• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제48권7호
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• pp.525-529
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• 1999

The influence of ambient gases on field emission performance of Mo-field emitter array(FEA) in the frit-sealing step of field emission display(FED) packaging process was investigated. Mo-tip FEA was mounted on the glass substrate having a surrounded frit(Ferro FX11-137) and fired at $415^{\circ}C$ in the ambient gases of air, $N_2$ and Ar. The Ar gas was proved to be most proper ambient among the used gases through evaluating the turn-on voltage and field emission current of the fired Mo-tip FEA devices. It was confirmed that the Mo surface fired in Ar ambient was less oxidized when compared with another ones annealed in air and Ar ambient by the AFM, XPS, AES and SIMS analysis. Finally, the 3.5 inch-sized Mo-tip FED, which was packaged using frit-sealing process in the Ar ambient, was proposed.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2001년도 춘계학술대회논문집B
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• pp.216-221
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• 2001

The equivalent source method(ESM) is used for the calculation of the internal pressure field for an enclosure which can have arbitrary boundary conditions and may include internal objects which scatter the sound field. The advantage of using ESM is that it requires relatively low computing cost and is easy to model the internal diffracting objects. In the ESM modelling, some of the equivalent positions are chosen to be the same as the first order images of the source inside the enclosure, some are positioned on a spherical surface some distance outside the enclosure. The normal velocity on the surfaces of the enclosure walls is evaluated at a larger number of positions than there are equivalent sources. The sum of the squared difference between this velocity and the expected is minimized by adjusting the strength of the equivalent sources. This study is on the optimal equivalent source positions, the far field sources. Typically, the far field sources are evenly distributed on a surface of a virtual sphere which is centered at the enclosure with a sufficiently large radius. In this study, optimal far field source locations are searched using simulated annealing method and simulation results showed that optimally located sources gave better accuracy even with a smaller number of far field sources.

• 한국전기전자재료학회논문지
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• 제16권3호
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• pp.190-194
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• 2003

Dielectric thin films of (P $b_{0.72}$,L $a_{0.28}$) $Ti_{0.93}$ $O_3$ (PLT(28)) have been deposited on Pt(111)/Ti/ $SiO_2$/Si(100) substrates in-situ by pulsed laser deposition using different annealing and deposition Processes. We have investigated the effect of hydrogen annealing on the ferroelectric properties of PLT thin films and found that the annealing process causes the diffusion of hydrogen into the ferroelectric film resulting in the destruction of polarization. We have tried to form the film by a two-step deposition process In order to improve electrical property. Two-step process to grow PLT films was adopted and verified to be useful to enlarge the grain size of the film and to reduce the leakage current characteristics. Structural properties and electrical properties including dielectric constant, ferroelectric characteristics, and leakage current of PLT thin films were shown to be strongly influenced by grain size. The film deposited by using two-step Process including pre-annealing treatment has a strongly(111) orientation. However, the films deposited by using single -step process with hydrogen annealing process show the smallest grain size. The film deposited by using two-step process including pre-annealing treatment shows the leakage current density of below 10$^{-7}$ A/c $m^2$ for the field of smaller than 100 kV/cm. However, the films deposited by using single-step process with hydrogen annealing process and pre-annealing process show worse leakage current density than the film deposited by using two-step process including pre-annealing treatment.tment.

• 한국자기학회지
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• 제9권2호
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• pp.111-120
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• 1999

RF-마그네트론 스퍼터법으로 제조된 200~1200$\AA$의 Co82Zr6Mo12박막을 회전자장 중에서 열처리할 때 박막의 미세구조 및 표면형상의 변화에 따른 전자기적 특성을 조사하였다. 박막의 두께가 증가할수록 보자력은 감소하는 경향을 보였으나, 포화자화 값의 변화는 나타나지 않았다. 열처리 온도가 30$0^{\circ}C$까지 증가함에 따라 보자력은 박막내부 잔류응력의 감소 및 표면조도의 감소로 인해 감소하였고, 40$0^{\circ}C$에서는 부분적인 결정립성장에 의해 증가하였다. 포화자화 값은 열처리 온도 20$0^{\circ}C$까지 변화를 보이지 않고, 300 및 40$0^{\circ}C$에서는 7.4kG에서 8.0kG로 증가하였는바, 이는 박막내의 미세 Co입자의 석출 및 성장에 기인하였다. 전기비저항은 열처리 온도가 증가함에 따라 감소하였으며, 자기저항값은 거의 0cm에 가까운 음의 값을 보였다. 주파수 변화에 따른 박막의 유효투자율은 30$0^{\circ}C$ 열처리시 1200으로 최대값을 나타냈다. 이상에서 박막을 실제적인 자기저항 헤드의 바이어스층으로 응용을 고려시, 최적 열처리조건은 400Oe의 회전자장 중 30$0^{\circ}C$에서 1시간 열처리할 때로 나타났다.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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• pp.371-372
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• 2012

