• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2005.07a
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• pp.434-435
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• 2005

In this work, the ITO thin films were prepared by FTS (Facing Targets Sputtering) system under different sputtering conditions which were varying $O_2$ gas flow, input current and working gas pressure. As a function of sputtering conditions, electrical and optical properties of prepared ITO thin films were measured. The electrical characteristics, surface roughness and transmittance of the ITO thin films were evaluated by Hall Effect Measurement, AFM, and UV-VIS spectrometer respectively. In addition, I-V properties of OLED cells were measured by 4156A(HP).

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.06a
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• pp.420-421
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• 2006

The ITO thin films were prepared by FTS (Facing Targets Sputtering) system on polycarbonate(PC) substrate. The ITO thin films were deposited with a film thickness of 100nm at room temperature. As a function of sputtering conditions, electrical and optical properties of prepared ITO thin films were measured. The electrical and optical characteristics of the ITO thin films were evaluated by Hall Effect Measurement(EGK) and UV-VIS spectrometer(HP), respectively. From the results, the ITO thin film was deposited with a resistivity $8{\times}10^{-4}[{\Omega}-cm]$ and transmittance over 80%.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.27 no.10
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• pp.642-647
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• 2014

For feasible study of opto-electrical application regarding to oxide semiconductor, we implemented the N doped ZnO growth using a atomic layer deposition technique. The p-type ZnO deposition, necessary for ZnO-based optoelectronics, has considered to be very difficulty due to sufficiently deep acceptor location and self-compensating process on doping. Various sources of N such as $N_2$, $NH_3$, NO, and $NO_2$ and deposition techniques have been used to fabricate p-type ZnO. Hall measurement showed that p-type ZnO was prepared in condition with low deposition temperature and dopant concentration. From the evaluation of photoluminescence spectroscopy, we could observe defect formation formed by N dopant. In this paper, we exhibited the electrical and optical properties of N-doped ZnO thin films grown by atomic layer deposition with $NH_3OH$ doping source.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.06a
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• pp.403-404
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• 2007

We prepared the Al doped ZnO (AZO) thin film on polyethersulfon (PES) without any substrate heating by Facing Targets Sputtering (FTS) system. ZnO doped the content of Al 2 wt% was used and the sputtering conditions were gas pressure 1mTorr and input power 100W. The electrical, structural and optical properties of AZO thin films were investigated. To investigate the as-deposited thin film properties, we employed four-point probe, UV/VIS spectrometer, X-ray diffractometer (XRD), scanning electron microscopy (SEM), Hall Effect measurement system and Atomic Force Microscope (AFM).

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.223-223
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• 2010

본 연구에서는 Al-doped ZnO (AZO) 박막을 linear facing target sputter (LFTS) 시스템을 이용하여 성막 하였고 박막의 특성을 분석하였다. LFTS 시스템은 마주보는 두 AZO 타겟 사이에 고밀도의 플라즈마를 구속시켜 플라즈마 데미지 없이 산화물 박막을 성막 시킬 수 있는 장치이다. LFTS로 성막된 AZO 박막의 인가된 DC 파워에 따른 전기적 특성을 분석하기 위해 four-point probe와 Hall measurement 장비를 이용하여 분석을 진행 하였으며, 광학적 특성 분석을 위해 UV/Vis spectrometer 장비를 이용하여 분석하였다. AZO 박막의 구조적, 표면적 특성을 분석하기 위해 X-ray diffraction(XRD) 및 scanning electron microscope(SEM)을 사용하여 상온에서 성막된 AZO 박막의 특성을 관찰 하였다. 또한 AZO 박막의 PET 기판과의 접합성 및 구부림 시의 안정성을 평가하기 위해 bending test를 진행 하였다. 최적화된 AZO 박막으로부터 기판에 성막 중 열처리공정이나 후 열처리 공정의 진행 없이 35 ohm/square의 낮은 면저항과 약 80 % 이상의 투과율을 얻을 수 있었다. LFTS 시스템을 이용하여 낮은 공정온도에서 AZO 박막을 성막 하였음에도 불구하고 낮은 저항과 높은 투과도 특성을 나타내고 있어 기존의 투명 박막을 대체 할 수 있는 가능성을 제시하였다

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.220-220
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• 2010

