• Mass Spectrometry Letters
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• v.11 no.4
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• pp.65-70
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• 2020

Despite its great success in the field of proteomics, mass spectrometry has limited use for determining structural details of peptides, proteins, and their assemblies. Emerging ion mobility spectrometry-mass spectrometry has enabled us to explore the conformational space of protein ions in the gas phase, and further combinations with the gas-phase ion spectroscopy and the collision-induced unfolding have extended its abilities to elucidating the secondary structure and local details of conformational transitions. This review will provide a brief introduction to the combined approaches of IMS-MS with gas-phase ion infrared spectroscopy or collision-induced unfolding and their most recent results that successfully revealed higher-order structural details.

• Bulletin of the Korean Chemical Society
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• v.21 no.1
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• pp.9-22
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• 2000

Optical-optical double resonance experiments have been used to identify and characterize five ion-pair states and several of the bound and repulsive valence states of ClF. This report provides a description of these experiments for $^{35}CIF$ and $^{37}CIF$, and a summary of the current knowledge of the valence and ion-pair states. The important role of perturbations among the rovibronic levels of the bound valence states and their utilization in the double resonance technique is discussed. The ion-pair states of the same symmetry, ${\Omega}$=$0^+$ (E and f) and 1( $\beta$ and G) interact very strongly and the spectroscopy of these states is anomalous and, hence, interesting. Comparison is made to some recent ab initio calculations for ClF. One possible explanation of the irregular vibrational energy levels and rotational constants of the ion-pair states of $O^+$ and 1 symmetry is a crossing of the diabatic potentials of these states. Some currently unresolved questions about ClF spectroscopy are posed for future work. Where appropriate, analogy is made between the electronic states of ClF and the corresponding valence and ion-pair states of $Cl_2.$.

• Journal of the Semiconductor & Display Technology
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• v.17 no.4
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• pp.97-100
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• 2018

$NF_3$ Plasma etching of silicon was conducted by injecting only $NF_3$ gas into reactive ion etching. $NF_3$ Plasma etching was done in intermediate pressure. Silicon etching by $NF_3$ plasma in reactive ion etching was diagnosed through residual gas analyzer and optical emission spectroscopy. In plasma etching, optical emission spectroscopy is generally used to know what kinds of species in plasma. Also, residual gas analyzer is mainly to know the byproducts of etching process. Through experiments, the results of optical emission spectroscopy during silicon etching by $NF_3$ plasma was analyzed with connecting the results of etch rate of silicon and residual gas analyzer. It was confirmed that $NF_3$ plasma etching of silicon in reactive ion etching accords with the characteristic of reactive ion etching.

• Journal of the Korean Vacuum Society
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• v.6 no.S1
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• pp.1-15
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• 1997

Titanium oxide films were prepared by ion beam enhanced deposition where the films were synthesized by deposition titianium atoms and simultaneously bombarding with xenon ion beam at an energy of 40 keV in an $O_2$ environ,ent. Structure and composition of titanium oxide films were investigated by X-ray Doffractopm (XRD) Ritjerfprd Backscattering Spectroscopy (RBS) and X-ray Diffraction(XRD) Rutherford Backscattering Spectroscopy (RBS) and X-ray photoelectron spectroscopy (XPS) The results show that thestructure of the prepared films exhibit a rutile phase structure wit high(200) orientation and the O/Ti ratio of the titanium oxide films was about 2:1 XPS anlysis shows that $Ti^{2+},Ti^{3+}\;and\;Ti^{4+}$ chemical states exist on the titanium oxide films. the blood compatibility of the titanium oxide films was studied by measurements of blood clotting time and platelet adhesion. The results show that the anticoagulation property of titanium oxide films improved significantly and better than that of LTI-carbon which was widely used to fabricate artificial heart valve.

• Journal of the Korean Electrochemical Society
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• v.22 no.2
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• pp.53-59
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• 2019

To examine the solution structure of electrolytes, it is very important to understand ion-ion and ion-solvent interactions. In this review, we introduce the basic principle of dielectric relaxation spectroscopy (DRS) and studies of electrolyte structure. DRS is a type of impedance method, which measures the dielectric properties of electrolytes over a high frequency domain at levels of tens of GHz. Therefore, DRS provides information on the different polar chemical species present in the electrolyte, including the type and concentration of free solvents and ion pairs with dipole moments. The information of DRS is complementary to the information of conventional analytical techniques (Infrared/Raman spectroscopy, nuclear magnetic resonance (NMR), etc.) and thus enables a broad understanding of electrolyte structure.

