• Applied Microscopy
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• 제41권1호
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• pp.75-79
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• 2011

For quantitative analysis of nano-crystal structure, we reported the accuracy improvement method of lattice parameters measured from electron diffraction. For calculation of Au lattice parameters used as a standard crystal structure, it was considered two different acquisition methods (detector and enegy-filter) and three different calculation methods (conventional, least-square and regression fit). As a result, the measurement reliability could be enhanced by using CCD camera which gives higher performance, while energy-filtering did not affect the improvement the camera constant accuracy. Also, the accuracy of lattice parameters could be improved up to $10^{-4}$ order by regression fitting with correction formula. Finally, it is expected that the combination of regression fitting and intensity extraction from energy-filtered precession electron diffraction gives a solution of quantitative structure analysis for unknown nano-crystals.

• Applied Microscopy
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• 제44권4호
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• pp.138-143
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• 2014

Transmission electron microscope (TEM) is an excellent tool for studying the structure and properties of nanostructured materials. As the development of $C_s$-corrected TEM, the direct analysis of atomic structures of nanostructured materials can be performed in the high-resolution transmission electron microscopy (HRTEM). Especially, fast Fourier transform (FFT) technique in image processing is very useful way to determine the crystal structure of HRTEM images in reciprocal space. To apply FFT technique in HRTEM analysis in more reasonable and friendly manner, we made a new circular region of interest (C-ROI) FFT script and tested it for several HRTEM analysis. Consequentially, it was proved that the new FFT application shows more quantitative and clearer results than conventional FFT script by removing the streaky artifacts in FFT pattern images. Finally, it is expected that the new FFT script gives great advantages for quantitative interpretation of HRTEM images of many nanostructured materials.

• Applied Microscopy
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• 제38권4호
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• pp.285-291
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• 2008

Electron tomography의 정량적 분석을 위해서 대물렌즈 조리개가 투과빔의 강도에 미치는 영향을 평가하였다. Electron tomography에 도입되는 Beer's law의 올바른 적용을 위해서는 투과빔은 시료의 기울기에 따른 mass thickness의 변화에 의한 효과만을 반영해야 한다. 그러므로 빔 경로상의 대물렌즈 조리개, 홀더 등에 의한 다른 효과는 제거되어야 한다. 본 연구에서는 대물렌즈 조리개의 cut-off 효과를 120 kV TEM과 Quantifoil holey 카본 시료를 이용하여 상세히 평가하였다. 대물렌즈 조리개를 사용하지 않은 경우와 비교할 때, $30{\mu}m$ 크기의 대물렌즈 조리개를 통과한 투과전자빔의 강도는 약 16.7%의 감소가 일어난다. 또한 $55^{\circ}$ 이상의 고경사각 기울기에서는 대물렌즈 조리개의 cut-off 효과에 의해 14.2%의 강도 감소가 추가적으로 발생함을 알 수 있었다. Electron tomography에서 정량 분석을 위해서는 이러한 대물렌즈 조리개의 영향을 고려해야만 한다. 또한 Beer's law의 올바른 적용을 위해서는 일련의 기울기에 따른 2차원적 영상은 가능하면 대물렌즈 조리개를 사용하지 않은 상태에서 획득하는 것이 바람직하다.

• Applied Microscopy
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• 제38권3호
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• pp.275-278
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• 2008

Electron tomography (ET) is an electron microscopic technique for obtaining a 3-D image from any electron microscopy specimen and its application in biomedical science has been increased thanks to development of electron microscopy and related technologies during the last decade. There are few researches on ET in Korea during this period. Although the importance of ET has been recognized recently by many researchers, initial approach to electron tomographic research is not easy for beginners. The 4th International Congress on Electron Tomography (4 ICET) was held on Nov $5{\sim}8$, 2006, at San Diego. The program dealt instrumentation, reconstruction algorithm, visualization/quantitative analysis and electron tomographic presentation of biological specimen and nano particles. 1 have summarized oral presentations and analyzed the posters presented on the meeting. Cryo-electron microscopic system was popular system for ET and followed conventional transmission electron microscopic system. Cultured cell line and tissue were most popular specimens analyzed and microorganisms including bacteria and virus also constituted important specimens. This analysis provides a current state of art in ET research and a guide line for practical application of ET and further research strategies.

• Applied Microscopy
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• 제45권3호
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• pp.183-188
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• 2015

Due to the miniaturization of semiconductor devices, their crystal structure on the nanoscale must be analyzed. However, scanning electron microscope-electron backscatter diffraction (EBSD) has a limitation of resolution in nanoscale and high-resolution electron microscopy (HREM) can be used to analyze restrictive local structural information. In this study, three-dimensional (3D) automated crystal orientation and phase mapping using transmission electron microscopy (TEM) (3D TEM-EBSD) was used to identify the crystal structure relationship between an epitaxially grown CdS interfacial layer and a $Cu(In_xGa_{x-1})Se_2$ (CIGS) solar cell layer. The 3D TEM-EBSD technique clearly defined the crystal orientation and phase of the epitaxially grown layers, making it useful for establishing the growth mechanism of functional nano-materials.

