• 대한전자공학회논문지SD
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• 제40권10호
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• pp.32-38
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• 2003

SIMOX 웨이퍼를 사용하여 제작된 GAA 구조 SOI MOSFET의 열전자에 의한 소자열화를 측정·분석하였다. nMOSFET의 열화는 스트레스 게이트 전압이 문턱전압과 같을 때 최대가 되었는데 이는 낮은 게이트 전압에서 PBT 작용의 활성화로 충격이온화가 많이 되었기 때문이다. 소자의 열화는 충격이혼화로 생성된 열전자와 홀에의한 계면상태 생성이 주된 원인임을 degradation rate와 dynamic transconductance 측정으로부터 확인하였다. 그리고 pMOSFET의 열화의 원인은 DAHC 현상에서 생성된 열전자 주입에 의한 전자 트랩핑이 주된 것임을 스트레스 게이트 전압변화에 따른 드레인 전류 변화로부터 확인 할 수 있었다.

• 대한전자공학회논문지
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• 제25권7호
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• pp.780-790
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• 1988

We have studied the hot-carrier-induced degradation caused by the high channel electric field due to the decrease of the gate length of MOSFET used in VLSI. Under DC stress, the condition in which maximum substrate current occures gave the worst degradation. Under AC dynamic stress, other conditions, the pulse shape and the falling rate, gave enormous effects on the degradation phenomena, especially at 77K. Threshold voltage, transconductance, channel conductance and gate current were measured and compared under various stress conditions. The threshold voltage was almost completely recovered by hot-injection stress as a reverse-stress. But, the transconductance was rapidly degraded under hot-hole injection and recovered by sequential hot-electron stress. The Si-SiO2 interface state density was analyzed by a charge pumping technique and the charge pumping current showed the same trend as the threshold voltage shift in degradation process.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2002년도 하계종합학술대회 논문집(2)
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• pp.133-136
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• 2002

This paper discusses the design of a sample-and -hold amplifier(SHA) that has a 12-bit resolution with a 100 MS/s speed. The sample-and-hold amplifier uses the open-loop architecture with hold-mode feedthrough cancellation for high accuracy and high sampling speed. The designed SHA is composed of input buffer, sampling switch, and output buffer with additional amplifier for offset cancellation Hard Ware. The input buffer is implemented with folded-cascode type operational transconductance Amplifier(OTA), and sampling switch is implemented with switched source follower(SSF). A spurious free dynamic range (SFDR) of this circuit is 72.6 dB al 100 MS/s. Input signal dynamic range is 1 Vpp differential. Power consumption is 65 ㎽.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1987년도 전기.전자공학 학술대회 논문집(I)
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• pp.469-472
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• 1987

The hot-carrier induced degradation in very short-channel MOSFET was studied systematically. Under the traditional DC stress conditions, the threshold voltage shift (${\Delta}Vt$) and the transconductance degradation (${\Delta}Gm$/(Gmo-${\Delta}Gm$)) were confirmed to depend exponentially on the stress time and the dependency between the two parameters was proved to be linear. And the degradation due to the DC stress across gate and drain was studied. As the AC dynamic process is more realistic in actual device operation, the effects of dynamic stresses were studied.

• 대한전기학회논문지
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• 제31권9호
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• pp.74-81
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• 1982

One of the stable thin film transistor fabricated by cadmium suifide with the anodized aluminium oxide as gate material. The principle of the operation for the device is based on the control mechanism of injected majority carricrs to the wide band gap semiconductor, that is cadmium sulfide, by means of the function of the gate control. The fabricated device constructed by evaporating CdS layer in the form of microcrystalline on the oxided thin film characterized by ea, 80 as voltage amplification factor, 1/100 mho as transconductance, 8 kohm as dynamic output resistance, furthermore gain band width products is about 15 MHz.

• JSTS:Journal of Semiconductor Technology and Science
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• 제5권3호
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• pp.168-172
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• 2005

In this paper, we present a new adaptive biasing scheme for CMOS op-amps. The designed circuit has been used in an Operational Transconductance Amplifier (OTA) with ${\pm}1$ V power supply, and it has improved the positive and negative slew rates from 2.92 V/msec to 1242 V/msec and from 1.56 V/msec to 133 V/msec respectively, while maintaining all the small-signal performance parameter values the same as that without adaptive biasing (as expected), however, there was a marginal decrease of the dynamic range. The most useful features of the proposed circuit are that it uses a very low number of components (thus not creating severe area penalty) and requires only 25 nW of extra stand-by power.

• 전자공학회논문지
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• 제53권1호
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• pp.59-67
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• 2016

저가, 광대역, 그리고 넓은 이득 제어 범위를 갖는 전자 계측 시스템을 실현하기 위한 완전-차동 선형(fully-differential linear operational transconductance amplifier : FLOTA)를 사용한 새로운 계측 증폭기(instrumentation amplifier : IA)를 설계하였다. 이 IA는 한 개의 FLOTA, 두 개의 저항 그리고 한 개의 연산 증폭기(operational amplifier : op-amp로 구성된다. 동작 원리는 FLOTA에 인가되는 두 입력 전압의 차가 각각 동일한 차동 전류로 변환되고 이 전류는 op-amp의 (+)단자의 저항기와 귀환 저항기를 통과시켜 단일 출력 전압을 구하는 것이다. 제안한 IA의 동작 원리를 확인하기 위해 FLOTA를 설계하였고 상용 op-amp LF356을 사용하여 IA를 구현하였다. 시뮬레이션 결과 FLOTA를 사용한 전압-전류 특성은 ${\pm}3V$의 입력 선형 범위에서 0.1%의 선형오차와 2.1uA의 오프셋 전류를 갖고 있었다. IA는 1개의 저항기의 저항 값 변화로 -20dB~+60dB의 이득을 갖고 있으며, 60dB에 대한 -3dB 주파수는 10MHz이였다. 제안한 IA의 외부의 저항기의 정합이 필요 없고 다른 저항기로 오프셋을 조절할 수 있는 장점을 갖고 있다. 소비전력은 ${\pm}5V$ 공급전압에서 105mW이였다.