• 제목/요약/키워드: indium

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Tetrakis(pentafluorophenyl)indium(Ⅲ) 음이온 착물의 합성과 특성 (Synthesis and Properties of Anionic Tetrakis(pentafluorophenyl)indium(Ⅲ) Complexes)

  • 최철호
    • 대한화학회지
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    • 제43권1호
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    • pp.52-57
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    • 1999
  • In($C_6F_5)_3{\cdot}D(D=CH_3CN$, O($C_2H_5)_2$)와 ($CH_3)_3SiC_6F_5$/CsF, $C_6F_5$MgBr 또는 Cd($C_6F_5)_2$을 반응시켜 [In($C_6F_5)_4$]- 음이온 화합물을 합성하였으나, 이들 indium(III) 음이온 화합물들은 온도에 민감하고 습기에 대해 불안정하다. 안정한 indium(III) 음이온 착물은 PNPCl(PNP=bis(triphenylphosphino)ammonium)과의 양이온 치환반응시켜 얻었으며, 관 크로마토 그래피를 이용하여 분리 정제하였다. 합성된 화합물의 특성은 핵자기 공명 분석법, 적외선 분광분석법, 분자량 측정, DTA/TG 그리고 원소분석법을 이용하여 조사하였다.

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Effects of post anneal for the INZO films prepared by ultrasonic spray pyrolysis

  • Lan, Wen-How;Li, Yue-Lin;Chung, Yu-Chieh;Yu, Cheng-Chang;Chou, Yi-Chun;Wu, Yi-Da;Huang, Kai-Feng;Chen, Lung-Chien
    • Advances in nano research
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    • 제2권4호
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    • pp.179-186
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    • 2014
  • Indium-nitrogen co-doped zinc oxide thin films (INZO) were prepared on glass substrates in the atmosphere by ultrasonic spray pyrolysis. The aqueous solution of zinc acetate, ammonium acetate and different indium sources: indium (III) chloride and indium (III) nitrate were used as the precursors. After film deposition, different anneal temperature treatment as 350, 450, $550^{\circ}C$ were applied. Electrical properties as concentration and mobility were characterized by Hall measurement. The surface morphology and crystalline quality were characterized by SEM and XRD. With the activation energy analysis for both films, the concentration variation of the films at different heat treatment temperature was realized. Donors correspond to zinc related states dominate the conduction mechanism for these INZO films after $550^{\circ}C$ high temperature heat treatment process.

Indium-Morin 착물에 관한 흡착벗김전압전류법적 연구 (Adsorptive Stripping Voltammetry of Indium-Morin Complex)

  • 손세철;엄태윤;하영경;정기석
    • 대한화학회지
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    • 제35권5호
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    • pp.506-511
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    • 1991
  • In-Morin 착물에 대한 흡착벗김전압전류법적 연구를 HMDE를 사용하여 pH 3.20의 0.1M 아세테이트 완충용액에서 수행하였다. 흡착 현상들을 미분펄스전압전류법으로 관찰하였으며, HMDE의 표면에 흡착된 착물의 환원 전류에 미치는 여러 분석 조건들에 과하여 논의하였다. 또한 여러 다른 금속이온들과 계면활성제의 방해효과에 관해서도 검토하였다. 본 연구에서의 검출한계는 90초의 흡착시간을 적용하였을 때 2.6nM이었으며, 4${\mu}g$/l의 In을 7회 분석하였을 때 상대표준편차는 2.0%이었다.

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PLD 법으로 증착된 n-ZnO:In/p-Si (111) 이종접합구조의 특성연구 (A Study on the Characteristic of n-ZnO:In/p-Si (111) Heterostructure by Pulsed Laser Deposition)

  • 장보라;이주영;이종훈;김준제;김홍승;이동욱;이원재;조형균;이호성
    • 한국전기전자재료학회논문지
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    • 제22권5호
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    • pp.419-424
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    • 2009
  • ZnO films doped with different contents of indium ($0.1{\sim}10$ at.%) were deposited on Si (111) substrate by Pulsed Laser Deposition (PLD). The structural, electrical and optical properties of the films were investigated using XRD, AFM, Hall and PL measurement. Results showed that un-doped ZnO film had (002) plane as the c-axis orientated growth, whereas indium doped ZnO films exhibited the peak of (002) and the weak (101) plane. In addition, in the indium doped ZnO films, the electron concentration is ten times higher than that of un-doped ZnO film, while the resistivity is ten times lower than that of un-doped ZnO film. The indium doped ZnO films have UV emission about 380 nm and show a red shift with increasing contents of indium. The I-V curve of the fabricated diode show the typical diode characteristics and have the turn on voltage of about 2 V.