• Applied Microscopy
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• 제36권3호
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• pp.209-216
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• 2006

투과전자현미경을 이용한 3차원적 구조분석의 신뢰도를 향상시키기 위해서는 고니오미터와 사용되는 시료 홀더에 대한 정확도와 정밀도의 측정 및 보정이 필요하다. 본 연구에서는 상업용 투과전자현미경 홀더 중의 하나인 rotation holder에 대한 작동원리를 기술하고 회전각의 정확도를 측정하였다. 투과전자현미경 내부에서 회전된 이미지의 분석을 통한 홀더의 회전각의 측정오차는 ${\pm}0.42^{\circ}$이었다. 회전각의 정확도를 비교하기 위해 투과전자 현미경 외부에서 시료 홀더에 부착된 반사경에 레이저 빔을 반사시켜 측정한 결과, 회전각의 측정오차는 ${\pm}0.6^{\circ}$이었다. 추가적으로 시료컵과 회전벨트 사이의 불안정한 맞물림에 의해 야기된 비정상적인 시료의 회전경로에 대해서도 점검하였다.

• Bulletin of the Korean Chemical Society
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• 제30권1호
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• pp.183-187
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• 2009

The structure of nano-crystalline $MnFe_2O_4$ was determined and refined with electron powder diffraction data employing the Rietveld refinement technique. A nano-crystalline sample (with average crystal size of about 10.9 nm) was characterized by selected area electron diffraction in an energy-filtering transmission electron microscope operated at 120 kV. All reflection intensities were extracted from a digitized image plate using the program ELD and then used in the course of structure refinements employing the program FULLPROF for the Rietveld analysis. The final structure was refined in space group Fd-3m (# 227) with lattice parameters a=8.3413(7) $\AA$. The reliability factors of the refinement are $R_F$=7.98% and $R_B$=3.55%. Comparison of crystallographic data between electron powder diffraction data and reference data resulted in better agreement with ICSD-56121 rather than with ICSD-28517 which assumes an initial structure model.

• Bulletin of the Korean Chemical Society
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• 제34권3호
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• pp.788-792
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• 2013

A shortcoming of using transmission electron microscopy (TEM) for structural analysis via electron diffraction is the relatively large error of the measurements as compared to X-ray diffraction. To reduce these errors, various internal standard methods from earlier studies have been widely used. We developed a new device to facilitate the application of internal standard methods in preparation of TEM grids used for nanopowder analysis. Through the application of a partial mask on the TEM grid, both the internal standards and the research materials can be loaded on the same grid. Through this process, we conducted a TEM analysis that compared synthetic hydroxyapatite (HAp) nanopowder to bone apatite from a bovine femur. We determined that the accuracy of the d-spacing measurements of the HAp and bone powders could be improved to better than 1% after statistical treatments of the experimental data. By applying a quarter mask, we loaded four different nanoparticles on a single TEM grid, with one section designated for the internal standard.

• 한국의학물리학회지:의학물리
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• 제33권4호
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• pp.158-163
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• 2022

Purpose: We subjected scanning electron microscopic (SEM) images of the active layer of EBT3 film to texture analysis to determine the dose-response curve. Methods: Uncoated Gafchromic EBT3 films were prepared for direct surface SEM scanning. Absorbed doses of 0-20 Gy were delivered to the film's surface using a 6 MV TrueBeam STx photon beam. The film's surface was scanned using a SEM under 100× and 3,000× magnification. Four textural features (Homogeneity, Correlation, Contrast, and Energy) were calculated based on the gray level co-occurrence matrix (GLCM) using the SEM images corresponding to each dose. We used R-square to evaluate the linear relationship between delivered doses and textural features of the film's surface. Results: Correlation resulted in higher linearity and dose-response curve sensitivity than Homogeneity, Contrast, or Energy. The R-square value was 0.964 for correlation using 3,000× magnified SEM images with 9-pixel offsets. Dose verification was used to determine the difference between the prescribed and measured doses for 0, 5, 10, 15, and 20 Gy as 0.09, 1.96, -2.29, 0.17, and 0.08 Gy, respectively. Conclusions: Texture analysis can be used to accurately convert microscopic structural changes to the EBT3 film's surface into absorbed doses. Our proposed method is feasible and may improve the accuracy of film dosimetry used to protect patients from excess radiation exposure.

• Bulletin of the Korean Chemical Society
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• 제26권1호
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• pp.77-84
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• 2005

We prepared the new nonlinear optical chromophores that show fairly high microscopic nonlinearity through intramolecular charge transfer. Phenothiazine and carbazole units played an important role to contribute high electron donability and connect the resonance pathway via conjugative effect in the cyclized ring beside the aromatic ring. Theoretical calculation, electrochemical analysis, and absorption spectroscopic study gave us useful information about the energy states and microscopic nonlinearities of two serial chromophores. We compared the microscopic nonlinearities of four chromophores with the conjugation length and electron donability in the push-pull type NLO chromophores. The effect of gradient donability and lengthening the conjugation were investigated on the electronic state and microscopic nonlinearity.