• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2003년도 춘계학술대회 논문집 디스플레이 광소자분야
• /
• pp.177-180
• /
• 2003

We investigated transmittance, surface characteristics, and resistivity according to bending of ITO(indium tin oxide) film with four other multi-barrier film. Transmission data of ITO film with four ITO films showed there was about large 90% transmission above 550nm wavelength at three multi-barrier structures. But, both-side hard coated structure showed relatively low 75% transmission above 550nm wavelength. And, surface images measured from SEM(scanning electron microscope) showed both-side hard coated structure have a tendency of more roughness. Also, resistivity change of four other multi-barrier film showed there was the lowest change at one-side hardcoated structure. Subsequently, with result of resistivity change according to position, we knew the resistivity change of the center increased rapidly than that of the edge.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2001년도 추계학술대회 논문집 Vol.14 No.1
• /
• pp.562-564
• /
• 2001

Transformation of molecular film occurs only usually in air-water interface, 2 dimensions domain's growth and crash are achieved. Organic matter thin film that accumulate molecular film in archaism board only that consist of growth of domain can understand correct special quality of accumulation film supplying information about fine structure and properties of matter of device observing information and so on that is surface forward player and optic enemy using AFM one of SPM application by nano electronics. The stable images are probably due to a strong interaction between the monolayer film and glass substrate. We are unable to obtain molecule resolution in images of the films but did see a marked contrast between images of the bare substrate and those with the network structure film deposited onto it. Formation that prevent when gas phase state and liquid phase state measure but Could know organic matter that molecules form equal and stable film when molecules were not distributed evenly. and accumulated in solid state only.

• 한국표면공학회지
• /
• 제29권6호
• /
• pp.666-672
• /
• 1996

The optical property of CdTe thin film is important for applications such as the compound semiconductor type solar cells. CdTe films are prepared by RF sputtering at various substrate temperature between $25^{\circ}C$ and $300^{\circ}C$, then, annealed in argon gas environment at $400^{\circ}C$. The annealing process of the thin film caused variation in the film structure and the composition of films. The deformation of CdTe thin film was observed by X-ray diffractometry. After annealing, the grain size increased and the portion of the non-crystalline CdTe reduced. Futhermore, the structure of sputtered CdTe film grown at the substrate temperature more than $250^{\circ}C$ was enhanced in the (111) direction of zincblend structure. There was a discrepancy, in the spectroscopic ellipsometer spectrum, between the single crystal CdTe and the sputtered CdTe thin films, especially in the region over 3.2eV. An oxidation layer was found on the CdTe thin film by spectroscopic ellipsometry analysis.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2001년도 추계학술대회 논문집
• /
• pp.562-564
• /
• 2001

Transformation of molecular film occurs only usually in air-water interface, 2 dimensions domain's growth and crash are achieved. Organic matter thin film that accumulate molecular film in archaism board only that consist of growth of domain can understand correct special quality of accumulation film supplying information about fine structure and properties of matter of device observing information and so on that is surface forward player and optic enemy using AFM one of SPM application by nano electronics. The stable images are probably due to a strong interaction between the monolayer film and glass substrate. We are unable to obtain molecule resolution in images of the films but did see a marked contrast between images of the bare substrate and those with the network structure film deposited onto it. Formation that prevent when gas phase state and liquid phase state measure but Could know organic matter that molecules form equal and stable film when molecules were not distributed evenly, and accumulated in solid state only.

• 한국전자파학회논문지
• /
• 제29권1호
• /
• pp.1-9
• /
• 2018

본 논문에서는 건물 내 무선 통신환경 개선을 위한 필름형 이중 대역 주파수 선택 구조를 제안하였다. 제안한 주파수 선택 구조는 간단한 설계 변수를 통해 2.4 GHz와 5 GHz 이중 대역의 공진 주파수를 제어할 수 있는 소형화된 구조로 얇은 투명 필름 위에 스크린 프린팅 방식을 사용하여 설계 및 제작하였으며, 측정을 통해 성능을 확인하였다. 건물 내에 전파환경 성능 분석이 가능한 소프트웨어를 사용하여 설계한 FSS 구조를 건물에 적용했을 때 실외로부터 유입되는 불요신호에 대한 감쇠 성능을 분석하였다. 또한 분석 결과를 검증하기 위하여 실제 건물 내벽에 제작한 FSS 필름을 적용하여 실내 환경의 신호강도를 측정하였다. 측정결과 제작된 이중 대역 주파수 선택 구조는 실제 건축물에 적용할 경우 2.4 GHz와 5 GHz 대역에서 각각 29.4 dB, 15.94 dB의 감쇠 성능을 가짐을 확인하였다.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 2005년도 추계학술대회 논문집 전기물성,응용부문
• /
• pp.27-29
• /
• 2005

ZnO and phosphorus doped ZnO thin films (ZnO:P) are deposited by pulsed laser deposition grown on (001) $Al_{2}O_{3}$. ZnO/ZnO:P/ZnO/$Al_{2}O_{3}$ (multi-layer) structure was used for phosphorus doped ZnO fabrication. This multi-layer structure thin film was annealed at $400^{\circ}C$ for 40 min. The electron concentration of that was changed from $10^{19}$ to $10^{16}/cm^{-3}$ after annealing. ZnO thin films with encapsulated structure showed the enhanced structural and optical properties than phosphorus doped ZnO without encapsulated layer. In this study, encapsulated ZnO structure was suggested to enhance electrical, structural and optical properties of phosphorus doped ZnO thin film and it was identified that encapsulated structure could be used to fabricate high quality phosphorus doped ZnO thin film.

