy lift-off process.

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