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Accuracy Improvement of Lattice Parameters Measured from Electron Diffraction Data  

Lee, Sang-Gil (Division of Electron Microscopic Research, Korea Basic Science Institute)
Song, Kyung (Division of Electron Microscopic Research, Korea Basic Science Institute)
Kim, Jin-Gyu (Division of Electron Microscopic Research, Korea Basic Science Institute)
Publication Information
Applied Microscopy / v.41, no.1, 2011 , pp. 75-79 More about this Journal
Abstract
For quantitative analysis of nano-crystal structure, we reported the accuracy improvement method of lattice parameters measured from electron diffraction. For calculation of Au lattice parameters used as a standard crystal structure, it was considered two different acquisition methods (detector and enegy-filter) and three different calculation methods (conventional, least-square and regression fit). As a result, the measurement reliability could be enhanced by using CCD camera which gives higher performance, while energy-filtering did not affect the improvement the camera constant accuracy. Also, the accuracy of lattice parameters could be improved up to $10^{-4}$ order by regression fitting with correction formula. Finally, it is expected that the combination of regression fitting and intensity extraction from energy-filtered precession electron diffraction gives a solution of quantitative structure analysis for unknown nano-crystals.
Keywords
Camera constant; Electron diffraction; Lattice parameter;
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Times Cited By KSCI : 2  (Citation Analysis)
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