Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1987.07a
- /
- Pages.469-472
- /
- 1987
Hot-Carrier Induced Degradation in Submicron MOS Transistor
Submicron MOSTransistor에서 Hot-Carrier에 의한 열화현상의 연구
- Choi, Byung-Jin (KAIST, Optical Electronics Laboratory) ;
- Kang, Kwang-Nham (KAIST, Optical Electronics Laboratory)
- Published : 1987.07.03
Abstract
The hot-carrier induced degradation in very short-channel MOSFET was studied systematically. Under the traditional DC stress conditions, the threshold voltage shift (
Keywords