• 한국결정성장학회지
• /
• 제30권1호
• /
• pp.1-6
• /
• 2020

본 연구에서는 패턴화된 사파이어 기판 위에 HVPE(Hydride Vapor Phase Epitaxy System) 법에 의해 50 nm 두께의 AlN thin film을 증착한 뒤, 에피층 구조가 MO CVD에서 성장되었다. AlN 버퍼층 박막의 표면형상이 SEM, AFM에 의해서, 에피층 구조의 GaN 박막의 결정성은 X-선 rocking curve에 의해 분석되었다. 패턴화된 사파이어 기판 위에 증착된 GaN 박막은, 사파이어 기판 위에 증착된 GaN 박막의 경우보다 XRD 피크 세기가 다소 높은 결과를 나타냈다. AFM 표면 형상에서 사파이어 기판 위에 AlN 박막이 증착된 경우, GaN 에피층 박막의 p-side 쪽의 v-pit 밀도가 상대적으로 낮았으며, 결함밀도가 낮게 관찰되었다. 또한, AlN 버퍼층이 증착된 에피층 구조는 AlN 박막이 없는 에피층의 광출력에 비해 높은 값을 나타냈다.

• Composites Research
• /
• 제33권3호
• /
• pp.147-152
• /
• 2020

본 연구에서는 스파/스킨 복합재 일체형 구조물 시편 제작을 통해 구조물 형상에 의한 국부적인 내부압력 구배 및 표면접착필름 적용 조건에 따른 복합재 내부 기공의 거동에 대하여 실험적으로 평가하였다. 표면접착 필름과 탄소섬유 프리프레그 소재의 점도특성 및 열분석 비교를 통해 경화특성 및 속도 차이를 확인하였다. 그리고 스파/스킨 일체형 구조물 시편을 표면접착필름 적용 조건에 따라 2가지 유형으로 성형 제작하여 표면상태검사, 비파괴 검사 및 파괴 검사를 통하여 검증하였다. 표면접착필름이 전체 표면에 적용된 시편#1의 경우 내부구조에 의한 압력 구배가 발생하고 이로 인해 낮은 압력이 적용되는 부위에서 형성된 기공들이 먼저 경화된 표면접착필름에 막혀 배출되지 못함을 확인할 수 있었으며, 표면접착필름이 적용되지 않아 탄소섬유 프리프레그가 전면 노출된 시편#2에서는 내부 기공이 완전히 배출됨을 볼 수 있었으며 미리 경화된 표면접착필름이 내부 기공 이동 및 배출에 있어서 차단막(Barrier film)으로 작용할 수 있음을 확인하였다.

• 한국재료학회지
• /
• 제29권11호
• /
• pp.709-714
• /
• 2019

In order to observe the microstructure and morphology of porous titanium -oxide thin film, deposition is performed under a higher Ar gas pressure than is used in the general titanium thin film production method. Black titanium thin film is deposited on stainless steel wire and Cu thin plate at a pressure of about 12 Pa, but lustrous thin film is deposited at lower pressure. The black titanium thin film has a larger apparent thickness than that of the glossy thin film. As a result of scanning electron microscope observation, it is seen that the black thin film has an extremely porous structure and consists of a separated column with periodic step differences on the sides. In this configuration, due to the shadowing effect, the nuclei formed on the substrate periodically grow to form a step. The surface area of the black thin film on the Cu thin plate changes with the bias potential. It has been found that the bias of the small negative is effective in increasing the surface area of the black titanium thin film. These results suggest that porous titanium-oxide thin film can be fabricated by applying the appropriate oxidation process to black titanium thin film composed of separated columns.

• 전기학회논문지
• /
• 제56권1호
• /
• pp.156-160
• /
• 2007

Surface plasmon resonance(SPR) has been widely studied for biological and chemical sensing applications. The present study conducts numerical simulation for the single and bimetallic layer SPR configurations by using the multiple beam interference matrix(MBIM) method to investigate the influence of wave interference and complex refractive indices of materials on optical characteristics such as reflectance and optical phase shift which are used for sensing. First, calculated reflectances are compared with experimental data for validation. In addition, in the single film structures this study finds out the appropriate film thicknesses with minimum reflectance for cases of gold film and silver film. For a bimetallic silver-gold film structure, in particular, the bimetallic film thicknesses that has the minimum reflectance are found 36 nm for silver and 5 nm for gold. From the results, the use of phase shift would be useful compared to reflectance in determining the SPR configuration because the phase shift becomes more sensitive than reflectance.