• 제목/요약/키워드: electrical tree

검색결과 591건 처리시간 0.025초

Assessment of Seed Viability and Vigour in Neem (Azadirachta indica A. Juss.)

  • Kumar, Devendra
    • Journal of Forest and Environmental Science
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    • 제29권4호
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    • pp.282-291
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    • 2013
  • Rapid loss in viability of neem (Azadirachta indica A. Juss.) seed is a major problem. Present effort was undertaken for developing a set pattern for assessing of viability and vigour in seed of various mother tree age of neem (Age I-06 years, Age II-15 years, Age III-25 years and Age IV->30 years old). Various viability test viz. triphenyle tetrazolium chloride test, electrical conductivity, excised embryo test, and germination test have been performed on seeds obtained from mother tree age classes. Inconsistency was observed with the TTC and EC test in germination of seed in laboratory as well as nursery. While various vigour tests viz. cold test, chemical stress test (methanol stress test), and accelerated ageing test alongwith ageing index, germination test (G%, MGT and GV) and various seedling growth parameters like seedling length (cm), number of leaves, collar diameter (cm), total biomass (g) alongwith mathematical indices i.e. vigour index, sturdiness quotient, volume index, quality index, root shoot ratio in nursery as well have been taken for study and showed better consistency. On the basis present study results of various viability and vigour test indicated that mother tree age class II performed better in comparison to others and it can be recommended for seed collection. Further it is also recommended that viability of neem seed may be assessed using various laboratory tests like excise embryo test and germination test (G%, MGT and GV) and vigour test may be taken preferably by cold germination test, chemical (methanol) stress test, accelerated ageing test in laboratory and germination alongwith various seedling growth parameters seedling length (cm), number of leaves, collar diameter (cm), total biomass (g) alongwith mathematical indices like Vigour Index, Sturdiness quotient, Volume Index, Quality index, root shoot ratio in nursery as discussed in this study.

HVDC 서브모듈용 커패시터의 고장 분석 (Failure analysis of capacitor for sub-module in HVDC)

  • 강필순;송성근
    • 전기전자학회논문지
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    • 제22권4호
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    • pp.941-947
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    • 2018
  • 일반적으로 커패시터는 빈번한 충 방전으로 시스템의 수명에 큰 영향을 미친다. 본 논문에서는 고전압, 대전류의 HVDC 서브모듈용 필름 커패시터의 핵심 고장원인을 분석하여 커패시터의 설계 및 제조공정의 주의사항을 분석한다. 먼저 커패시터의 FMEA 수행을 통해 고장원인, 고장모드, 고장영향에 대해 분석한다. 커패시터의 고장에 가장 큰 영향을 주는 고장원인과 영향을 정량적으로 평가하기 위해 커패시터에 대한 고장나무(Fault-tree)를 제시하고 설계인자와 구동환경의 조건에 따른 고장률을 분석한다. 커패시터 고장의 핵심 원인이 커패시턴스 변화에 있음을 확인하고, 커패시터의 고장률 저감을 위해서 커패시터의 설계와 제조공정 중 온도상승, 코로나 발생, 전극팽창, 절연거리 감소를 최소화할 필요가 있음을 검증한다.

Path planning of a Robot Manipulator using Retrieval RRT Strategy

  • Oh, Kyong-Sae;Kim, Eun-Tai;Cho, Young-Wan
    • International Journal of Fuzzy Logic and Intelligent Systems
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    • 제7권2호
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    • pp.138-142
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    • 2007
  • This paper presents an algorithm which extends the rapidly-exploring random tree (RRT) framework to deal with change of the task environments. This algorithm called the Retrieval RRT Strategy (RRS) combines a support vector machine (SVM) and RRT and plans the robot motion in the presence of the change of the surrounding environment. This algorithm consists of two levels. At the first level, the SVM is built and selects a proper path from the bank of RRTs for a given environment. At the second level, a real path is planned by the RRT planners for the: given environment. The suggested method is applied to the control of $KUKA^{TM}$, a commercial 6 DOF robot manipulator, and its feasibility and efficiency are demonstrated via the cosimulatation of $MatLab^{TM}\;and\;RecurDyn^{TM}$.