We have studied lead-based gapless semiconductors, $PbPdO_2$, which is very sensitive to external parameters such as temperature, pressure, electric field, etc[1]. We have fabricated pure $PbPdO_2$, Co- and Mn-doped $PbPdO_2$ thin films using the pulsed laser deposition. Because of the volatile element of Pb, it is very difficult to grow the films. Note that in case of $MgB_2$, Mg is also volatile element. So in order to enhance the quality of $MgB_2$, some experiments are carried out in annealing with Mg-rich atmosphere [2]. This annealing process with volatile element plays an important role in making smooth surface. Thus, we applied such process to our studies of $PbPdO_2$ thin films. As a result, we found the optimal condition of ex-situ annealing temperature ${\sim}650^{\circ}C$ and time ~12 hrs. The ex-situ annealing brought the extreme change of surface morphology of thin films. After ex-situ annealing with PbO-rich atmosphere, the grain size of thin film was almost 100 times enlarged for all the thin films and also the PbO impurity phase was smeared out. And from X-ray diffraction measurements, we determined highly crystallized phases after annealing. So, we measured electrical and magnetic properties. Because of reduced grain boundary, the resistivity of ex-situ annealed samples changed smaller than no ex-situ sample. And the carrier densities of thin films were decreased with ex-situ annealing time. In this case, oxygen vacancies were removed by ex-situ annealing. Furthermore, we will discuss the transport and magnetic properties in pure $PbPdO_2$, Co- and Mn-doped $PbPdO_2$ thin films in detail.

• 열처리공학회지
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• 제32권2호
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• pp.74-78
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• 2019

$Zn_2SnO_4$ thin films were deposited on quartzs substrates by using radio-frequency magnetron sputtering system. Thermal treatments at various temperatures were performed to evaluate the effect of annealing temperatures on the properties of $Zn_2SnO_4$ thin films. Surface morphologies were examined by using field emission-scanning electron microscopy and showed that sizes of grains were slightly increased and grain boundaries were clear with increasing annealing temperatures. The deposited $Zn_2SnO_4$ thin films on quartzs substrates were amorphous structures and no distinguishable crystallographic changes were observed with variations of annealing temperatures. The optical transmittance was improved with increasing annealing temperatures and was over 90% in the wavelength region between 350 and 1100 nm at the annealing temperature of $600^{\circ}C$. The optical energy bandgaps, which derived from the absorbance of $Zn_2SnO_4$ thin films, were increased from 3.34 eV to 3.43 eV at the annealing temperatures of $450^{\circ}C$ and $600^{\circ}C$, respectively. As the annealing temperature was increased, the electron concentrations were decreased. The electron mobility was decreased and resistivity was increased with increasing annealing temperatures with exception of $450^{\circ}C$. These results indicate that heat treatments at higher annealing temperatures improve the optical and electrical properties of rf-sputtered $Zn_2SnO_4$ thin films.

• 한국자기학회지
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• 제11권2호
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• pp.72-77
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• 2001

