• Title/Summary/Keyword: flip flop

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All-optical Flip-flop Operation Based on Polarization Bistability of Conventional-type 1.55-㎛ Wavelength Single-mode VCSELs

  • Lee, Seoung-Hun;Jung, Hae-Won;Kim, Kyong-Hon;Lee, Min-Hee
    • Journal of the Optical Society of Korea
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    • v.14 no.2
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    • pp.137-141
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    • 2010
  • We report, for the first time to our knowledge, observation of polarization bistability from 1.55-${\mu}m$ wavelength single-mode VCSELs of a conventional cylinder-shape under control of their driving current, and demonstration of all-optical flip-flop (AOFF) operations based on the bistability with optical set and reset pulse injection at a 50 MHz switching frequency. The injection pulse energy was less than 14 fJ. The average on-off contrast ratio of the flip-flopped signals was about 7 dB. These properties of the VCSELs will be potentially useful for future high-speed all-optical signal processing applications.

Circuit Design of a Ternary Flip-Flop Using Ternary Logic Gates

  • Kim, Jong-Heon;Hwang, Jong-Hak;Park, Seung-Young;Kim, Heung-Soo
    • Proceedings of the IEEK Conference
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    • 2000.07a
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    • pp.347-350
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    • 2000
  • We present the design of ternary flip-flop which is based on ternary logic so as to process ternary data. These flip-flops are fabricated with ternary voltage mode NOR, NAND, INVERTER gates. These logic gate circuits are designed using CMOS and obtained the characteristics of a lower voltage, a lower power consumption as compared to other gates. These circuits have been simulated with the electrical parameters of a standard 0.25 micron CMOS technology and 2.5 volts supply voltage. The Architecture of proposed ternary flip-flop is highly modular and well suited for VLSI implementation, only using ternary gates.

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Test Point Insertion with Control Point by Greater Use of Existing Functional Flip-Flops

  • Yang, Joon-Sung;Touba, Nur A.
    • ETRI Journal
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    • v.36 no.6
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    • pp.942-952
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    • 2014
  • This paper presents a novel test point insertion (TPI) method for a pseudo-random built-in self-test (BIST) to reduce the area overhead. Recently, a new TPI method for BISTs was proposed that tries to use functional flip-flops to drive control test points instead of adding extra dedicated flip-flops for driving control points. The replacement rule used in a previous work has limitations preventing some dedicated flip-flops from being replaced by functional flip-flops. This paper proposes a logic cone analysis-based TPI approach to overcome the limitations. Logic cone analysis is performed to find candidate functional flop-flops for replacing dedicated flip-flops. Experimental results indicate that the proposed method reduces the test point area overhead significantly with minimal loss of testability by replacing the dedicated flip-flops.

Quaternary D Flip-Flop with Advanced Performance (개선된 성능을 갖는 4치 D-플립플롭)

  • Na, Gi-Soo;Choi, Young-Hee
    • 전자공학회논문지 IE
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    • v.44 no.2
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    • pp.14-20
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    • 2007
  • This paper presents quaternary D flip-flop with advanced performance. Quaternary D flip-flop is composed of the components such as thermometer code output circuit, EX-OR gate, bias inverter, transmission gate and binary D flip-flop circuit. The designed circuit is simulated by HSPICE in $0.35{\mu}m$ one-poly six-metal CMOS process parameters with a single +3.3V supply voltage. In the simulations, sampling frequencies is measured around 100MHz. The PDP parameters and FOM we estimated to be 59.3fJ, 33.7 respectively.

Circuit Design and Simulation Study of an RSFQ Switch Element for Optical Network Switch Applications (광 네트워크 스위치 응용을 위한 RSFQ Switch의 회로 설계 및 시뮬레이션)

  • 홍희송;정구락;박종혁;임해용;장영록;강준희;한택상
    • Progress in Superconductivity
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    • v.5 no.1
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    • pp.13-16
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    • 2003
  • In this work, we have studied about an RSFQ (Rapid Single Flux Quantum) switch element. The circuit was designed, simulated, and laid out for mask fabrication. The switch cell was composed of a D flip-flop, a splitter, a confluence buffer, and a switch core. The switch core determined if the input data could pass to the output. “On” and o“off” controls in the switch core could be possible by utilizing an RS flip-flop. When a control pulse was input to the “on” port, the RS flip-flop was in the set state and passed the input pulses to the output port. When a pulse was input to the “off” port, the RS flip-flop was in the reset state and prevented the input pulses from transferring to the output port. We simulated and optimized the switch element circuit by using Xic, WRspice, and Julia. The minimum circuit margins in simulations were more than $\pm$20%. We also performed the mask layout of the circuit by using Xic and Lmeter.

