1 |
Song K, Kim YJ, Kwon KH, Kim JG, Moon SM, Cho NH: Structure determination of nano-crystalline, , using precession electron diffraction. Korean J. Microscopy 39(4) : 341-348, 2009.
|
2 |
Vincent R, Bird DM: Measurement of kinematic intensities from large-angle electron-diffraction patterns. Philos Mag Lett 53 : L35-L40, 1986.
|
3 |
Vincent R, Midgley PA: Double conical beam-rocking system for measurement of integrated electron diffraction intensities. Ultramicroscopy 53 : 271-282, 1994.
DOI
ScienceOn
|
4 |
Zou XD, Sukharev Y, Hovmöller S: ELD-a computer program system for extracting intensities from electron diffraction patterns. Ultramicroscopy 49 : 147-158, 1993.
DOI
|
5 |
Ahn JP, Park JK: Electron diffraction and nanostructural analysis in electron microscope. Ploymer Science and Technology 17(4) : 493-510, 2006.
|
6 |
Kim JG, Seo JW, Cheon JW, Kim YJ: Rietveld analysis of nanocrystalline MnFe2O4 with electron powder diffraction. Bull Korean Chem Soc 30 : 183-187, 2009.
DOI
|
7 |
Kim JG, Song K, Kwon KH, Hong KM, Kim YJ: Structure analysis of inorganic crystals by energy-filtered precession electron diffraction. J Electron Microscopy 59(4) : 273-283, 2010.
DOI
ScienceOn
|
8 |
Schamp CT, Jesser WA: On the measurement of lattice parameters in a collection of nanoparticles by transmission electron diffraction. Ultramicroscopy 103 : 165-172, 2005.
DOI
ScienceOn
|