• Title/Summary/Keyword: inspection line

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Development of 3D Inspection Equipment using White Light Interferometer with Large F.O.V. (대시야 백색광 간섭계를 이용한 3차원 검사 장치 개발)

  • Koo, Young Mo;Lee, Kyu Ho
    • Journal of the Korean Institute of Intelligent Systems
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    • v.22 no.6
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    • pp.694-699
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    • 2012
  • In this paper, semiconductor package inspection results using white light interferometer with large F.O.V., in order to apply semiconductor product inspection process, are shown. Experimental 3D data repeatability test results for the same special bumps of each substrate are shown. Experimental 3D data repeatability test results for all the bumps in each substrate are also shown. Semiconductor package inspection using white light interferometer with large F.O.V. is very important for the fast 3D data inspection in semiconductor product inspection process. This paper is surely helpful for the development of in-line type fast 3D data inspection machine.

A Study on Management for Measuring Instrument of Small and Medium-sized Enterprises - Focusing on the Inspection Gig - (중소제조업체의 측정기 운영에 관한 실증적 연구 - 검사 지그를 중심으로 -)

  • Yoo, Hyun-Jong;Jung, Soo-Il
    • Journal of the Korea Safety Management & Science
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    • v.10 no.2
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    • pp.217-223
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    • 2008
  • Measurement is used for evaluation of product or process exactly. If it couldn't measured correctly, Quality-cost must be raised and it would be hard to improve product quality. So, this study suggests improvement guide line for the multilateral problems of measuring instrument operation based on the investigation of 157 small and medium-sized enterprises in February, 2008. To use inspection gig correctly, man who treat it must be accustomed with the structure, the performance, the method. The inspection gig is selected properly for the measurement goal. If not, results couldn't be correctly or wasted time, efforts, and costs. When selecting a inspection gig, the locating, the clamping, and the efficiency must be considered.

Real-time PCB Vision Inspection Using Pattern Matching (패턴 매칭을 이용한 실시간 PCB 비전 검사)

  • 이영아;박우석;고성제
    • Proceedings of the IEEK Conference
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    • 2003.07e
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    • pp.2335-2338
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    • 2003
  • This paper presents a real-time PCB (Printed Circuit Board) vision inspection system. This system can detect the OPEN and SHORT of the PCB which of the line width is 150$\mu\textrm{m}$. Our PCB inspection system is based on the referential method. Since the size of the captured PCB image is very large, the image is divided into 512${\times}$512 images to apply the accurate alignment efficiently. To correct the misalignment between the reference image and the inspection image, pattern matching is performed. In order to implement the proposed algorithm in real-time, we use the SIMD instruction and the double buffering structures. Our experiential results show the effectiveness of the developed inspection algorithm.

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A study of On-Machine Measurement for PC-NC system

  • Yoon, Gil-Sang;Kim, Gun-Hee;Cho, Myeong-Woo;Seo, Tae-Il
    • International Journal of Precision Engineering and Manufacturing
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    • v.5 no.1
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    • pp.60-68
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    • 2004
  • The purpose of this paper is to establish an effective inspection system by using OMM (On-Machine Measurement) system based PC-NC. This system can reduce manufacturing lead time because a workpiece is inspected at every machining process and the manufacturing system which includes inspection faculty is able to realize on-line process on CNC machining center. The proposed OMM system is composed of a few algorithms for determination of inspection parameters. It is accomplished by determining the number of measuring points, their location, measuring path using fuzzy logic, Hammersley's method, TSP (Traveling Salesperson Problem) algorithm. The inspection feature applied to this system is based on machining feature. This method is tested by simulation and experiment that are analyzed measuring data and geometry tolerance.

A Learning-based Visual Inspection System for Part Verification in a Panorama Sunroof Assembly Line using the SVM Algorithm (SVM 학습 알고리즘을 이용한 자동차 썬루프의 부품 유무 비전검사 시스템)

  • Kim, Giseok;Lee, Saac;Cho, Jae-Soo
    • Journal of Institute of Control, Robotics and Systems
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    • v.19 no.12
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    • pp.1099-1104
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    • 2013
  • This paper presents a learning-based visual inspection method that addresses the need for an improved adaptability of a visual inspection system for parts verification in panorama sunroof assembly lines. It is essential to ensure that the many parts required (bolts and nuts, etc.) are properly installed in the PLC sunroof manufacturing process. Instead of human inspectors, a visual inspection system can automatically perform parts verification tasks to assure that parts are properly installed while rejecting any that are improperly assembled. The proposed visual inspection method is able to adapt to changing inspection tasks and environmental conditions through an efficient learning process. The proposed system consists of two major modules: learning mode and test mode. The SVM (Support Vector Machine) learning algorithm is employed to implement part learning and verification. The proposed method is very robust for changing environmental conditions, and various experimental results show the effectiveness of the proposed method.

Analysis and Case Study of a K-Stage Inspection System Considering a Re-inspection Policy for Good Items (양품재검사정책 하에서의 K단계 검사시스템의 분석과 사레연구)

  • Yang, Moon-Hee
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.8 no.4
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    • pp.930-937
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    • 2007
  • In this paper, we address a design problem and a case study of a K-stage inspection system, which is composed of K stages, each of which includes an inspection process and a rework process. Assuming the type I and II errors of inspectors and the re-inspection policy for items classified as good, we determine the smallest integer of K which can achieve a given target defective rate. If K does not exist, holding the current values of the type I, II errors, we search reversely a new vector, (the defective rate of an assembly line, the defective rate of a rework process), which can give the target defective rate. Our formulas and methodology based on our K-stage inspection system could be applied and extended to similar situations with slight modifications.

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A Study on the Running Type Nipper Pattern Development for Adult men (성인 남성용 런닝형 니퍼패턴 개발)

  • Cho, Pyeong-Hun;Shon, Hoo-Jo;Na, Mi-Hyang
    • Korean Journal of Human Ecology
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    • v.16 no.3
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    • pp.577-585
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    • 2007
  • This research aimed for 20 latter man whose body shape of torso alters remarkably to develop nipper pattern of running type considered characteristic of body shape of 20 latter man to keep rather balanced body shape against middle age when body shape changes extremely. 1. running type nipper pattern design. Pattern of running, lining and nipper were designed by flattening surface shell. A basis line of running pattern is completed by applying reduction ratio after 3 times of modification & complement based on surface shell. Nipper pattern is designed with design line set by a plaster cast based on running pattern line. Lining pattern is designed with lining design line set by a plaster cast based on running type outside material and nipper pattern. 2. Functional evaluation of research and commercial nipper. Functional inspection through dress test was applied 5point evaluation method and the result of functional inspection on the sight of a wearer is that research nipper(running reduction ratio 15%, nipper reduction ratio 18%) averaged more 4.8point but commercial nipper averaged less 1.8point in the aspect of 20 items such as wear sensibility, motional function and external appearance aesthetic. Research running type nipper scored high in order of motional function, looks of side, back, front and whole and wear sensibility. Functional inspection in the point of view of an observer is that research nipper(running reduction ratio 15%, nipper reduction ratio 18%) averaged over 4.8point and commercial nipper averaged under 1.9point in 17 items of external appearance beauty. Research running type nipper marked high in order of looks of back, whole, front and side.