• Title/Summary/Keyword: four-point method

Search Result 947, Processing Time 0.032 seconds

Examinations on the Reasonable Measuring Methods of the Soil Resistivity for Design of Grounding System (접지시스템의 설계를 위한 대지저항률의 합리적인 측정방법 고찰)

  • Lee, Bok-Hee;Kim, Ki-Bok;Lee, Seung-Hoon;Choi, Jong-Hyuk
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
    • /
    • v.25 no.6
    • /
    • pp.35-41
    • /
    • 2011
  • In order to design effectively the grounding system, it is very important to determine the optimum soil resistivity at the desired location of the connection to earth. This paper deals with the reasonable methods of measuring the soil resistivity where grounding electrodes are buried. The soil resistivity at three test sites with different resistivity of soil were measured as functions of the spacing between the test probes in the Wenner's four-point method and the length of test ground rod in the three-point method. In the case of the three-point method, the length of test ground rod of 2-10[m] in length was appropriate in two-layered soil structure. In the length range of 2-10[m], the results measured by the three-point method using the test ground rod with the length corresponding to the spacing between the test probes of the Wenner's four-point method are in good agreement with the data obtained from the Wenner's four-point method.

Development of Hand-Held Type Sheet Resistance Meter Based on a Dual-Configuration Four-Point Probe Method (Dual-Configuration Four-Point Probe Method에 의한 휴대형 면저항 측정기 개발)

  • Kang, Jeon-Hong;Yu, Kwang-Min;Kim, Wan-Seop
    • The Transactions of the Korean Institute of Electrical Engineers P
    • /
    • v.59 no.4
    • /
    • pp.423-427
    • /
    • 2010
  • Portable sheet resistance-measuring instrument using the dual-configuration Four-Point Probe method is developed for the purpose of precisely measuring the sheet resistance of conducting thin films. While single-configuration Four-Point Probe method has disadvantages of applying sample size, shape and thickness corrections for a probe spacing, the developed instrument has advantages of no such corrections, little edge effects and measuring simply and accurately the sheet resistance between $0.2\Omega/sq$ and $2k\Omega/sq$.

Evaluation Technology of Degradation of Metallic Alloy using Electrical Resistivity (전기비저항을 이용한 금속합금 열화도 평가기술)

  • Nahm, Seung-Hoon;Yu, Kwang-Min;Ryu, Jae-Cheon
    • Journal of the Korean Society for Nondestructive Testing
    • /
    • v.21 no.5
    • /
    • pp.532-541
    • /
    • 2001
  • Developments of nondestructive evaluation techniques for reduction of strength or toughness by aging of material have been carried out, and the method using electrical resistivity is one of them. In this study, to examine the application of electrical resistivity to the evaluation of degradation of metallic alloy, ten different non-magnetic materials were selected as test materials. Electrical resistivities measured by DC two-point probe method and those measured by non-contact type eddy current method were compared with each other. In addition, to examine the application possibility of four-point probe technology in field, the electrical resistivities for 1Cr-lMo-0.25V steel measured by DC two-point probe method and four-point probe method were compared with each other Differences between two measured values for the 1Cr-1Mo-0.25V steel were 0.6%. Therefore, the four-point probe method can be applied to the estimation of the degradation of metallic alloy. ect.

  • PDF

Precision Measurement of Silicon Wafer Resistivity Using Single-Configuration Four-Point Probe Method (Single-configuration FPP method에 의한 실리콘 웨이퍼의 비저항 정밀측정)

  • Kang, Jeon-Hong;Yu, Kwang-Min;Koo, Kung-Wan;Han, Sang-Ok
    • The Transactions of The Korean Institute of Electrical Engineers
    • /
    • v.60 no.7
    • /
    • pp.1434-1437
    • /
    • 2011
  • Precision measurement of silicon wafer resistivity has been using single-configuration Four-Point Probe(FPP) method. This FPP method have to applying sample size, shape and thickness correction factor for a probe pin spacing to precision measurement of silicon wafer. The deference for resistivity measurement values applied correction factor and not applied correction factor was about 1.0 % deviation. The sample size, shape and thickness correction factor for a probe pin spacing have an effects on precision measurement for resistivity of silicon wafer.