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Low-area Duty Cycle Correction Circuit for Voltage-Controlled Ring Oscillator (전압제어 링 발진기용 저-면적 듀티 사이클 보정 회로)

  • Yu, Byeong-Jae;Cho, Hyun-Mook
    • Journal of Software Assessment and Valuation
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    • v.15 no.1
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    • pp.103-107
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    • 2019
  • Recently, many technologies have been developed to realize low power high speed digital data communication and one of them is related to duty cycle correction. In this paper, a low-area duty cycle correction circuit for a voltage-controlled ring generator is proposed. The duty cycle correction circuit is a circuit that corrects the duty cycle using a 180 degree phase difference of a voltage controlled ring oscillator. The proposed low-area duty cycle circuit changes a conventional flip-flop to a true single phase clocking (TSPC) flip-flop And a low-area high-performance circuit is realized. By using TSPC flip-flop instead of general flip-flop, it is possible to realize low-area circuit compared to existing circuit, and it is expected to be used for high-performance circuit for low-power because it is easy to operate at high speed.

The Study on the Design of Static Flip-Flop Circuits for the Driving of Matrix Type Electrodes (매트릭스형 전극 구동용 스태틱 플립플롭 회로의 설계기법에관한 연구)

  • 최선정;정기현;김종득
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.30A no.7
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    • pp.75-81
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    • 1993
  • In this paper, New type of Static Edge Triggered D Flip-Flop Circuits which are effective for the sequencial selecting and addressing of Matrix type Electrodes being applied to Flat Display Devices is proposed by the Design Technique using the Transmission Characteristics of Feedback Transistors and Charge Back Up Function. These Circuits composed of 2-4 less transistors in number than Conventional Static D Flip Flop's have some advantages that the Maximum Transition Time of Clock Signals allowed is increased by 100-450 times more than that of the Conventional circuit at 100KHz Clock Frequence and Circuit Safety is much increased by making the wider ranges, 1-4V, of Clock Levelas a Non-operating periods than 3-3.2V ranges in case of the Conventional Circuit at 10MHz clock frequence. By these advantages, These circuits can be very effectively used in case that clock signal has long transition time, especially on the low frequency operation.

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Development of Program counter through the optimization of RSFQ Toggle Flip-Flop (RSFQ Toggle Flip-Flop 회로의 최적화를 통한 Program Counter의 개발)

  • Baek Seung Hun;Kim Jin Young;Kim Se Hoon;Kang Joon Hee
    • Progress in Superconductivity and Cryogenics
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    • v.7 no.1
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    • pp.17-20
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    • 2005
  • We has designed, fabricated, and measured a Single flux quantum (SFQ) toggle flip-flop (TFF). The TFF is widely used in superconductive digital electronics circuits. Many digital devices, such as frequency counter, counting ADC and program counter be used TFF Specially, a program counter may be constructed based on TFF We have designed the newly TFF and obtained high bias margins on test. In this work, we used two circuit simulation tools, WRspice and Julia, as circuit optimization tools. We used XIC for a layout tool. Newly designed TFF had minimum bias margins of +/- $37\%$ and maximum bias margins of +/-$37\%$(enhanced from +/- $37\%$). The designed circuits were fabricated by using Nb technology The test results showed that the re-optimized TFF operated correctly on 100kHz and had a very wide bias margins of +/- $53\%$.

New Scan Design for Delay Fault Testing of Sequential Circuits (순차 회로의 지연 고장 검출을 위한 새로운 스캔 설계)

  • 허경회;강용석;강성호
    • The Transactions of the Korean Institute of Electrical Engineers A
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    • v.48 no.9
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    • pp.1161-1166
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    • 1999
  • Delay testing has become highlighted in the field of digital circuits as the speed and the density of the circuits improve greatly. However, delay faults in sequential circuits cannot be detected easily due to the existence of state registers. To overcome this difficulty a new scan filp-flop is devised which can be used for both stuck-at testing and delay testing. In addition, the new scan flip-flop can be applied to both the existing functional justification method and the newly-developed reverse functional justification method which uses scan flip-flops as storing the second test patterns rather than the first test patterns. Experimental results on ISCAS 89 benchmark circuits show that the number of testable paths can be increased by about 10% on the average.

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A New All-optical Flip-flop Based on Absorption Nulls of an Injection-locked FP-LD

  • Lee, Hyuek Jae
    • Current Optics and Photonics
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    • v.4 no.5
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    • pp.405-410
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    • 2020
  • A new all-optical flip-flop (AOFF) method based on the absorption nulls of an injection-locked Fabry-Perot laser diode (FP-LD) in transverse magnetic (TM) mode is proposed and experimentally demonstrated. For the set and reset operations of the AOFF, injection locking and the destructive minus of beating in transverse electric (TE) mode are used. The absorption nulls on the TM mode are modulated according to the operations, and then non-inverted (Q) and inverted (${\bar{Q}}$) outputs can be obtained simultaneously. Thanks to the use of several absorption nulls, the proposed AOFF can achieve multiple outputs with extinction ratios of more than 15 dB. Even though the experiment is demonstrated at 100 Mbit/s, the results of previous experiments using the injection of a CW holding beam imply that the operation speed can increase to 10 Gbit/s.