고체절연체의 내부결함에 따른 부분방전 특성과 패턴분류 (Properties of PD and Classification of Defect Patterns in Solid Insulation)

  • 강성화;박영국;이광우;김완수;이용희;임기조
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1999년도 하계학술대회 논문집 D
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    • pp.1624-1626
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    • 1999
  • PD in defect of solid insulation system is very harmful since It often leads to deterioration of insulation by the combined action of the discharge ions bombarding the surface and the action of chemical compounds that are formed by the discharge. PD can indicate incipient failure, so it has been used to determine degradation of insulation. In this paper. we investigated PD in defects of solid insulation by using statical method and classified PD patterns with surface discharge, electrical tree and void discharge by using Kohonen network. we used peak charge, average discharge power, average discharge current, repetition rate, skewness, kurtosis, QN of the max pulse height vs. repetition rate $H_q(n)$ for analysis and classification.

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기계적 스트레스가 XLPE에서의 전기트리 개시특성에 미치는 영향 (The Effects of Mechanical Stress on the Initiation Characteristics of Electrical Tree in XLPE)

  • 신두성;최수걸;전승익
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2001년도 추계학술대회 논문집 전기물성,응용부문
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    • pp.241-244
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    • 2001
  • 절연체의 수명과 직접적인 관련이 있는 전기트리의 개시특성을 연구하는데 있어서, 전기트리의 개시시간이 매우 길기 때문에 실험적으로 절연재료의 수명을 구하는데 어려움이 있다. 따라서. 본 논문에서는 Weibull 해석을 이용하여, 일반적으로 사용되는 가속시험법에 의하여 얻어진 전기트리 개시전계를 사용하여 일정전압 인가시에 전기트리 개시시간을 추정하는 방법을 이론적으로 고찰하여 실험에 적용하였다. 또한 기계적 스트레스에 의한 전기트리 개시특성을 평가하기 위하여 기계적 스트레스를 모의한 XLPE 시료에 대하여 이러한 기계적 스트레스가 전기트리 개시전계 및 개시시간 특성에 미치는 영향을 평가하였다. 기계적 스트레스가 전기트리 개시전계 뿐만 아니라 개시시간을 현저하게 감소시켰으며, XLPE의 장기적인 신뢰성을 보증하기 위해서는 이러한 기계적 스트레스를 완화시키는 것이 매우 중요하다.

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Post Silicon Management of On-Package Variation Induced 3D Clock Skew

  • Kim, Tak-Yung;Kim, Tae-Whan
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제12권2호
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    • pp.139-149
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    • 2012
  • A 3D stacked IC is made by multiple dies (possibly) with heterogeneous process technologies. Therefore, die-to-die variation in 2D chips renders on-package variation (OPV) in a 3D chip. In spite of the different variation effect in 3D chips, generally, 3D die stacking can produce high yield due to the smaller individual die area and the averaging effect of variation on data path. However, 3D clock network can experience unintended huge clock skew due to the different clock propagation routes on multiple stacked dies. In this paper, we analyze the on-package variation effect on 3D clock networks and show the necessity of a post silicon management method such as body biasing technique for the OPV induced 3D clock skew control in 3D stacked IC designs. Then, we present a parametric yield improvement method to mitigate the OPV induced 3D clock skew.

