• Nuclear Engineering and Technology
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• 제54권6호
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• pp.1947-1953
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• 2022

As the plasma facing material in the nuclear fusion reactor, tungsten has to bear the irradiation impact of high energy particles. The surface quality of tungsten may affect its irradiation resistance, and even affect the service life of fusion reactor. In this paper, tungsten samples with different surface quality were polished by mechanical processing, subsequently conducted by D₂⁺ implantation and thermal desorption. D₂⁺ implantation was performed at room temperature (RT) with the irradiation dose of 1 × 10²¹ D₂⁺/m² by 5 keV D₂⁺ ions, and thermal desorption spectroscopy measurements were done from RT to 900 K. In addition, He irradiation was also performed by 50 eV He⁺ ions energy with the fluxes of 5.5 × 10²¹ m^-2s^-1 and 1.5 × 10²² m^-2s^-1, respectively. Results reveal that the hydrogen/helium irradiation behavior are both related to surface quality. Samples with high surface quality has superior D₂⁺ retention behavior with less D₂ retained after implantation. However, such samples are more likely to generate fuzzes on the surface after helium irradiation. Different morphologies (smooth, wavy, pyramids) after helium irradiation also demonstrates that the surface morphology is related to tungsten crystallographic orientation.

• 한국재료학회지
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• 제4권2호
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• pp.152-158
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• 1994

메탄가스를 반응가스로 하여 플라즈마 화학증착법으로 Diamondlike Carbon(DLC)박막 제작시 박막의 광학적 특성에 미치는 수소가스의 영향을 조사하였다. 수소가스를 보조가스로 사용하는 경우는 불활성가스인 아르곤이나 헬륭의 경우와는 달리 인가전력의 변화에 따라 수소가스의 역할이 다르게 나타났다. Optical band gap의 변화와 FT-IR 분석결과로부터 수소가스에 의한 C-H 결합의 화학적인 에칭과 스퍼터링 및 수소의 박막 내로의 주입 가능성을 예측하고 이를 아르곤과 헬륨을 보조가스로 사용한 경우와 비교하여 그 타당성을 확인하였다.

• 한국전기전자재료학회논문지
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• 제33권4호
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• pp.255-262
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• 2020

Grain boundaries play a major role in determining device performance, particularly of polysilicon-based photodetectors. Through the post-annealing of as-deposited polysilicon and then, the analysis of electric behavior for a metal-polysilicon-metal (MSM) photodetector, we were able to identify the influence of grain boundaries. A modified model of polysilicon grain boundaries in the MSM structure is presented, which uses a crystalline-interfacial layer-SiO_x layer- interfacial layer-crystalline system that is similar to the Si-SiO₂ system in MOS device. Hydrogen passivation was achieved through a hydrogen ion implantation process and was used to passivate the defects at both interfacial layers. The thin SiO_x layer at the grain boundary can enhance the photosensitivity of an MSM photodetector by decreasing the dark current and increasing the light absorption.

• 한국윤활학회:학술대회논문집
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• 한국윤활학회 2002년도 proceedings of the second asia international conference on tribology
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• pp.165-166
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• 2002

Hydrogen free diamond like carbon (DLC) films were prepared on steel substrates by using a single ion beam in a configuration that allowed sputtering of a graphite target and at the same time allowed to impact the substrate at a grazing angle. The DLC films so prepared have improved properties with increased disorder and with modest hardness that is slightly higher than previously reported values. We have studied the effects of $N_2^+$ ions implantation on such films. It is found that the implantations of nitrogen ions into DLC films lead to chemical modifications that allowed N atoms to be incorporated into the carbon network to produce a nitrogenated DLC. Nano-indentation experiments indicated that the nitrogenated films have consistently higher hardnesses ranging from 30 to 45GPa, which represents a considerable increase in surface hardness, compared with non-nitrogenated precursor films. The investigations by XPS and Raman spectroscopy suggests that the $N_2^+$ implanted DLCs had undergone both chemical and structural modifications through the incorporation of N atoms and the increased ratio of $sp^3/sp^2$ type bonding. The observed high hardness was therefore attributable to these structural and chemical modifications. This result has implication for the preparation of super hard wear resistant films required for tribological functions in devices.

