The Transactions of The Korean Institute of Electrical Engineers (전기학회논문지)

The Korean Institute of Electrical Engineers (대한전기학회)
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A Study on Implementation of a Transient Radiation Effects on Electronics(TREE) Assessment System Based on M&S

M&S 기반 반도체소자의 펄스감마선 피해평가 시스템 구축 연구

  • Lee, Nam-Ho (Dept. of Nuclear Convergence Technology Development Korea Atomic Energy Research Institute) ;
  • Lee, Seung-Min (Dept, of Electric, Electronics & Communication Engineering Education, Chungnam National University)
  • 이남호 (한국원자력연구원 융합기술개발부) ;
  • 이승민 (충남대학교 사범대학 전기전자통신공학교육과)
  • Received : 2013.04.19
  • Accepted : 2013.06.25
  • Published : 2013.07.01
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Abstract

To simulate the effect of high dose-rate radiation on semiconductor devices, device modeling work has been performed especially in the area of photo-current generation by a PIN diode. The resultant analytical values were compared with experimental ones that were specially designed and performed to benchmark the simulation results. Initial results showed 27.85% error between the simulation and the experiment. The error can be further reduced by improvement both in simulation and in related experiments. The developed technique from the study can be applicable to radiation dosimetry and to analysis on the radiation effects in electronics.

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References

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