• Korean Journal of Crystallography
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• v.20 no.1
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• pp.1-8
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• 2009

이온산란 분광법(ISS: Ion Scattering Spectroscopy)은 표면 원자의 구조를 러더포드 후방산란법(RBS: Rutherford Backscattering Spectroscopy) 등과 같이 실공간에 대하여 직접 정보를 얻는 방법이다. 그 중에서도 산란각도를 $180^{\circ}$로 고정하여 산란이온 검출기를 설치한 직충돌 이온산란 분광법(ICISS: Impact Collision Ion Scattering Spectroscopy)은 산란된 이온의 궤적이 입사궤도와 거의 동일하기 때문에 산란궤적의 계산이 간단해지고, 최외층 뿐만 아니라 표면에서 수 층 깊이의 원자구조의 해석이 가능하다. 또한 비행시간형(TOF: Time-Of-Flight) 분석기를 채택하여 산란 이온 및 중성원자를 동시에 측정하면 입사 이온의 표면에서의 중성화에 관계 없이 산란 신호를 얻으므로 표면 원자의 결합 특성에 영향 받지 않고 사용할 수 있다. 본고에서는 ICISS의 원리, 장치, 측정방법 등을 소개한 제1편 및 반도체 표면구조, 금속/반도체 계면 등의 해석에 관하여 기술한 제2편에 이어서 세라믹 재료의 표면 원자 구조, 세라믹 박막의 원자 구조, 흡착 기체의 구조, 원소의 편석 등에 관한 연구 사례를 소개하고자 한다.

• Analytical Science and Technology
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• v.36 no.1
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• pp.1-11
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• 2023

A new, sensitive, and reliable flow injection methodology was investigated for the determination of lead ion (II) in vegetables' samples using a laboratory-prepared reagent 2-[(6-methoxy-2-benzothiazoly)azo]-4-methoxy phenol (6-MBTAMP). Infrared spectroscopy, UV-visible spectrophotometry, Energy dispersive X-ray spectroscopy (EDX), Elemental Analysis (CHN), nuclear magnetic resonance spectroscopy ¹HNMR, and ¹³CNMR techniques were used to characterize the reagent and lead (II) complex. The method is based on lead ion (II) reacting with the reagent (6-MBTAMP) in a neutral solution to produce a green-red complex with a maximum absorbance at 670 nm. The optimum conditions, such as flow rate, lead ion (II) volume, reagent volume, medium pH, reagent concentration, and reaction coil length were thoroughly examined. The limits of detection (LOD) and quantification (LOQ) were determined to be 0.621 mg·L^-1 and 2.069 mg·L^-1 , respectively, while Sandell's sensitivity was determined to be 0.345 ㎍·cm^-2.

• The Transactions of the Korean Institute of Electrical Engineers
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• v.41 no.8
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• pp.875-882
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• 1992

Titanium carbide(TiC) films, known as having excellent characteristics of resistance to wear and corrosion, were deposited on SUS-304 sheets using HCD(Hollow Cathode Discharge) reactive ion plating with acetylene gas as the reactant gas. The characteristics of TiC films were examined by X-ray diffraction, micro-Vickers hardness tester, ${\alpha}$-step, SEM(Scanning Electron Spectroscopy), ESCA(Electron Spectroscopy for Chemical Analysis), and AES(Auger Electron Spectroscopy) and the results were discussed with regard to the changes of various deposition conditions(bias voltage, acetylene flow rate, temperature).

• Proceedings of the Korean Vacuum Society Conference
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• 2012.08a
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• pp.229-229
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• 2012

Adhesion of Copper film on the aluminum oxide layer formed by anodizing an aluminum plate was enhanced by applying ion beam mixing method. Forming an conductive metal layer on the insulating oxide surface without using adhesive epoxy bonds provide metal-PCB(Printed Circuit Board) better thermal conductivities, which are crucial for high power electric device working condition. IBM (Ion beam mixing) process consists of 3 steps; a preliminary deposition of an film, ion beam bombardment, and additional deposition of film with a proper thickness for the application. For the deposition of the films, e-beam evaporation method was used and 70 KeV N-ions were applied for the ion beam bombardment in this work. Adhesions of the interfaces measured by the adhesive tape test and the pull-off test showed an enhancement with the aid of IBM and the adhesion of the ion-beam-mixed films were commercially acceptable. The mixing feature of the atoms near the interface was studied by scanning electron microscopy, Auger electron spectroscopy, and X-ray photoelectron spectroscopy.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.53 no.7
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• pp.382-386
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• 2004

A study has been made of surface modification of organic materials by ion implantation to increase the surface electrical properties. The substrate used were PET(polyethylene teraphtalate). N$^{＋}$, Ar$^{＋}$ implantation was peformed at energies of 40 keV and 50 keV with fluences from $5{\times}10^{15}$, $1{\times}10^{16}$,$7{\times}10^{16}$, $1{\times}10^{17}$/ ions/$cm^2$. UV/Vis, FT-IR and XPS spectroscopy measured for surface structure changes. Surface resistance decrease of implanted polymers was affected by ion implantation energy, ion species and ion dose rate. Surface conductivity of PET increased $2{\times}10^{9}$/∼$2{\times}10^{10}$/$\Omega$/sq by ion implantation. Result of various spectroscopy analysis, the cause of increasing PET surface conductivity was expected to breaking C=O bonds. It was formation carbon network structure by promote cross-linking and create C-C, C=C bonds.