• Transactions on Electrical and Electronic Materials
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• 제9권6호
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• pp.231-236
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• 2008

B, P, and Cs ions were implanted with various parameters into silicon nitride layers prepared by LPCVD. In order to get the maximum impurity concentration at the silicon nitride surface, a high temperature oxide (HTO) buffer layers was deposited prior to the implantation. Alkali ion and pH sensing properties of the layers were investigated with an electrolyte-insulator-silicon (EIS) structure using high frequency capacitance-voltage (HF-CV) measurements. The ion sensing properties of implanted silicon nitrides were compared to those of as-deposited silicon nitride. Band Cs co-implanted silicon nitrides showed a pronounced difference in pH and alkali ion sensing properties compared to those of as-deposited silicon nitride. B or P implanted silicon nitrides in contrast showed similar ion sensitivities like those of as-deposited silicon nitride.

• Journal of Korean Vacuum Science & Technology
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• 제6권1호
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• pp.46-50
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• 2002

C-SiC films with different content of SiC on stainless steel substrate were prepared with ion beam mixing. It was found that hydrogen concentrations in C-SiC coatings was higher than that in stainless steel after H$\^$+/ ion implantation followed by thermal annealing. Infrared (IR) transmission measurement was used to study the mechanism of hydrogen retention by C-SiC films. The vibrational features in the range between 400 and 3200 cm$\^$-1/ in IR transmission spectra show the Si-CH$_3$, Si-CH$_2$, Si-H, CH$_2$and CH$_3$bonds, which are responsible for retaining hydrogen.

• 한국진공학회지
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• 제13권1호
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• pp.1-8
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• 2004

양성자 주입과 웨이퍼접합기술을 접목한 ion-cut기술로서 SOI 웨이퍼를 제조하는 기술을 개발하고자 하였다. TRIM 전산모사결과 표준 SOI 웨이퍼 (200 nm SOI, 400 nm BOX) 제조를 위해서는 65 keV의 양성자주입이 요구됨을 알 수 있었다. 웨이퍼분리를 위한 최적 공정조건을 얻기 위해 조사선량과 열처리조건(온도 및 시간)에 따른 표면변화를 조사하였다. 실험결과 유효선량범위는 6∼$9\times10^{16}$ $H^{+}/\textrm{cm}^2$이며, 최적 아닐링조건은 $550^{\circ}C$에서 30분 정도로 나타났다. 주입된 수소의 깊이분포는 ERD(Elastic Recoil Detection)와 SIMS(Secondary Ion Mass Spectrometry)측정에 의해 실험적으로 확인되었다. 아울러 상해층의 미세구조 형성기구를 X-TEM측정을 통해 조사하였다.

• 한국광학회:학술대회논문집
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• 한국광학회 2004년도 제15회 정기총회 및 동계학술발표회
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• pp.314-315
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• 2004

• 한국광학회:학술대회논문집
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• 한국광학회 2004년도 제15회 정기총회 및 동계학술발표회
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• pp.316-317
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• 2004

• 한국광학회:학술대회논문집
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• 한국광학회 2003년도 하계학술발표회
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• pp.230-231
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• 2003

SOI (Silicon On insulator)는 SiO$_2$와 같은 절연체 위에 실리콘 (Si) 박막층이 놓여있는 구조로서 전자나 광소자들이 실리콘 박막층 위에 만들어진다. SOI의 기본적인 생각은 기생 정전용량 (parasitic capacitance)을 감소시킴으로서 소자의 스위칭 속도를 더 빠르게 하는 것이다. 최근에 초고속 광소자와 단위 광소자들의 집적을 위해 실리콘 이외의 GaAs, InP, SiC 등의 반도체 박막을 절연층 위에 만드는 연구가 많이 진행되고있다. (중략)