Comparison of transparent conductive indium tin oxide, titanium-doped indium oxide, and fluorine-doped tin oxide films for dye-sensitized solar cell application

  • Kwak, Dong-Joo;Moon, Byung-Ho;Lee, Don-Kyu;Park, Cha-Soo;Sung, Youl-Moon
    • Journal of Electrical Engineering and Technology
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    • 제6권5호
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    • pp.684-687
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    • 2011
  • In this study, we investigate the photovoltaic performance of transparent conductive indium tin oxide (ITO), titanium-doped indium oxide (ITiO), and fluorine-doped tin oxide (FTO) films. ITO and ITiO films are prepared by radio frequency magnetron sputtering on soda-lime glass substrate at $300^{\circ}C$, and the FTO film used is a commercial product. We measure the X-ray diffraction patterns, AFM micrographs, transmittance, sheet resistances after heat treatment, and transparent conductive characteristics of each film. The value of electrical resistivity and optical transmittance of the ITiO films was $4.15{\times}10^{-4}\;{\Omega}-cm$. The near-infrared ray transmittance of ITiO is the highest for wavelengths over 1,000 nm, which can increase dye sensitization compared to ITO and FTO. The photoconversion efficiency (${\eta}$) of the dye-sensitized solar cell (DSC) sample using ITiO was 5.64%, whereas it was 2.73% and 6.47% for DSC samples with ITO and FTO, respectively, both at 100 mW/$cm^2$ light intensity.

Selective Laser Direct Patterning of Indium Tin Oxide on Transparent Oxide Semiconductor Thin Films

  • Lee, Haechang;Zhao, Zhenqian;Kwon, Sang Jik;Cho, Eou Sik
    • 반도체디스플레이기술학회지
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    • 제18권4호
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    • pp.6-11
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    • 2019
  • For a wider application of laser direct patterning, selective laser ablation of indium tin oxide (ITO) film on transparent oxide semiconductor (TOS) thin film was carried out using a diode-pumped Q-switched Nd:YVO4 laser at a wavelength of 1064 nm. In case of the laser ablation of ITO on indium gallium zinc oxide (IGZO) film, both of ITO and IGZO films were fully etched for all the conditions of the laser beams even though IGZO monolayer was not ablated at the same laser beam condition. On the contrary, in case of the laser ablation of ITO on zinc oxide (ZnO) film, it was possible to etch ITO selectively with a slight damage on ZnO layer. The selective laser ablation is expected to be due to the different coefficient of thermal expansion (CTE) between ITO and ZnO.

Correlation between pit formation and phase separation in thick InGaN film on a Si substrate

  • Woo, Hyeonseok;Jo, Yongcheol;Kim, Jongmin;Cho, Sangeun;Roh, Cheong Hyun;Lee, Jun Ho;Kim, Hyungsang;Hahn, Cheol-Koo;Im, Hyunsik
    • Current Applied Physics
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    • 제18권12호
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    • pp.1558-1563
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    • 2018
  • We demonstrate improved surface pit and phase separation in thick InGaN grown on a GaN/Si (111) substrate, using plasma-assisted molecular beam epitaxy with an indium modulation technique. The formation of surface pit and compositional inhomogeneity in the InGaN epilayer are investigated using atomic force microscopy, scanning electron microscopy and temperature-dependent photoluminescence. Indium elemental mapping directly reveals that poor compositional homogeneity occurs near the pits. The indium-modulation epitaxy of InGaN minimizes the surface indium segregation, leading to the reduction in pit density and size. The phase separation in InGaN with a higher pit density is significantly suppressed, suggesting that the pit formation and the phase separation are correlated. We propose an indium migration model for the correlation between surface pit and phase separation in InGaN.

Recovery of Indium from Scrap

  • Han, Kenneth N.
    • 자원리싸이클링
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    • 제10권5호
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    • pp.3-7
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    • 2001
  • Indium frequently associated with the semiconductor industry is becoming an important metal element widely used in industry. In this paper, its properties especially in relation to its recovery from scrap are reviewed and discussed. Also presented in this paper is how best indium can be recovered by the hydrometallurgical means.

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A Facile One-Pot Operations of Reduction and Allylation of Nitrobenzaldehydes Mediated by Indium and Their Applications

  • Cho, Yong-Seo;Kang, Kyung-Ho;Cha, Joo-Hwan;Choi, Kyung-Il;Pae, Ae-Nim;Koh, Hun-Yeong;Chang, Moon-Ho
    • Bulletin of the Korean Chemical Society
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    • 제23권9호
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    • pp.1285-1290
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    • 2002
  • Various nitrobenzaldehydes were simultaneously allylated and reduced using indium in the presence of HCl in aqueous media to give compounds having both functionality of homoallylic alcohol and aromatic amine. Sequential protection of the amino gro up and oxidation of the anilinyl homoallylic alcohol provided useful precursors of heterocyclic compounds such as dihydroindolones and dihydroquinolones, which could be efficiently synthesized through intramolecular cyclization reaction.