의사결정나무를 이용한 생물의 행동 패턴 구분과 인식 (Classification and Recognition of Movement Behavior of Animal based on Decision Tree)

  • 이승태;김성신
    • 한국지능시스템학회:학술대회논문집
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    • 한국퍼지및지능시스템학회 2005년도 추계학술대회 학술발표 논문집 제15권 제2호
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    • pp.225-228
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    • 2005
  • 본 논문에서는 생물의 2차원영상에서 4가지의 특징을 추출한 다음 약품에 대한 생물의 행동 패턴 반응에 대하여 의사결정나무를 적용하여 패턴의 인식 및 분류를 하였다. 생물의 행동패턴을 대변하는 물리적인 특징인 속도, 방향전환 각도, 이동거리에 대하여 각각 중간이상속도비율, FFT(Fast Fourier Transformation), 2차원 히스토그램 면적, 프렉탈, 무게중심을 사용하여 특징을 추출하였다. 이렇게 추출된 4가지의 특징변수들을 사용하여 의사결정나무 모델을 구성한 다음 생물의 약품 첨가에 대한 반응을 분석하였다. 또한 결과에서는 기존의 생물의 행동패턴 구분에 쓰였던 전형적인 기법(conventional methods)보다 본 연구에서 적용한 의사결정나무가 생물의 행동패턴이 가지는 물리적 요소에 대한 독해력을 가짐을 보임으로써 특정환경에서 이동행동에 대한 분석을 용이하게 하고자 하였다.

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경험적 규칙을 이용한 배전계통의 재구성기법 (Distribution Feeder Reconfiguration Using Heuristic Rules)

  • 조시형;최병윤;우광방
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1991년도 하계학술대회 논문집
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    • pp.363-365
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    • 1991
  • This paper presents a method for feeder reconfiguration in order to operate distribution systems efficiently using heuristic rules. The reconfiguration method presented here not only eliminates various abnormal states but also achieves minimum power loss and optimum load balance of the distribution feeders under normal operating condition transfering loads from one feeder to anoter applying the experiences of the experts. To implement the method effectively, a best-first tree searching strategy based on heuristics is used to evaluate the various load transfer alternatives. The development of a rule-based system aimed at the reduction of the search space is presented as a means of implementing the best-first searching strategy. The results of the computer simulation of the above procedure are as follows; 1) achieving minimum power loss of the distribution feeder adopting the optimum load transfer alternative. 2) Enhencing system reliability and achieving load balance through rational allocation of the feeder loads.

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M&S 기반 반도체소자의 펄스감마선 피해평가 시스템 구축 연구 (A Study on Implementation of a Transient Radiation Effects on Electronics(TREE) Assessment System Based on M&S)

  • 이남호;이승민
    • 전기학회논문지
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    • 제62권7호
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    • pp.969-973
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    • 2013
  • To simulate the effect of high dose-rate radiation on semiconductor devices, device modeling work has been performed especially in the area of photo-current generation by a PIN diode. The resultant analytical values were compared with experimental ones that were specially designed and performed to benchmark the simulation results. Initial results showed 27.85% error between the simulation and the experiment. The error can be further reduced by improvement both in simulation and in related experiments. The developed technique from the study can be applicable to radiation dosimetry and to analysis on the radiation effects in electronics.

직류 전계하 LLDPE/EVA혼합필름의 절연파괴특성 (Breakdown Characteristics of LLDPE/EVA mixture film under DC field)

  • 고시현;김형주;이종필;신현택;이충호;홍진웅
    • 한국항해항만학회:학술대회논문집
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    • 한국항해항만학회 2000년도 추계학술대회논문집
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    • pp.65-68
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    • 2000
  • Polyethylene, has long history and is widely used, was researched due to good electrical properties by many authors. But PE under stress has the critical defects of space charge accumulation and tree growth, so various methods such as catalyst, additives and blend to improve these problems have been execute, of which we selected blending method. As in our previous papers we investigated electrical conduction, dielectric and AC dielectric breakdown characteristics, we did DC dielectric breakdown characteristics in this paper. We selected pure LLDPE, pure EVA and LLDPE films mixed with EVA as specimens, which were mixed with the weight percentages of 50, 60, 70 and 80[wt%] to be thin film. DC applying voltage speed was 500[V/sec]. The relation between dielectric breakdown characteristics and the variations of super structure due to mixing was investigated, and especially trap level at amorphous region, threshold energy increment of conductive electron at free volume were considered.

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