• Title/Summary/Keyword: ferroelectric materials

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Effects of High-Energy Ball Milling and Sintering Time on the Electric-Field-Induced Strain Properties of Lead-Free BNT-Based Ceramic Composites

  • Nga-Linh Vu;Nga-Linh Vu;Dae-Jun Heo;Thi Hinh Dinh;Chang Won Ahn;Chang Won Ahn;Hyoung-Su Han;Jae-Shin Lee
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.36 no.5
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    • pp.505-512
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    • 2023
  • This study investigated crystal structures, microstructures, and electric-field-induced strain (EFIS) properties of Bi-based lead-free ferroelectric/relaxor composites. Bi1/2Na0.82K0.18)1/2TiO3 (BNKT) as a ferroelectric material and 0.78Bi1/2(Na0.78K0.22)1/2TiO3-0.02LaFeO3 (BNKT2LF) as a relaxor material were synthesized using a conventional solid-state reaction method, and the resulting BNKT2LF powders were subjected to high-energy ball milling (HEBM) after calcination. As a result, HEBM proved a larger average grain size of sintered samples compared to conventional ball milling (CBM). In addition, the increased sintering time led to grain growth. Furthermore, HEBM treatment and sintering time demonstrated a significant effect on EFIS of BNKT/BNKT2LF composites. At 6 kV/mm, 0.35% of the maximum strain (Smax) was observed in the HEBM sample sintered for 12 h. The unipolar strain curves of CBM samples were almost linear, indicating almost no phase transitions, while HEBM samples displayed phase transitions at 5~6 kV/mm for all sintering time levels, showing the highest Smax/Emax value of 700 pm/V. These results indicated that HEBM treatment with a long sintering time might significantly enhance the electromechanical strain properties of BNT-based ceramics.

FRAM개발동향 및 신개념 FRAM

  • 유인경
    • The Magazine of the IEIE
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    • v.25 no.7
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    • pp.53-63
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    • 1998
  • This paper reviews development trends of ferroelectric memories. Materials requirements, integration issues, device structures are reviewed for 1T-1C and 1Tr type FRAM. Other types of FRAM such as DSRAM and SFRAM are also described. Limitations in FRAM development are discussed for the viewpoint of memory concept and material properties. Finally, novel FRAM structures and operational concepts are proposed in order to avoid such limitations.

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Investigation on the property and preparation of ferroelectric Pb(Zr,Ti)$O_3$ by Sol-Gel method (Sol-Gel법에 의한 강유전체 Pb(Zr, Ti)$O_3$의 제조 및 특성에 관한 연구)

  • 임정한;김영식;장복기
    • Electrical & Electronic Materials
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    • v.7 no.6
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    • pp.496-503
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    • 1994
  • In recent years Sol-Gel processing provides an interesting alternative method for the fabrication of ferroelectric thin layers and powder. PZT powder was prepared from an alkoxide-based solution by a Sol-Gel method. Gelation of synthesized complex solutions, microstructure, thermal analysis and crystallization behaviors of the calcined powder were studied in accordance with a water content and a catalyst. Especially gelation and crystallization behavior were analysed with the change of pH. The gelation time decreased as the pH of the mixed solution increased. For PZT powder with 650.deg. C heat treatment, 100% perovskite phase was formed by using either acidic or basic catalyst. By using either acidic or basic catalyst, we were able to get very fine powders of uniform shape with an average particle size of 0.8-1.mu.m.

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A Study on Surface of BST Thin Films by Sol-Gel Methods (졸겔법으로 제작된 BST 박막의 구조적 특성)

  • 홍경진;민용기;조재철
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.07a
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    • pp.377-380
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    • 2001
  • The BST thin films to composite (Ba$\sub$x/Sr$\sub$l-x/)TiO$_3$ using sol-gel method were fabricated on Pt/Ti/SiO$_2$/Si substrate. The thin film capacitor to be ferroelectric materials was investigated by structural and electrical properties. BST solution was composited by moi ratio, and then spin-coated (from 3 times to 5 times coating on Pt/SiO$_2$/Si substrate. Thickness of BST ceramics thin films are about 2600∼2800[${\AA}$] in 3 times deposition. The property of leakage current was stable when the applied voltage was 3[V]. Leakage current of 3 times coated BST thin film was 10$\^$-9/∼10$\^$-11/[A] at 0∼3[V].