대향타겟식 스퍼터링 (Facing Target Sputtering, FTS) 장치를 이용하여 박막태양전지에 응용가능한 GAZO 박막을 플렉시블 기판 (PES) 위에 증착하였다 박막을 증착하는 데 쓰인 각각의 타겟은 AZO(ZnO:$Al_2O_3$=98:2w.t%) : GZO(ZnO:$Ga_2O_3$=97:3w.t%)이였으며, 다양한 스퍼터링 조건(공정압력, 입력 전력 및 박막의 두께)에서 증착 하였다. GAZO 박막의 전기적 특성은 Hall effect measurement, Four Point Probe, 광학적 특성은 UV-VIS spectrometer, 구조적 특성은 XRD, AFM, FE-SEM, 막의 두께는 $\alpha$-step profiler 장비를 이용하여 분석하였다. 가장 낮은 비저항은 작업 압력 1mTorr일 때 $5.123{\times}10^{-4}[\Omega-cm]$를 보였다. 또한 제작된 모든 박막은 (002)회절 피크로 우선성장함을 알 수 있었으며, 가시광선 영역(300nm-800nm)에서 80% 이상의 광 투과율을 나타냄을 알 수 있었다.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.217-217
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• 2010

새로운 물질의 투명전극 제작을 위해 대향타겟식 스퍼터링 (Facing Targets Sputtering, FTS)법을 이용하여 유리 기판위에 AZO와 GZO 이종타겟을 사용하여 유리 기판 위에 GAZO 박막을 제작하였다. FTS는 두 타겟이 서로 마주보는 구조로 인해 서로 다른 종류의 타겟을 장착하여 새로운 물질의 박막을 제작하는데 있어 용이하고, 타겟 뒷면에 위치한 영구자석으로 인해 타겟으로부터 방출되는 2차 전자 등을 구속하여 고밀도 플라즈마를 형성함으로서 고품위 박막의 제작이 가능하다. 본 연구에서는 투입 전력에 따라 제작된 GAZO 박막의 전기적, 광학적 및 구조적 특성 변화를 살펴보았다. 특성 평가는 UV/VIS spectrometer, Hall measurement, X-ray diffractometer (XRD), Atomic Force Microscope (AFM), Field Emission Scanning Electron Microscopy (FESEM) 을 이용하여 분석하였다. 그 결과 제작된 GAZO 박막은 비저항 $4.3\;{\times}\;10^{-4}\l;{\Omega}-cm$, 가시광 영역에서 투과율 80% 이상을 나타내는 것으로 분석되었다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.11a
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• pp.547-550
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• 2004

Indium tin oxide(ITO) films were prepared as a function of varying the proportion of oxygen$[0{\sim}1.0sccm]$ at fixed he gas[20sccm] by facing targets sputtering(FTS) system. Then electrical and optical properties of ITO thin films were estimated by Hall effect measurement system and UV/VIS-spectrometer. In the result, at very little oxygen rate, we can prepare a low resistivity ITO thin film of $3.40{\times}10^{-4}[\Omega{\cdot}cm]$ and transmittance of over 80%. So we noticed that the ITO thin film with low resistivity and high transmittance was prepared by FTS at room temperature.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.11a
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• pp.586-589
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• 2004

In this study, AZO(ZnO:Al) thin film were prepared by FTS(Facing Target Sputtering) system. The electrical, optical properties and crystalline of AZO thin film with thickness have been investigated. The thickness, transmittance, crystalline and electrical properties of AZO thin film were measured by a-step, UV-VIS spectrometer, hall effect measurement system, XRD and four-point probe, respectively. As a result, AZO thin film deposited with the transmittance over 80% and the resistivity about $10^{-4}\;\Omega-cm$.

• Electronic Materials Letters
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• v.14 no.6
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• pp.774-783
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• 2018

Full maximum-entropy mobility-spectrum analysis (FMEMSA) is the best algorithm among mobility spectrum analyses by which we can obtain a set of partial-conductivities associated with mobility values (mobility spectrum) by analyzing magnetic-field-dependent conductivity-tensors. However, it is restricted to a direct band-gap semiconductor and should be modified for materials with other band structures. We developed the modified version of FMEMSA which is appropriate for a material with a single anisotropic valley, or an indirect-band-gap semiconductor quantum-well with a single non-degenerate conduction-band valley e.g., (110)-oriented AlAs quantum wells with a single anisotropic valley. To demonstrate the reliability of the modified version, we applied it to several sets of synthetic measurement datasets. The results demonstrated that, unlike existing FMEMSA, the modified version could produce accurate mobility spectra of materials with a single anisotropic valley.