DC 마그네트론 방식으로 제조한 PtMn계 상부층형(top) 스핀밸브 박막을 반강자성층인 PtM의 fcc (111) 구조에서 fat (111)구조 천이를 위하여 27$0^{\circ}C$에서 3 kOe의 외부자장을 가해주면서 일차적인 열처리를 한 후, 이차적으로 무자장 열처리를 하여 상온에서 자기적 특성을 조사하였다. Si/A1$_2$O$_3$ (500$\AA$)/Ta(50$\AA$)NiFe(40$\AA$)/CoFe(17$\AA$)/Cu(28$\AA$)/CoFe (30$\AA$)PtMn(200$\AA$)Ta(50$\AA$) top 스핀밸브 시료에서 자기저항비를 조사한 결과 열처리 온도가 높아질수록 자기저항비가 완만히 감소하나 325 $^{\circ}C$ 이상에서 급격히 감소하여 1 %까지 감소하는 것을 확인하였으며, 이것은 열처리 온도가 높아질수록 반강자성층과 피고정층사이의 교환 결합력이 약해지는 것에 기인하는 것으로 판단하였다. 열처리 온도 증가에 따른 교환 바이어스 자장은 325 $^{\circ}C$ 이상에서 급격히 감소하였고, 고정층과 자유층사이의 상호 결합 세기(interlayer coupling field, $H_{int}$)는 $325^{\circ}C$ 이상에서 크게 증가하였는데, 이것은 열처리 온도가 증가함에 다라 Mn의 상호 확산(inter-diffusion)dl 증가하여 계면에서의 거칠기(roughness)가 커지기 때문이라고 생각하였다. 이와 같은 결과에서 PtMn 스핀밸브의 급격한 자기적 특성변화가 일어나는 열처리 온도가 PtMn계 스핀밸브 박막의 블로킹 온도(blocking temperature, $T_b$)와 잘 일치함을 호가인할 수 있었다.

• 한국전기전자재료학회논문지
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• 제25권7호
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• pp.521-524
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• 2012

We report on variations of electrical properties with different active layer thickness and post-annealing temperature in amorphous In-Ga-Zn-O (IGZO) thin-film transistors (TFTs). In particular, subthreshold swing (SS) of the IGZO-TFTs was improved as increasing the active layer thickness at an given post-annealing temperature, accompanying the negative shift in turn-off voltage. However, as increasing post-annealing temperature, only turn-off voltage was shifted negatively with almost constant SS value. The effect of the active layer thickness and post-annealing temperature on electrical properties, such as SS, field effect mobility and turn-off voltage in IGZO-TFTs has been explained in terms of the variation of trap density in IGZO channel layer and at gate dielectric/IGZO interface.

• Transactions on Electrical and Electronic Materials
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• 제5권2호
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• pp.66-70
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• 2004

The Sr$\_$0.7/Bi$\_$2.3/Ta$_2$O$\_$9/(SBT)thin films are deposited on Pt-coated electrode (Pt/TiO$_2$/SiO$_2$/Si) using a RE magnetron sputtering method. The ferroelectric properties of SBT capacitors with annealing times were studied. As a result of conducting the X-ray diffraction analysis and the electron microscopy analysis, the perovskite phase began to grow from 10 minutes after annealing the specimen, and excellent crystallization was accomplished at 60 minutes after annealing the specimen. The remanet polarization (2P$\_$r/) value and the coercive electric field (E$\_$c/) of the SBT thin film specimen showed the most excellent characteristics at 60 minutes after annealing the specimen, which were approximately 12.40 C/$\textrm{cm}^2$ and 30 kV/cm, respectively. The leakage current density of the SBT thin film specimen as annealed for 60 minutes was approximately 2.81${\times}$10$\^$－9/A/$\textrm{cm}^2$.

• 한국재료학회지
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• 제12권5호
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• pp.375-381
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• 2002

N-type ${\beta}-FeSi_2$ with a nominal composition of $Fe_{0.98}Co_{0.02}Si_2$ powders has been produced by mechanical alloying process and consolidated by vacuum hot pressing. As-milled powders were of metastable state and fully transformed to ${\beta}-FeSi_2$ phase by subsequent isothermal annealing. However, as-consolidated $Fe_{0.98}Co_{0.02}Si_2$ consisted of untransformed mixture of ${\alpha}-Fe_2Si_ 5$ and $\varepsilon$-FeSi phases. Isothermal annealing has been carried out to induce the transformation to a thermoelectric semiconducting ${\beta}-FeSi_2$ phase. The transformation behavior of ${\beta}-FeSi_2$ was investigated by utilizing DTA, a modified TGA under magnetic field, SEM, and XRD analyses. Isothermal annealing at $830^{\circ}C$ in vacuum led to the thermoelectric semiconducting ${\beta}-FeSi_2$ phase transformation, but some residual metallic $\alpha$ and $\varepsilon$ phases were unavoidable even after prolonged annealing. Thermoelectric properties were remarkably improved by isothermal annealing due to the transformation from metallic $\alpha$ and $\varepsilon$ phases to semiconducting phases.