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Time-Resolved Infrared Spectroscopy of Molecular Reorientation During FLC Electro-Optic Switching

  • Jang, Won-Gun;Clark, Noel A.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.1112-1117
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    • 2003
  • Polarized Fourier transform infrared (IR) absorption is used to probe molecular conformation in a ferroelectric liquid crystal (FLC) during the reorientation induced by the external field. Spectra of planar aligned cells of FLC W314 are measured as functions of IR polarizer orientation and electric field applied to the FLC. The time evolution of the dichroism of the absorbance due to biphenyl core and alkyl tail molecular vibration modes, is observed. Static IR dichroism experiments show a W314 dichroism structure in which the principal axis of dielectric tensor from molecular core vibration are tilted further from the smectic layer normal than those of the tail. This structure indicates the effective binding site in which the molecules are confined in the Sm-C phase has, on average, "zig-zag" shape and this zig-zag binding site structure is rigidly maintained while the molecular axis rotates about the layer normal during field-induced switching.

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Preperation of PZT ferroelectric thin films by sol-gel processing (졸-겔법에 의한 강유전체 박막의 제작)

  • Lee, B.S.;Shin, T.H.;Cho, G.S.;Yuk, J.H.;You, D.H.;Kim, Y.H.;Kim, S.O.;Ji, S.H.;Lee, D.C.
    • Proceedings of the KIEE Conference
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    • 2001.07c
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    • pp.1414-1416
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    • 2001
  • Crack-free and homogeneous compact and epitaxial lead zirconate titanate(PZT) ferroelectric thin films with perovsikte structure have been prepared by sol-eel method. Tetrabutyl titanate, lead acetate and zirconium nitrate are used as raw materials. Glacial acetic acid is used as a catalyst. Ethylene glycol monoethyl ether is used as a solvent. The annealing temperatures of th thin films are 600~900$^{\circ}C$. The values of the remanent polarization Pr, and the coercive field $E_c$, of the PZT ceramic thin films are 46, 35 ${\mu}C/cm^2$ respectively.

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Preparation and Characterization of Screen-printed Lead Zirconate Titanate Thick Films

  • Lee Sung-Gap
    • Transactions on Electrical and Electronic Materials
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    • v.7 no.2
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    • pp.72-75
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    • 2006
  • Ferroelectric PZT heterolayered thick films were fabricated by the alkoxide-based sol-gel method. PZT(Zr/Ti=60/40) paste was made and alternately screen-printed on the $Al_2O_3$ substrates. We have introduced a press-treatment to obtain a good densification of screen printed films. The porosity of the thick films was decreased with increasing the applied pressure and the thick films pressed at $0.6ton/cm^2$ showed the dense microstructure and thickness of about $76{\mu}m$. The relative dielectric constant increased with increasing the applied pressure. The remanent polarization and coercive field increased with increasing applied pressure and the values for the PZT thick films pressed at $0.6ton/cm^2$ were $16.6{\mu}C/cm^2$, 76.9 kV/cm, respectively.

A design of $90^{\circ}$ hybrid phase shifter using ferroelectric materials (강유전체를 사용한 $90^{\circ}$ 하이브리드 구조의 위상 변위기 설계)

  • Kim, Young-Tae;Ryu, Han-Cheol;Lee, Su-Jae;Kwak, Min-Hwan;Moon, Seung-Eon;Kim, Hyeong-Seok;Park, Jun-Seok
    • Proceedings of the KIEE Conference
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    • 2002.07c
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    • pp.1919-1921
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    • 2002
  • In this paper, we were designed the ferroelectric phase shifter using 3-dB, $90^{\circ}$ branch-line hybrid coupler with two ports terminated in symmetric phase-controllable reflective networks. The design of phase shifter is based on reflection theory of terminating circuits. In order to find the optimum conditions of reflect phase, the effect of a change of capacitance and transmission line connected with two coupled ports of a coupler have been investigated. To obtain more accurate design parameters, finite element method is applied. We were showed large phase variation with small capacitance variation in the parallel connection of capacitor and transmission line by using EM-simulation and circuit-simulation.

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Structural and Dielectric Properties of Pb[(Zr,Sn)Ti]NbO3 Thin Films Deposited by Radio Frequency Magnetron Sputtering

  • Choi, Woo-Chang
    • Transactions on Electrical and Electronic Materials
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    • v.11 no.4
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    • pp.182-185
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    • 2010
  • $Pb_{0.99}[(Zr_{0.6}Sn_{0.4})_{0.9}Ti_{0.1}]_{0.98}Nb_{0.02}O_3$ (PNZST) thin films were deposited by radio frequency magnetron sputtering on a $(La_{0.5}Sr_{0.5})CoO_3$ (LSCO)/Pt/Ti/$SiO_2$/Si substrate using a PNZST target with an excess PbO of 10 mole%. The thin films deposited at the substrate temperature of $500^{\circ}C$ crystallized to a perovskite phase after rapid thermal annealing (RTA). The thin films, which annealed at $650^{\circ}C$ for 10 seconds in air, exhibited good crystal structures and ferroelectric properties. The remanent polarization and coercive field of the fabricated PNZST capacitor were approximately $20uC/cm^2$ and 50 kV/cm, respectively. The reduction of the polarization after $2.2\;{\times}\;10^9$ switching cycles was less than 10%.