Measurement and Computing Method of the Average Illuminance in Residential Areas (공동주택의 조도측정 및 평균조도 산출방법)

  • Joo, Keun-Tak;Choi, An-Seop
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
    • /
    • v.20 no.5
    • /
    • pp.1-8
    • /
    • 2006
  • The Five Point Method of KS and Four Point Method of IES are generally used to measure and compute the average illuminance in residential areas. Such methods of measurement should be used exactly according to the characteristics of the space and activities. Therefore, this study evaluated computation methods of the average illuminance in terms of comparing the measured values with simulated ones. The Five Point Method of KS is very closed to evaluate task illuminancefor appreciating activities at the center while the Four Point Method of IES is very closed to a concept of the average illuminance over the space excluding the possible maximum and minimum illuminance values.

Direct Bonded (Si/SiO2∥Si3N4/Si) SIO Wafer Pairs with Four-point Bending (사점굽힘시험법을 이용한 이종절연막 (Si/SiO2||Si3N4/Si) SOI 기판쌍의 접합강도 연구)

  • Lee, Sang-Hyeon;Song, O-Seong
    • Korean Journal of Materials Research
    • /
    • v.12 no.6
    • /
    • pp.508-512
    • /
    • 2002
  • $2000{\AA}-SiO_2/Si(100)$ and $560{\AA}-Si_3N_4/Si(100)$ wafers, which are 10 cm in diameter, were directly bonded using a rapid thermal annealing method. We fixed the anneal time of 30 second and varied the anneal temperatures from 600 to $1200^{\circ}C$. The bond strength of bonded wafer pairs at given anneal temperature were evaluated by a razor blade crack opening method and a four-point bonding method, respectively. The results clearly slow that the four-point bending method is more suitable for evaluating the small bond strength of 80~430 mJ/$\m^2$ compared to the razor blade crack opening method, which shows no anneal temperature dependence in small bond strength.

Study on Acupuncture Follow the Four Season (오유혈(五兪穴)을 이용한 사시자법(四時刺法) -영추(靈樞)와 난경(難經)을 중심으로-)

  • Hong, Won-Sik;Eum, Dong-Myung
    • Journal of Acupuncture Research
    • /
    • v.17 no.4
    • /
    • pp.18-27
    • /
    • 2000
  • There is a acupuncture method which make a difference according to the four seasons, according to body region or depth in skin. We call it Acupuncture follow the four seasons(四時刺法). In several chapters of Huangdineijing(黃帝內經) introduced Acupuncture follow the four seasons. Acupuncture follow the four seasons has two kinds of acupuncture method that is to acupuncture at body region and to acupuncture at five Su points(五兪穴). To use five Su points(五兪穴) according to Yongchu(靈樞) disagree with Nanjing(難經). In Yongchu(靈樞), the five phases property disagree with five Su points(五兪穴), but in Nanjing(難經) the five phases property agree with five Su points(五兪穴). Even if we can acupuncture the same point, there will be the different effect according as what is the purpose of doing acupuncture, and when we do acupuncture. That is to say, we can use apucupuncture for the purpose of prevention in Yongchu(靈樞), and for the purpose of healing the disease in Nanjing(難經). Therefore, because we select the point on the base of meridian Kis origin which spring out, we have to acupuncture Chong point(井穴) in winter according to Yongchu(靈樞). Because we select the point on the base of meridian Kis origin which flowing, we have to acupuncture Chong point(井穴) in spring according to Nanjing(難經). And in the base of five phases' property, the purpose of selecting five Su points(五兪穴) is the prevention according to Yongchu(靈樞), and the healing according to Nanjing(難經). So even though we acupuncture the exactly same Chong point(井穴), we can expect the effect that acupuncture method supply Ki for liver in winter. and the effect that it extract pathogenic Ki(邪氣) from the liver in spring.

  • PDF

The Measurement Method of the Illuminance Considering Space Characteristics (공간의 특성을 고려한 조도 측정방법에 관한 연구)

  • Joo, Keun-Tak;Choi, An-Seop
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
    • /
    • 2005.05a
    • /
    • pp.3-7
    • /
    • 2005
  • A lighting method of our county is ordinary center concentration form. Therefore, it is usally used the Five Point Method, Multiplicity Method of KS, and Four Point Method of IES to measure a space illuminance. We can use the Five Point Method of KS when we measure a uniformity ratio or activities that happen in space is more sensitive than whole illumination. In addition, we can use the Multiplicity Method of KS and Four Point Method of IES when we measure whole illuminance like mean illuminance. Such method of measurements should be used exactly according to the kinds of space and activities.

  • PDF